Inventor · disambiguated record
Boaz Brill
Also filed as: BRILL BOAZ
40 granted patents·20 pending applications·721 citations·filing 1992–2024
98Inventor score
Top patents by PatentIndex Score
60 records- 0199US6657736B1Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2000·Granted Dec 2, 2003·178 cites·54 claims
- 0298US6974962B2Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2001·Granted Dec 13, 2005·120 cites·17 claims
- 0395US6704920B2Process control for micro-lithographyNOVA MEASURING INSTR LTD·Filed 2001·Granted Mar 9, 2004·101 cites·17 claims
- 0494US7495782B2Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2007·Granted Feb 24, 2009·12 cites·21 claims
- 0593US10575765B2Analyte-sensing deviceGLUSENSE LTD·Filed 2015·Granted Mar 3, 2020·8 cites·18 claims
- 0693US8488128B2Line edge roughness measuring technique and test structureBRILL BOAZ·Filed 2009·Granted Jul 16, 2013·19 cites·14 claims
- 0792US8023122B2Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2010·Granted Sep 20, 2011·6 cites·19 claims
- 0892US7760368B2Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2007·Granted Jul 20, 2010·10 cites·26 claims
- 0992US7477405B2Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2003·Granted Jan 13, 2009·25 cites·96 claims
- 1091US8531678B2Method and system for measuring patterned structuresFINAROV MOSHE·Filed 2011·Granted Sep 10, 2013·9 cites·21 claims
- 1191US7715007B2Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2007·Granted May 11, 2010·11 cites·16 claims
- 1291US6650424B2Method and system for measuring in patterned structuresNOVA MEASURING INSTR LTD·Filed 2001·Granted Nov 18, 2003·43 cites·24 claims
- 1389US8289515B2Method and system for use in monitoring properties of patterned structuresCOHEN YOEL·Filed 2008·Granted Oct 16, 2012·13 cites·31 claims
- 1489US7791740B2Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2009·Granted Sep 7, 2010·5 cites·10 claims
- 1589US7301163B2Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2006·Granted Nov 27, 2007·9 cites·48 claims
- 1688US7292341B2Optical system operating with variable angle of incidenceNOVA MEASURING INSTR LTD·Filed 2003·Granted Nov 6, 2007·33 cites·3 claims
- 1788US2025054128A1Method and system for optimizing optical inspection of patterned structuresNOVA LTD·Filed 2024·Application pending·0 cites
- 1887US8848185B2Optical system and method for measuring in three-dimensional structuresBARAK GILAD·Filed 2012·Granted Sep 30, 2014·9 cites·15 claims
- 1987US7864344B1Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2010·Granted Jan 4, 2011·3 cites·10 claims
- 2086US7626710B2Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2007·Granted Dec 1, 2009·8 cites·24 claims
- 2184US8941832B2Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2013·Granted Jan 27, 2015·3 cites·10 claims
- 2283US7864343B2Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2009·Granted Jan 4, 2011·3 cites·19 claims
- 2383US7626711B2Method and system for measuring patterned structuresNOVA MEASURING INSTR·Filed 2007·Granted Dec 1, 2009·4 cites·24 claims
- 2482US8363219B2Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2010·Granted Jan 29, 2013·3 cites·12 claims
- 2582US2023401690A1Method and system for optimizing optical inspection of patterned structuresNOVA LTD·Filed 2023·Application pending·0 cites
- 2681US7122817B2Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2005·Granted Oct 17, 2006·4 cites·21 claims
- 2779US9904993B2Method and system for optimizing optical inspection of patterned structuresNOVA MEASURING INSTR LTD·Filed 2016·Granted Feb 27, 2018·1 cites·17 claims
- 2878US7184152B2Optical measurements of line edge roughnessNOVA MEASURING INSTR·Filed 2003·Granted Feb 27, 2007·16 cites·13 claims
- 2977US9785059B2Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2016·Granted Oct 10, 2017·1 cites·15 claims
- 3077US9184102B2Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2014·Granted Nov 10, 2015·2 cites·21 claims
- 3175US10295329B2Monitoring system and method for verifying measurements in patterned structuresBRILL BOAZ·Filed 2012·Granted May 21, 2019·3 cites·21 claims
- 3274US5233903AGun with combined operation by chemical propellant and plasmaISRAEL ATOMIC ENERGY COMM·Filed 1992·Granted Aug 10, 1993·45 cites·9 claims
- 3373US9140544B2Optical system and method for measuring in patterned structuresBARAK GILAD·Filed 2012·Granted Sep 22, 2015·3 cites·27 claims
- 3473US7663768B2Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2007·Granted Feb 16, 2010·1 cites·17 claims
- 3572US2021090244A1Method and system for optimizing optical inspection of patterned structuresNOVA MEASURING INSTR LTD·Filed 2020·Application pending·0 cites
- 3670US12152869B2Monitoring system and method for verifying measurements in patterned structuresNOVA LTD·Filed 2021·Granted Nov 26, 2024·0 cites·22 claims
- 3766US2018182089A1Method and system for optimizing optical inspection of patterned structuresNOVA MEASURING INSTR LTD·Filed 2018·Application pending·0 cites
- 3865US2020058118A1Method and system for optimizing optical inspection of patterned structuresNOVA MEASURING INSTR LTD·Filed 2019·Application pending·0 cites
- 3964US8964178B2Method and system for use in monitoring properties of patterned structuresNOVA MEASURING INSTR LTD·Filed 2013·Granted Feb 24, 2015·1 cites·15 claims
- 4063US2018031983A1Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2017·Application pending·0 cites
- 4160US8658982B2Optical method and system utilizing operating with deep or vacuum UV spectraBRILL BOAZ·Filed 2008·Granted Feb 25, 2014·2 cites·15 claims
- 4259US9310192B2Lateral shift measurement using an optical techniqueNOVA MEASURING INSTR LTD·Filed 2015·Granted Apr 12, 2016·0 cites·14 claims
- 4357US2014009760A1Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2013·Application pending·0 cites
- 4456US2019339056A1Monitoring system and method for verifying measurements in pattened structuresNOVA MEASURING INSTR LTD·Filed 2019·Application pending·0 cites
- 4555US10048595B2Process control using non-zero order diffractionNOVA MEASURING INSTR LTD·Filed 2017·Granted Aug 14, 2018·0 cites·13 claims
- 4655US2016109225A1Method and system for measuring patterned structuresNOVA MEASURING INSTR LTD·Filed 2015·Application pending·0 cites
- 4754US2024369484A1Method and system for spectral imagingPENTAOMIX LTD·Filed 2022·Application pending·0 cites
- 4853US8643842B2Method and system for use in monitoring properties of patterned structuresNOVA MEASURING INSTR LTD·Filed 2012·Granted Feb 4, 2014·0 cites·20 claims
- 4951US9568872B2Process control using non-zero order diffractionBRILL BOAZ·Filed 2012·Granted Feb 14, 2017·0 cites·10 claims
- 5051US2014079312A9Method and system for optimizing optical inspection of patterned structuresBRILL BOAZ·Filed 2011·Application pending·0 cites
Showing the top 50 of 60 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Boaz Brill files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →