Inventor · disambiguated record
Robert L. Franch
Also filed as: FRANCH ROBERT L · FRANCH ROBERT LOUIS
22 granted patents·4 pending applications·276 citations·filing 1990–2021
95Inventor score
Files withIBM26
Top patents by PatentIndex Score
26 records- 0194US7944229B2Method and apparatus for calibrating internal pulses in an integrated circuitIBM·Filed 2009·Granted May 17, 2011·22 cites·20 claims
- 0292US7961559B2Duty cycle measurement circuit for measuring and maintaining balanced clock duty cycleIBM·Filed 2009·Granted Jun 14, 2011·21 cites·15 claims
- 0390US9568548B1Measurement of signal delays in microprocessor integrated circuits with sub-picosecond accuracy using frequency steppingIBM·Filed 2015·Granted Feb 14, 2017·4 cites·13 claims
- 0489US7973549B2Method and apparatus for calibrating internal pulses in an integrated circuitIBM·Filed 2007·Granted Jul 5, 2011·15 cites·9 claims
- 0589US7452128B2On chip temperature measuring and monitoring circuit and methodIBM·Filed 2007·Granted Nov 18, 2008·10 cites·6 claims
- 0689US5212616AVoltage regulation and latch-up protection circuitsIBM·Filed 1991·Granted May 18, 1993·81 cites·20 claims
- 0785US7459940B2Local clock buffer (LCB) with asymmetric inductive peakingIBM·Filed 2007·Granted Dec 2, 2008·12 cites·12 claims
- 0885US7400555B2Built in self test circuit for measuring total timing uncertainty in a digital data pathIBM·Filed 2003·Granted Jul 15, 2008·24 cites·29 claims
- 0983US7255476B2On chip temperature measuring and monitoring circuit and methodIBM·Filed 2004·Granted Aug 14, 2007·20 cites·22 claims
- 1082US9575119B1Measurement of signal delays in microprocessor integrated circuits with sub-picosecond accuracy using frequency steppingIBM·Filed 2016·Granted Feb 21, 2017·2 cites·7 claims
- 1181US9618966B2Pulse-drive resonant clock with on-the-fly mode changeIBM·Filed 2015·Granted Apr 11, 2017·3 cites·7 claims
- 1281US9612614B2Pulse-drive resonant clock with on-the-fly mode changeIBM·Filed 2015·Granted Apr 4, 2017·3 cites·13 claims
- 1381US5157634ADram having extended refresh timeIBM·Filed 1990·Granted Oct 20, 1992·48 cites·7 claims
- 1474US10296691B2Optimizing the layout of circuits based on multiple design constraintsIBM·Filed 2016·Granted May 21, 2019·2 cites·18 claims
- 1569US7780347B2On chip temperature measuring and monitoring circuit and methodIBM·Filed 2008·Granted Aug 24, 2010·2 cites·2 claims
- 1669US7645071B2On chip temperature measuring and monitoring methodIBM·Filed 2008·Granted Jan 12, 2010·2 cites·16 claims
- 1768US10145892B2Increasing the resolution of on-chip measurement circuitsIBM·Filed 2016·Granted Dec 4, 2018·1 cites·16 claims
- 1863US7762721B2On chip temperature measuring and monitoring methodIBM·Filed 2008·Granted Jul 27, 2010·1 cites·8 claims
- 1961US7839175B2Local clock buffer (LCB) with asymmetric inductive peakingIBM·Filed 2008·Granted Nov 23, 2010·3 cites·4 claims
- 2058US11636245B2Methods and systems for leveraging computer-aided design variability in synthesis tuningIBM·Filed 2021·Granted Apr 25, 2023·0 cites·21 claims
- 2157US9348357B2Stitchable global clock for 3D chipsIBM·Filed 2014·Granted May 24, 2016·0 cites·20 claims
- 2256US2007103141A1Duty cycle measurment circuit for measuring and maintaining balanced clock duty cycleIBM·Filed 2007·Application pending·0 cites
- 2355US9800232B2Stitchable global clock for 3D chipsIBM·Filed 2016·Granted Oct 24, 2017·0 cites·20 claims
- 2453US2008025371A1On chip temperature measuring and monitoring circuit and methodIBM·Filed 2007·Application pending·0 cites
- 2546US2008198699A1Method for built in self test for measuring total timing uncertainty in a digital data pathIBM·Filed 2008·Application pending·0 cites
- 2646US2008198700A1Duty cycle measurment circuit for measuring and maintaining balanced clock duty cycleIBM·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →