Inventor · disambiguated record
Adrian E. Ong
Also filed as: ONG ADRIAN · ONG ADRIAN E
126 granted patents·8 pending applications·3,317 citations·filing 1992–2025
99Inventor score
Files withINAPAC TECHNOLOGY INC29RAMBUS INC27MICRON TECHNOLOGY INC26ONG ADRIAN E21LINK TECHNOLOGY G5
Top patents by PatentIndex Score
134 records- 0199US10446256B2Controller to detect malfunctioning address of memory deviceRAMBUS INC·Filed 2018·Granted Oct 15, 2019·34 cites·17 claims
- 0298US8625339B2Multi-cell per memory-bit circuit and methodONG ADRIAN E·Filed 2011·Granted Jan 7, 2014·56 cites·27 claims
- 0398US7768847B2Programmable memory repair schemeRAMBUS INC·Filed 2008·Granted Aug 3, 2010·49 cites·34 claims
- 0497US8670283B2Controller to detect malfunctioning address of memory deviceRAMBUS INC·Filed 2013·Granted Mar 11, 2014·16 cites·13 claims
- 0597US7265570B2Integrated circuit testing moduleINAPAC TECHNOLOGY INC·Filed 2005·Granted Sep 4, 2007·47 cites·27 claims
- 0696US7444575B2Architecture and method for testing of an integrated circuit deviceINAPAC TECHNOLOGY INC·Filed 2005·Granted Oct 28, 2008·38 cites·54 claims
- 0796US7313740B2Internally generating patterns for testing in an integrated circuit deviceINAPAC TECHNOLOGY INC·Filed 2005·Granted Dec 25, 2007·38 cites·32 claims
- 0896US6732304B1Chip testing within a multi-chip semiconductor packageINAPAC TECHNOLOGY INC·Filed 2000·Granted May 4, 2004·98 cites·34 claims
- 0996US6365421B2Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Apr 2, 2002·118 cites·41 claims
- 1096US5901105ADynamic random access memory having decoding circuitry for partial memory blocksFiled 1997·Granted May 4, 1999·169 cites·5 claims
- 1195US9129712B2Programmable memory repair schemeRAMBUS INC·Filed 2014·Granted Sep 8, 2015·11 cites·20 claims
- 1295US7309999B2Electronic device having an interface supported testing modeINAPAC TECHNOLOGY INC·Filed 2005·Granted Dec 18, 2007·31 cites·38 claims
- 1394US9659671B2Controller to detect malfunctioning address of memory deviceRAMBUS INC·Filed 2016·Granted May 23, 2017·8 cites·20 claims
- 1494US7370256B2Integrated circuit testing module including data compressionINAPAC TECHNOLOGY INC·Filed 2006·Granted May 6, 2008·25 cites·24 claims
- 1594US7310000B2Integrated circuit testing module including command driverINAPAC TECHNOLOGY INC·Filed 2006·Granted Dec 18, 2007·27 cites·21 claims
- 1694US7307442B2Integrated circuit test array including test moduleINAPAC TECHNOLOGY INC·Filed 2006·Granted Dec 11, 2007·28 cites·22 claims
- 1794US7259582B2Bonding pads for testing of a semiconductor deviceINAPAC TECHNOLOGY INC·Filed 2005·Granted Aug 21, 2007·27 cites·4 claims
- 1894US7245141B2Shared bond pad for testing a memory within a packaged semiconductor deviceINAPAC TECHNOLOGY INC·Filed 2005·Granted Jul 17, 2007·31 cites·29 claims
- 1994US6194738B1Method and apparatus for storage of test results within an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Feb 27, 2001·102 cites·51 claims
- 2094US5311481AWordline driver circuit having a directly gated pull-down deviceMICRON TECHNOLOGY INC·Filed 1992·Granted May 10, 1994·128 cites·2 claims
- 2193US9653151B1Memory array having segmented row addressed page registersKILOPASS TECH INC·Filed 2016·Granted May 16, 2017·14 cites·19 claims
- 2293US8456926B2Memory write error correction circuitONG ADRIAN E·Filed 2011·Granted Jun 4, 2013·53 cites·12 claims
- 2393US8446788B2Programmable memory repair schemeONG ADRIAN E·Filed 2009·Granted May 21, 2013·14 cites·34 claims
- 2493US7593271B2Memory device including multiplexed inputsRAMBUS INC·Filed 2007·Granted Sep 22, 2009·30 cites·20 claims
- 2593US7365557B1Integrated circuit testing module including data generatorINAPAC TECHNOLOGY INC·Filed 2006·Granted Apr 29, 2008·31 cites·11 claims
- 2693US7269524B1Delay lock loop delay adjusting method and apparatusINAPAC TECHNOLOGY INC·Filed 2006·Granted Sep 11, 2007·25 cites·30 claims
- 2793US7061263B1Layout and use of bond pads and probe pads for testing of integrated circuits devicesINAPAC TECHNOLOGY INC·Filed 2001·Granted Jun 13, 2006·80 cites·16 claims
- 2893US6812726B1Entering test mode and accessing of a packaged semiconductor deviceINAPAC TECHNOLOGY INC·Filed 2002·Granted Nov 2, 2004·62 cites·24 claims
- 2993US5999480ADynamic random-access memory having a hierarchical data pathMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 7, 1999·128 cites·2 claims
- 3093US5675549ABurst EDO memory device address counterMICRON TECHNOLOGY INC·Filed 1995·Granted Oct 7, 1997·120 cites·27 claims
- 3193US5528539AHigh speed global row redundancy systemMICRON SEMICONDUCTOR INC·Filed 1994·Granted Jun 18, 1996·126 cites·12 claims
- 3292US9679664B2Method and system for providing a smart memory architectureONG ADRIAN E·Filed 2013·Granted Jun 13, 2017·16 cites·30 claims
- 3392US7779311B2Testing and recovery in a multilayer deviceRAMBUS INC·Filed 2006·Granted Aug 17, 2010·26 cites·23 claims
- 3492US7673193B1Processor-memory unit for use in system-in-package and system-in-module devicesRAMBUS INC·Filed 2005·Granted Mar 2, 2010·29 cites·31 claims
- 3592US7466603B2Memory accessing circuit systemINAPAC TECHNOLOGY INC·Filed 2007·Granted Dec 16, 2008·27 cites·25 claims
- 3692US5850368ABurst EDO memory address counterMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 15, 1998·99 cites·17 claims
- 3791US8286046B2Integrated circuit testing module including signal shaping interfaceONG ADRIAN E·Filed 2011·Granted Oct 9, 2012·7 cites·23 claims
- 3891US7404117B2Component testing and recoveryINAPAC TECHNOLOGY INC·Filed 2005·Granted Jul 22, 2008·27 cites·12 claims
- 3990US8750018B2Sense amplifier circuitry for resistive type memoryYOUN YONGSIK·Filed 2012·Granted Jun 10, 2014·23 cites·27 claims
- 4090US6882171B2Bonding pads for testing of a semiconductor deviceINAPAC TECHNOLOGY INC·Filed 2003·Granted Apr 19, 2005·47 cites·28 claims
- 4190US5631862ASelf current limiting antifuse circuitMICRON TECHNOLOGY INC·Filed 1996·Granted May 20, 1997·73 cites·18 claims
- 4289US10008291B2Controller to detect malfunctioning address of memory deviceRAMBUS INC·Filed 2017·Granted Jun 26, 2018·4 cites·20 claims
- 4389US8315090B2Pseudo page mode memory architecture and methodONG ADRIAN E·Filed 2010·Granted Nov 20, 2012·12 cites·25 claims
- 4489US7466160B2Shared memory bus architecture for system with processor and memory unitsINAPAC TECHNOLOGY INC·Filed 2006·Granted Dec 16, 2008·38 cites·14 claims
- 4589US7446551B1Integrated circuit testing module including address generatorINAPAC TECHNOLOGY INC·Filed 2006·Granted Nov 4, 2008·20 cites·9 claims
- 4689US5761145AEfficient method for obtaining usable parts from a partially good memory integrated circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Jun 2, 1998·58 cites·17 claims
- 4788US9099181B2Non-volatile static ram cell circuit and timing methodONG ADRIAN E·Filed 2011·Granted Aug 4, 2015·11 cites·6 claims
- 4888US8908428B2Voltage assisted STT-MRAM writing schemeONG ADRIAN E·Filed 2013·Granted Dec 9, 2014·6 cites·36 claims
- 4988US8063650B2Testing fuse configurations in semiconductor devicesONG ADRIAN E·Filed 2008·Granted Nov 22, 2011·13 cites·24 claims
- 5088US7139945B2Chip testing within a multi-chip semiconductor packageINAPAC TECHNOLOGY INC·Filed 2004·Granted Nov 21, 2006·39 cites·25 claims
Showing the top 50 of 134 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →