Inventor · disambiguated record
Atsushi Miyanishi
Also filed as: MIYANISHI ATSUSHI
23 granted patents·7 pending applications·445 citations·filing 1996–2019
95Inventor score
Files withRENESAS ELECTRONICS CORP13MITSUBISHI ELECTRIC CORP8RENESAS TECH CORP6FUJIKAWA SEIJI1ISHII YUICHIRO1
Top patents by PatentIndex Score
30 records- 0197US6347062B2Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Feb 12, 2002·191 cites·27 claims
- 0294US6535453B2Semiconductor memory deviceMITSUBISHI ELECTRIC CORP·Filed 2002·Granted Mar 18, 2003·85 cites·20 claims
- 0391US6310815B1Multi-bank semiconductor memory device suitable for integration with logicMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Oct 30, 2001·98 cites·23 claims
- 0490US9559693B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Jan 31, 2017·5 cites·5 claims
- 0587US8514612B2Semiconductor memory deviceISHII YUICHIRO·Filed 2011·Granted Aug 20, 2013·14 cites·8 claims
- 0683US9798600B2Semiconductor memory deviceRENESAS ELECTRONICS CORP·Filed 2015·Granted Oct 24, 2017·3 cites·6 claims
- 0781US9837140B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2016·Granted Dec 5, 2017·2 cites·5 claims
- 0875US10224096B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2018·Granted Mar 5, 2019·1 cites·20 claims
- 0974US10120741B2Semiconductor memory deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted Nov 6, 2018·1 cites·6 claims
- 1074US9959925B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2017·Granted May 1, 2018·1 cites·6 claims
- 1163US10482949B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2019·Granted Nov 19, 2019·0 cites·8 claims
- 1263US10360091B2Semiconductor memory deviceRENESAS ELECTRONICS CORP·Filed 2018·Granted Jul 23, 2019·0 cites·3 claims
- 1361US7898896B2Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2009·Granted Mar 1, 2011·3 cites·4 claims
- 1455US6269280B1Semiconductor device and method of fabricating the sameMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Jul 31, 2001·15 cites·17 claims
- 1549US2012017184A1System for creating layout pattern for manufacturing mask rom, mask rom manufactured using the system, and method for creating mask patternTSUKAMOTO MICHIKO·Filed 2009·Application pending·0 cites
- 1647US9830980B2Semiconductor device, test program, and test methodRENESAS ELECTRONICS CORP·Filed 2017·Granted Nov 28, 2017·0 cites·9 claims
- 1747US8140220B2In-vehicle apparatusFUJIKAWA SEIJI·Filed 2009·Granted Mar 20, 2012·3 cites·14 claims
- 1847US2006271896A1Semiconductor deviceRENESAS TECH CORP·Filed 2006·Application pending·0 cites
- 1947US2006271897A1Semiconductor deviceRENESAS TECH CORP·Filed 2006·Application pending·0 cites
- 2046US9728272B2Semiconductor device, test program, and test methodRENESAS ELECTRONICS CORP·Filed 2016·Granted Aug 8, 2017·0 cites·14 claims
- 2145US2018053546A1Semiconductor device, test program, and test methodRENESAS ELECTRONICS CORP·Filed 2017·Application pending·0 cites
- 2244US7105901B1Semiconductor deviceRENESAS TECH CORP·Filed 1998·Granted Sep 12, 2006·7 cites·12 claims
- 2342US6515920B2Semiconductor data storing circuit device, method of checking the device and method of relieving the device from defective cellMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Feb 4, 2003·5 cites·20 claims
- 2441US2011110166A1Semiconductor deviceRENESAS ELECTRONICS CORP·Filed 2011·Application pending·0 cites
- 2540US2007047283A1Semiconductor deviceRENESAS TECH CORP·Filed 2006·Application pending·0 cites
- 2639US2007168773A1Semiconductor memory unit with repair circuitRENESAS TECH CORP·Filed 2007·Application pending·0 cites
- 2737US7203870B2Semiconductor memory unit with repair circuitRENESAS TECH CORP·Filed 2002·Granted Apr 10, 2007·1 cites·5 claims
- 2837US6498765B2Semiconductor integrated circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Dec 24, 2002·1 cites·12 claims
- 2932US5699285ANormalization circuit device of floating point computation deviceMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Dec 16, 1997·8 cites·17 claims
- 3030US5948049ANormalization circuitryMITSUBISHI ELECTRIC CORP·Filed 1997·Granted Sep 7, 1999·1 cites·20 claims
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