Inventor · disambiguated record
Anita Madan
Also filed as: MADAN ANITA
21 granted patents·7 pending applications·105 citations·filing 2003–2017
93Inventor score
Top patents by PatentIndex Score
28 records- 0194US7279758B1N-channel MOSFETs comprising dual stressors, and methods for forming the sameIBM·Filed 2006·Granted Oct 9, 2007·24 cites·7 claims
- 0289US7838428B2Method of repairing process induced dielectric damage by the use of GCIB surface treatment using gas clusters of organic molecular speciesIBM·Filed 2006·Granted Nov 23, 2010·16 cites·10 claims
- 0388US7462527B2Method of forming nitride films with high compressive stress for improved PFET device performanceIBM·Filed 2005·Granted Dec 9, 2008·14 cites·16 claims
- 0487US7407875B2Low resistance contact structure and fabrication thereofIBM·Filed 2006·Granted Aug 5, 2008·16 cites·3 claims
- 0580US7769134B1Measuring strain of epitaxial films using micro x-ray diffraction for in-line metrologyIBM·Filed 2009·Granted Aug 3, 2010·7 cites·25 claims
- 0675US7473608B2N-channel MOSFETs comprising dual stressors, and methods for forming the sameIBM·Filed 2007·Granted Jan 6, 2009·4 cites·18 claims
- 0773US9870960B2Capacitance monitoring using X-ray diffractionIBM·Filed 2014·Granted Jan 16, 2018·2 cites·20 claims
- 0869US8138066B2Dislocation engineering using a scanned laserLAI CHUNG WOH·Filed 2008·Granted Mar 20, 2012·3 cites·10 claims
- 0966US7485572B2Method for improved formation of cobalt silicide contacts in semiconductor devicesIBM·Filed 2006·Granted Feb 3, 2009·3 cites·3 claims
- 1064US7119016B2Deposition of carbon and nitrogen doped poly silicon films, and retarded boron diffusion and improved poly depletionAPPLIED MATERIALS INC·Filed 2003·Granted Oct 10, 2006·10 cites·5 claims
- 1162US7193500B2Thin film resistors of different materialsIBM·Filed 2004·Granted Mar 20, 2007·4 cites·20 claims
- 1260US9201027B2Evaluating semiconductor wafers for pitch walking and/or epitaxial mergeIBM·Filed 2014·Granted Dec 1, 2015·1 cites·20 claims
- 1357US8865571B2Dislocation engineering using a scanned laserIBM·Filed 2014·Granted Oct 21, 2014·0 cites·2 claims
- 1457US8865572B2Dislocation engineering using a scanned laserIBM·Filed 2014·Granted Oct 21, 2014·0 cites·1 claims
- 1555US10008421B2Capacitance monitoring using x-ray diffractionIBM·Filed 2017·Granted Jun 26, 2018·0 cites·3 claims
- 1655US7622386B2Method for improved formation of nickel silicide contacts in semiconductor devicesIBM·Filed 2006·Granted Nov 24, 2009·1 cites·10 claims
- 1753US7804136B2Method of forming nitride films with high compressive stress for improved PFET device performanceIBM·Filed 2007·Granted Sep 28, 2010·0 cites·5 claims
- 1853US7491660B2Method of forming nitride films with high compressive stress for improved PFET device performanceIBM·Filed 2007·Granted Feb 17, 2009·0 cites·12 claims
- 1952US2006237846A1Doped nitride film, doped oxide film and other doped films and deposition rate improvement for rtcvd processesIBM·Filed 2006·Application pending·0 cites
- 2052US2014159161A1Measurement of cmos device channel strain by x-ray diffractionIBM·Filed 2014·Application pending·0 cites
- 2148US2012294322A1Dislocation Engineering Using a Scanned LaserLAI CHUNG WOH·Filed 2012·Application pending·0 cites
- 2247US8716037B2Measurement of CMOS device channel strain by X-ray diffractionADAM THOMAS N·Filed 2010·Granted May 6, 2014·0 cites·15 claims
- 2344US8105955B2Integrated circuit system with carbon and non-carbon siliconLIU JIN PING·Filed 2006·Granted Jan 31, 2012·0 cites·20 claims
- 2443US2012138823A1Dislocation Engineering Using a Scanned LaserLAI CHUNG WOH·Filed 2012·Application pending·0 cites
- 2543US2007238267A1Epitaxy of Silicon-Carbon Substitutional Solid Solutions by Ultra-Fast Annealing of Amorphous MaterialIBM·Filed 2006·Application pending·0 cites
- 2640US2009146181A1Integrated circuit system employing diffused source/drain extensionsCHARTERED SEMICONDUCTOR MFG·Filed 2007·Application pending·0 cites
- 2738US7232774B2Polycrystalline silicon layer with nano-grain structure and method of manufactureIBM·Filed 2004·Granted Jun 19, 2007·0 cites·9 claims
- 2837US2007134861A1Semiconductor devices and methods of manufacture thereofHAN JIN-PING·Filed 2005·Application pending·0 cites
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