Inventor · disambiguated record
Heong Jin Kim
Also filed as: KIM HEONG · KIM HEONG JIN
9 granted patents·1 pending application·20 citations·filing 2005–2009
80Inventor score
Top patents by PatentIndex Score
10 records- 0183US7536617B2Programmable in-situ delay fault test clock generatorCISCO TECH INC·Filed 2005·Granted May 19, 2009·15 cites·17 claims
- 0264US7750472B2Dual metal interconnectionDONGBU HITEK CO LTD·Filed 2006·Granted Jul 6, 2010·3 cites·7 claims
- 0364US7563676B2NOR-type flash memory cell array and method for manufacturing the sameDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Jul 21, 2009·2 cites·9 claims
- 0450US2009250746A1NOR-Type Flash Memory Cell Array and Method for Manufacturing the SameKIM HEONG JIN·Filed 2009·Application pending·0 cites
- 0549US8021946B2Nonvolatile memory device and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2009·Granted Sep 20, 2011·0 cites·17 claims
- 0647US7566930B2Nonvolatile memory device and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2006·Granted Jul 28, 2009·0 cites·8 claims
- 0740US7262097B2Method for forming floating gate in flash memory deviceDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Aug 28, 2007·0 cites·4 claims
- 0839US7638833B2Nonvolatile memory device and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2008·Granted Dec 29, 2009·0 cites·8 claims
- 0936US7704834B2Method for forming split gate flash nonvolatile memory devicesDONGBU HITEK CO LTD·Filed 2005·Granted Apr 27, 2010·0 cites·7 claims
- 1035US7456060B2Nonvolatile memory device and method for fabricating the sameDONGBU ELECTRONICS CO LTD·Filed 2005·Granted Nov 25, 2008·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →