Inventor · disambiguated record
Carl Hess
Also filed as: HESS CARL · HESS CARL E
22 granted patents·3 pending applications·249 citations·filing 2003–2019
95Inventor score
Files withKLA TENCOR CORP9HESS CARL4KLA TENCOR TECH CORP4KLA TENCOR TECH CORPORATION2FOUQUET CHRISTOPHE1
Top patents by PatentIndex Score
25 records- 0198US7646906B2Computer-implemented methods for detecting defects in reticle design dataKLA TENCOR TECH CORP·Filed 2005·Granted Jan 12, 2010·85 cites·22 claims
- 0293US8204297B1Methods and systems for classifying defects detected on a reticleXIONG YALIN·Filed 2009·Granted Jun 19, 2012·28 cites·19 claims
- 0391US10451563B2Inspection of photomasks by comparing two photomasksKLA TENCOR CORP·Filed 2017·Granted Oct 22, 2019·11 cites·28 claims
- 0491US8102408B2Computer-implemented methods and systems for determining different process windows for a wafer printing process for different reticle designsVERMA GAURAV·Filed 2007·Granted Jan 24, 2012·23 cites·21 claims
- 0591US7493590B1Process window optical proximity correctionKLA TENCOR TECH CORP·Filed 2006·Granted Feb 17, 2009·17 cites·37 claims
- 0689US7932004B1Feature identification for metrological analysisKLA TENCOR CORP·Filed 2009·Granted Apr 26, 2011·20 cites·9 claims
- 0780US9710903B2System and method for detecting design and process defects on a wafer using process monitoring featuresFOUQUET CHRISTOPHE·Filed 2009·Granted Jul 18, 2017·10 cites·50 claims
- 0879US9002497B2Methods and systems for inspection of wafers and reticles using designer intent dataVOLK WILLIAM·Filed 2004·Granted Apr 7, 2015·14 cites·39 claims
- 0977US7995199B2Method for detection of oversized sub-resolution assist featuresKLA TENCOR CORP·Filed 2009·Granted Aug 9, 2011·4 cites·20 claims
- 1076US9390494B2Delta die intensity map measurementKLA TENCOR CORP·Filed 2013·Granted Jul 12, 2016·4 cites·26 claims
- 1175US10713771B2Methods and systems for inspection of wafers and reticles using designer intent dataKLA TENCOR TECH CORPORATION·Filed 2018·Granted Jul 14, 2020·1 cites·29 claims
- 1267US8810646B2Focus offset contamination inspectionHESS CARL·Filed 2011·Granted Aug 19, 2014·1 cites·18 claims
- 1367US8165384B1Defect classificationMA WEIMIN·Filed 2003·Granted Apr 24, 2012·10 cites·23 claims
- 1466US9778205B2Delta die and delta database inspectionKLA TENCOR CORP·Filed 2015·Granted Oct 3, 2017·1 cites·27 claims
- 1566US8151220B2Methods for simulating reticle layout data, inspecting reticle layout data, and generating a process for inspecting reticle layout dataHESS CARL·Filed 2004·Granted Apr 3, 2012·9 cites·23 claims
- 1665US11348222B2Methods and systems for inspection of wafers and reticles using designer intent dataKLA TENCOR TECH CORPORATION·Filed 2019·Granted May 31, 2022·0 cites·30 claims
- 1761US7379847B1High bandwidth image transferKLA TENCOR CORP·Filed 2004·Granted May 27, 2008·10 cites·2 claims
- 1857US7734711B1Blade server interconnectionKLA TENCOR CORP·Filed 2005·Granted Jun 8, 2010·1 cites·20 claims
- 1957US2008081385A1Methods and systems for inspection of wafers and reticles using designer intent dataMARELLA PAUL F·Filed 2007·Application pending·0 cites
- 2056US2015178914A1Methods and Systems for Inspection of Wafers and Reticles Using Designer Intent DataKLA TENCOR TECH CORP·Filed 2015·Application pending·0 cites
- 2150US2006161452A1Computer-implemented methods, processors, and systems for creating a wafer fabrication processKLA TENCOR TECH CORP·Filed 2006·Application pending·0 cites
- 2248US9417191B2Using reflected and transmission maps to detect reticle degradationKLA TENCOR CORP·Filed 2013·Granted Aug 16, 2016·0 cites·22 claims
- 2344US10401305B2Time-varying intensity map generation for reticlesKLA TENCOR CORP·Filed 2013·Granted Sep 3, 2019·0 cites·28 claims
- 2440US9208552B2Method and system for hybrid reticle inspectionHESS CARL·Filed 2012·Granted Dec 8, 2015·0 cites·27 claims
- 2540US8914754B2Database-driven cell-to-cell reticle inspectionHESS CARL·Filed 2012·Granted Dec 16, 2014·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →