Inventor · disambiguated record
Hiroshi Wakaba
Also filed as: WAKABA HIROSHI
4 granted patents·2 pending applications·8 citations·filing 2008–2012
62Inventor score
Top patents by PatentIndex Score
6 records- 0178US8497985B2Inspection method based on captured image and inspection deviceHAYASHI YOSHINORI·Filed 2008·Granted Jul 30, 2013·7 cites·6 claims
- 0248US8700498B2Feature analyzing apparatus for a surface of an objectHAYASHI YOSHINORI·Filed 2008·Granted Apr 15, 2014·1 cites·12 claims
- 0344US8488867B2Inspection device for disk-shaped substrateHAYASHI YOSHINORI·Filed 2008·Granted Jul 16, 2013·0 cites·15 claims
- 0442US2013169795A1Illumination system, illumination method, and inspection systemSHIBAURA MECHATRONICS CORP·Filed 2012·Application pending·0 cites
- 0541US2013169793A1Inspection system and inspection methodCORP SHIBAURA MECHATRONICS·Filed 2012·Application pending·0 cites
- 0637US8508246B2Substrate surface inspecting apparatus and substrate surface inspecting methodWAKABA HIROSHI·Filed 2008·Granted Aug 13, 2013·0 cites·7 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →