Inventor · disambiguated record
Yuuki Ojima
Also filed as: OJIMA YUUKI
1 granted patent·2 pending applications·13 citations·filing 2004–2007
39Inventor score
Technology areasH01J
Top patents by PatentIndex Score
3 records- 0179US7053371B2Scanning electron microscope with measurement functionHITACHI SCIENCE SYSTEMS LTD·Filed 2004·Granted May 30, 2006·13 cites·5 claims
- 0255US2008109755A1Scanning electron microscope with measurement functionOJIMA YUUKI·Filed 2007·Application pending·0 cites
- 0351US2006219917A1Scanning electron microscope with measurement functionOJIMA YUUKI·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →