Assignee
ONG ADRIAN E
US·20 granted patents·1 pending application·254 citations·filing 2006–2013
Top patents by PatentIndex Score
21 records- 0198US8625339B2Multi-cell per memory-bit circuit and methodONG ADRIAN E·Filed 2011·Granted Jan 7, 2014·56 cites·27 claims
- 0293US8456926B2Memory write error correction circuitONG ADRIAN E·Filed 2011·Granted Jun 4, 2013·53 cites·12 claims
- 0393US8446788B2Programmable memory repair schemeONG ADRIAN E·Filed 2009·Granted May 21, 2013·14 cites·34 claims
- 0492US9679664B2Method and system for providing a smart memory architectureONG ADRIAN E·Filed 2013·Granted Jun 13, 2017·16 cites·30 claims
- 0591US8286046B2Integrated circuit testing module including signal shaping interfaceONG ADRIAN E·Filed 2011·Granted Oct 9, 2012·7 cites·23 claims
- 0689US8315090B2Pseudo page mode memory architecture and methodONG ADRIAN E·Filed 2010·Granted Nov 20, 2012·12 cites·25 claims
- 0788US9099181B2Non-volatile static ram cell circuit and timing methodONG ADRIAN E·Filed 2011·Granted Aug 4, 2015·11 cites·6 claims
- 0888US8908428B2Voltage assisted STT-MRAM writing schemeONG ADRIAN E·Filed 2013·Granted Dec 9, 2014·6 cites·36 claims
- 0988US8063650B2Testing fuse configurations in semiconductor devicesONG ADRIAN E·Filed 2008·Granted Nov 22, 2011·13 cites·24 claims
- 1086US8077508B1Dynamic multistate memory write driverONG ADRIAN E·Filed 2009·Granted Dec 13, 2011·16 cites·20 claims
- 1185US8711646B2Architecture, system and method for testing resistive type memoryONG ADRIAN E·Filed 2012·Granted Apr 29, 2014·9 cites·26 claims
- 1284US9001607B2Method and design for high performance non-volatile memoryONG ADRIAN E·Filed 2012·Granted Apr 7, 2015·9 cites·18 claims
- 1384US8077501B2Differential read and write architectureONG ADRIAN E·Filed 2009·Granted Dec 13, 2011·14 cites·20 claims
- 1479US8166361B2Integrated circuit testing module configured for set-up and hold time testingONG ADRIAN E·Filed 2006·Granted Apr 24, 2012·11 cites·28 claims
- 1571US8723557B2Multi-supply symmetric driver circuit and timing methodONG ADRIAN E·Filed 2011·Granted May 13, 2014·4 cites·10 claims
- 1665US8717052B2Testing fuse configurations in semiconductor devicesONG ADRIAN E·Filed 2011·Granted May 6, 2014·1 cites·4 claims
- 1758US8411497B2Method and system for providing a magnetic field aligned spin transfer torque random access memoryONG ADRIAN E·Filed 2010·Granted Apr 2, 2013·2 cites·27 claims
- 1855US9116210B2Integrated circuit testing module including signal shaping interfaceONG ADRIAN E·Filed 2012·Granted Aug 25, 2015·0 cites·19 claims
- 1952US2013212207A1Architecture and method for remote memory system diagnostic and optimizationONG ADRIAN E·Filed 2012·Application pending·0 cites
- 2049US9899312B2Isolating electric paths in semiconductor device packagesONG ADRIAN E·Filed 2006·Granted Feb 20, 2018·0 cites·10 claims
- 2143US8195992B2Processor-memory unit for use in system-in-package and system-in-module devicesONG ADRIAN E·Filed 2011·Granted Jun 5, 2012·0 cites·20 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →