Assignee
KLA TENCOR TECH CORPORATION
US·3 granted patents·2 citations·filing 2015–2019
Top patents by PatentIndex Score
3 records- 0175US10713771B2Methods and systems for inspection of wafers and reticles using designer intent dataKLA TENCOR TECH CORPORATION·Filed 2018·Granted Jul 14, 2020·1 cites·29 claims
- 0273US11204330B1Systems and methods for inspection of a specimenKLA TENCOR TECH CORPORATION·Filed 2015·Granted Dec 21, 2021·1 cites·86 claims
- 0365US11348222B2Methods and systems for inspection of wafers and reticles using designer intent dataKLA TENCOR TECH CORPORATION·Filed 2019·Granted May 31, 2022·0 cites·30 claims
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Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →