Inventor · disambiguated record
Francis G. Celii
Also filed as: CELII FRANCIS · CELII FRANCIS G · CELII FRANCIS GABRIEL
37 granted patents·8 pending applications·1,385 citations·filing 1990–2009
98Inventor score
Top patents by PatentIndex Score
45 records- 0198US6211035B1Integrated circuit and methodTEXAS INSTRUMENTS INC·Filed 1999·Granted Apr 3, 2001·370 cites·4 claims
- 0295US7029925B2FeRAM capacitor stack etchTEXAS INSTRUMENTS INC·Filed 2004·Granted Apr 18, 2006·167 cites·5 claims
- 0393US6713342B2FeRAM sidewall diffusion barrier etchTEXAS INSTRUMENTS INC·Filed 2002·Granted Mar 30, 2004·78 cites·25 claims
- 0493US6455411B1Defect and etch rate control in trench etch for dual damascene patterning of low-k dielectricsTEXAS INSTRUMENTS INC·Filed 2001·Granted Sep 24, 2002·86 cites·18 claims
- 0593US6444542B2Integrated circuit and methodTEXAS INSTRUMENTS INC·Filed 2001·Granted Sep 3, 2002·51 cites·2 claims
- 0691US6509574B2Optocouplers having integrated organic light-emitting diodesTEXAS INSTRUMENTS INC·Filed 2000·Granted Jan 21, 2003·59 cites·14 claims
- 0788US5756375ASemiconductor growth method with thickness controlTEXAS INSTRUMENTS INC·Filed 1996·Granted May 26, 1998·94 cites·22 claims
- 0885US5501637ATemperature sensor and methodTEXAS INSTRUMENTS INC·Filed 1994·Granted Mar 26, 1996·72 cites·15 claims
- 0983US7300878B1Gas switching during an etch process to modulate the characteristics of the etchTEXAS INSTRUMENTS INC·Filed 2006·Granted Nov 27, 2007·7 cites·18 claims
- 1083US6506616B1Photolithographic method for fabricating organic light-emitting diodesTEXAS INSTRUMENTS INC·Filed 2000·Granted Jan 14, 2003·37 cites·11 claims
- 1181US6902939B2Integrated circuit and methodTEXAS INSTRUMENTS INC·Filed 2002·Granted Jun 7, 2005·18 cites·3 claims
- 1279US7361599B2Integrated circuit and methodTEXAS INSTRUMENTS INC·Filed 2005·Granted Apr 22, 2008·6 cites·5 claims
- 1377US6841396B2VIA0 etch process for FRAM integrationTEXAS INSTRUMENTS INC·Filed 2003·Granted Jan 11, 2005·18 cites·21 claims
- 1475US8093070B2Method for leakage reduction in fabrication of high-density FRAM arraysCELII FRANCIS GABRIEL·Filed 2007·Granted Jan 10, 2012·8 cites·19 claims
- 1575US5956148ASemiconductor surface measurement system and methodTEXAS INSTRUMENTS INC·Filed 1997·Granted Sep 21, 1999·39 cites·15 claims
- 1673US5082522AMethod for forming patterned diamond thin filmsTEXAS INSTRUMENTS INC·Filed 1990·Granted Jan 21, 1992·52 cites·20 claims
- 1771US7985603B2Ferroelectric capacitor manufacturing processTEXAS INSTRUMENTS INC·Filed 2008·Granted Jul 26, 2011·4 cites·18 claims
- 1865US7799582B2Mitigation of edge degradation in ferroelectric memory devices through plasma etch cleanTEXAS INSTRUMENTS INC·Filed 2009·Granted Sep 21, 2010·1 cites·6 claims
- 1965US6274979B1Organic light emitting diodesTEXAS INSTRUMENTS INC·Filed 1998·Granted Aug 14, 2001·74 cites·7 claims
- 2064US7572733B2Gas switching during an etch process to modulate the characteristics of the etchTEXAS INSTRUMENTS INC·Filed 2007·Granted Aug 11, 2009·1 cites·12 claims
- 2162US7300883B2Method for patterning sub-lithographic features in semiconductor manufacturingTEXAS INSTRUMENTS INC·Filed 2004·Granted Nov 27, 2007·8 cites·19 claims
- 2261US7425512B2Method for etching a substrate and a device formed using the methodTEXAS INSTRUMENTS INC·Filed 2003·Granted Sep 16, 2008·9 cites·20 claims
- 2361US5556462AGrowth method by repeatedly measuring flux in MBE chamberTEXAS INSTRUMENTS INC·Filed 1994·Granted Sep 17, 1996·26 cites·6 claims
- 2459US8053252B2Mitigation of edge degradation in ferroelectric memory devices through plasma etch cleanTEXAS INSTRUMENTS INC·Filed 2009·Granted Nov 8, 2011·0 cites·7 claims
- 2559US6605482B2Process for monitoring the thickness of layers in a microelectronic deviceTEXAS INSTRUMENTS INC·Filed 2001·Granted Aug 12, 2003·3 cites·1 claims
- 2659US5400739AMethod for controlling thin film growth of compound semiconductors using mass spectrometer detectorsTEXAS INSTRUMENTS INC·Filed 1992·Granted Mar 28, 1995·22 cites·12 claims
- 2755US5625204ACompound semiconductors and a method for thin film growthTEXAS INSTRUEMENTS INC·Filed 1995·Granted Apr 29, 1997·16 cites·3 claims
- 2854US7250349B2Method for forming ferroelectric memory capacitorTEXAS INSTRUMENTS INC·Filed 2003·Granted Jul 31, 2007·4 cites·12 claims
- 2953US7572698B2Mitigation of edge degradation in ferroelectric memory devices through plasma etch cleanTEXAS INSTRUMENTS INC·Filed 2006·Granted Aug 11, 2009·0 cites·16 claims
- 3052US5399521AMethod of semiconductor layer growth by MBETEXAS INSTRUMENTS INC·Filed 1993·Granted Mar 21, 1995·18 cites·11 claims
- 3151US5490880ACompound semiconductors and a method for thin film growthTEXAS INSTRUMENTS INC·Filed 1994·Granted Feb 13, 1996·15 cites·7 claims
- 3250US2007221974A1Method for Forming Ferroelectric Memory CapacitorTEXAS INSTRUMENTS INC·Filed 2007·Application pending·0 cites
- 3349US2008303141A1Method for etching a substrate and a device formed using the methodTEXAS INSTRUMENTS INC·Filed 2008·Application pending·0 cites
- 3448US7811882B2Hardmask manufacture in ferroelectric capacitorsTEXAS INSTRUMENTS INC·Filed 2009·Granted Oct 12, 2010·0 cites·19 claims
- 3547US7723199B2Method for cleaning post-etch noble metal residuesTEXAS INSTRUMENTS INC·Filed 2007·Granted May 25, 2010·0 cites·28 claims
- 3647US7560385B2Etching systems and processing gas specie modulationTEXAS INSTRUMENTS INC·Filed 2002·Granted Jul 14, 2009·1 cites·19 claims
- 3745US6872665B1Process flow for dual damescene interconnect structuresTEXAS INSTRUMENTS INC·Filed 2000·Granted Mar 29, 2005·3 cites·8 claims
- 3845US5985025ASemiconductor growth methodTEXAS INSTRUMENTS INC·Filed 1995·Granted Nov 16, 1999·10 cites·6 claims
- 3942US6521042B1Semiconductor growth methodTEXAS INSTRUMENTS INC·Filed 1996·Granted Feb 18, 2003·8 cites·6 claims
- 4042US2006186406A1Method and system for qualifying a semiconductor etch processTEXAS INSTRUMENTS INC·Filed 2006·Application pending·0 cites
- 4141US2007119813A1Gate patterning method for semiconductor processingTEXAS INSTRUMENTS INC·Filed 2005·Application pending·0 cites
- 4238US2003143853A1FeRAM capacitor stack etchFiled 2002·Application pending·0 cites
- 4336US2004217087A1Boron trichloride-based plasma etchFiled 2003·Application pending·0 cites
- 4436US2002139771A1Gas switching during an etch process to modulate the characteristics of the etchFiled 2001·Application pending·0 cites
- 4536US2002066904A1Solid-state relay having integrated organic light-emitting diodesFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →