Assignee
HAYASHI YOSHINORI
JP·9 granted patents·4 pending applications·20 citations·filing 2006–2012
Top patents by PatentIndex Score
13 records- 0185US8773114B2Apparatus for detecting displacement of electromagnetic actuatorHAYASHI YOSHINORI·Filed 2011·Granted Jul 8, 2014·6 cites·14 claims
- 0278US8497985B2Inspection method based on captured image and inspection deviceHAYASHI YOSHINORI·Filed 2008·Granted Jul 30, 2013·7 cites·6 claims
- 0370US8194241B2Apparatus and method for inspecting edge of semiconductor waferHAYASHI YOSHINORI·Filed 2008·Granted Jun 5, 2012·3 cites·10 claims
- 0465US8433102B2Surface roughness inspection systemHAYASHI YOSHINORI·Filed 2006·Granted Apr 30, 2013·2 cites·6 claims
- 0565US8199179B2Image forming apparatus and scanning unit to scan a target surface using light fluxesHAYASHI YOSHINORI·Filed 2007·Granted Jun 12, 2012·1 cites·9 claims
- 0648US8700498B2Feature analyzing apparatus for a surface of an objectHAYASHI YOSHINORI·Filed 2008·Granted Apr 15, 2014·1 cites·12 claims
- 0748US2007206261A1Optical scanner and image forming apparatusHAYASHI YOSHINORI·Filed 2007·Application pending·0 cites
- 0847US2009304258A1Visual Inspection SystemHAYASHI YOSHINORI·Filed 2006·Application pending·0 cites
- 0947US2010075442A1Semiconductor wafer processing apparatus, reference angular position detection method, and semiconductor waferHAYASHI YOSHINORI·Filed 2008·Application pending·0 cites
- 1044US8488867B2Inspection device for disk-shaped substrateHAYASHI YOSHINORI·Filed 2008·Granted Jul 16, 2013·0 cites·15 claims
- 1140US8094923B2Wafer containing cassette inspection device and methodHAYASHI YOSHINORI·Filed 2007·Granted Jan 10, 2012·0 cites·13 claims
- 1239US2012182373A1Optical scanning device and image forming apparatusHAYASHI YOSHINORI·Filed 2012·Application pending·0 cites
- 1337US8107064B2Disc wafer inspecting device and inspecting methodHAYASHI YOSHINORI·Filed 2007·Granted Jan 31, 2012·0 cites·18 claims
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