Inventor · disambiguated record
Stephen K. Sunter
Also filed as: SUNTER STEPHEN K · SUNTER STEPHEN KENNETH
30 granted patents·4 pending applications·1,391 citations·filing 1983–2022
98Inventor score
Files withLOGICVISION INC18NORTHERN TELECOM LTD5MENTOR GRAPHICS CORP4SIEMENS IND SOFTWARE INC2LOGIC VISION INC1
Top patents by PatentIndex Score
34 records- 0196US5923676ABist architecture for measurement of integrated circuit delaysLOGIC VISION INC·Filed 1996·Granted Jul 13, 1999·146 cites·31 claims
- 0296US5349587AMultiple clock rate test apparatus for testing digital systemsNORTHERN TELECOM LTD·Filed 1992·Granted Sep 20, 1994·201 cites·19 claims
- 0395US6586921B1Method and circuit for testing DC parameters of circuit input and output nodesLOGICVISION INC·Filed 2000·Granted Jul 1, 2003·93 cites·47 claims
- 0494US6492798B2Method and circuit for testing high frequency mixed signal circuits with low frequency signalsLOGICVISION INC·Filed 2001·Granted Dec 10, 2002·58 cites·33 claims
- 0594US4797580ACurrent-mirror-biased pre-charged logic circuitNORTHERN TELECOM LTD·Filed 1987·Granted Jan 10, 1989·67 cites·8 claims
- 0693US10353789B1Analog fault simulation control with multiple circuit representationsMENTOR GRAPHICS CORP·Filed 2018·Granted Jul 16, 2019·7 cites·20 claims
- 0791US4646289ASignal multiplexing circuitNORTHERN TELECOM LTD·Filed 1984·Granted Feb 24, 1987·132 cites·16 claims
- 0889US9134374B2Circuit and method for measuring delays between edges of signals of a circuitMENTOR GRAPHICS CORP·Filed 2014·Granted Sep 15, 2015·7 cites·7 claims
- 0989US8489947B2Circuit and method for simultaneously measuring multiple changes in delaySUNTER STEPHEN KENNETH·Filed 2011·Granted Jul 16, 2013·10 cites·23 claims
- 1088US6691269B2Method for scan controlled sequential sampling of analog signals and circuit for use therewithLOGICVISION INC·Filed 2001·Granted Feb 10, 2004·40 cites·21 claims
- 1188US5659312AMethod and apparatus for testing digital to analog and analog to digital convertersLOGICVISION INC·Filed 1996·Granted Aug 19, 1997·106 cites·23 claims
- 1287US6885213B2Circuit and method for accurately applying a voltage to a node of an integrated circuitLOGICVISION INC·Filed 2003·Granted Apr 26, 2005·33 cites·10 claims
- 1387US6396889B1Method and circuit for built in self test of phase locked loopsLOGICVISION INC·Filed 1998·Granted May 28, 2002·70 cites·41 claims
- 1484US6211803B1Test circuit and method for measuring switching point voltages and integral non-linearity (INL) of analog to digital convertersLOGICVISION INC·Filed 1998·Granted Apr 3, 2001·55 cites·30 claims
- 1583US7159159B2Circuit and method for adding parametric test capability to digital boundary scanLOGICVISION INC·Filed 2003·Granted Jan 2, 2007·27 cites·19 claims
- 1683US6961871B2Method, system and program product for testing and/or diagnosing circuits using embedded test controller access dataLOGICVISION INC·Filed 2001·Granted Nov 1, 2005·45 cites·90 claims
- 1782US9372946B2Defect injection for transistor-level fault simulationMENTOR GRAPHICS CORP·Filed 2013·Granted Jun 21, 2016·6 cites·33 claims
- 1881US7158899B2Circuit and method for measuring jitter of high speed signalsLOGICVISION INC·Filed 2004·Granted Jan 2, 2007·34 cites·47 claims
- 1980US6204694B1Programmable clock signal generation circuits and methods for generating accurate, high frequency, clock signalsLOGICVISION INC·Filed 1999·Granted Mar 20, 2001·96 cites·28 claims
- 2079US6717415B2Circuit and method for determining the location of defect in a circuitLOGICVISION INC·Filed 2002·Granted Apr 6, 2004·23 cites·5 claims
- 2176US6895535B2Circuit and method for testing high speed data circuitsLOGICVISION INC·Filed 2003·Granted May 17, 2005·19 cites·15 claims
- 2275US6567971B1Circuit synthesis method using technology parameters extracting circuitLOGICVISION INC·Filed 2001·Granted May 20, 2003·26 cites·28 claims
- 2374US6590412B2Circuit and method for detecting transient voltages on a dc power supply railLOGICVISION INC·Filed 2001·Granted Jul 8, 2003·17 cites·37 claims
- 2473US7453255B2Circuit and method for measuring delay of high speed signalsLOGICVISION INC·Filed 2004·Granted Nov 18, 2008·17 cites·33 claims
- 2570US7219282B2Boundary scan with strobed pad driver enableLOGICVISION INC·Filed 2003·Granted May 15, 2007·14 cites·7 claims
- 2670US6703820B2Method and circuit for testing high frequency mixed signal circuits with low frequency signalsLOGICVISION INC·Filed 2002·Granted Mar 9, 2004·12 cites·6 claims
- 2763US4659948AProgrammable logic arrayNORTHERN TELECOM LTD·Filed 1983·Granted Apr 21, 1987·12 cites·3 claims
- 2858US4912340ACircuit for generating non-overlapping two-phase clocksNORTHERN TELECOM·Filed 1988·Granted Mar 27, 1990·14 cites·22 claims
- 2954US2013305111A1Circuit And Method For Simultaneously Measuring Multiple Changes In DelayMENTOR GRAPHICS CORP·Filed 2013·Application pending·0 cites
- 3053US2025363276A1Automatic test pattern generation for analog and mixed-signal circuitsSIEMENS IND SOFTWARE INC·Filed 2022·Application pending·0 cites
- 3148US11455447B2Activity coverage assessment of circuit designs under test stimuliSIEMENS IND SOFTWARE INC·Filed 2017·Granted Sep 27, 2022·0 cites·30 claims
- 3237US2004119455A1Method for testing parameters of high speed data signalsFiled 2003·Application pending·0 cites
- 3337US2005229053A1Circuit and method for low frequency testing of high frequency signal waveformsLOGICVISION INC 101 METRO DRIV·Filed 2004·Application pending·0 cites
- 3432US4885625AIntegrated circuit chip manufactureNORTHERN TELECOM LTD·Filed 1989·Granted Dec 5, 1989·4 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →