Inventor · disambiguated record
Kais Maayah
Also filed as: MAAYAH KAIS · MAAYAH KAIS JAMEEL
6 granted patents·1 pending application·526 citations·filing 2001–2011
88Inventor score
Top patents by PatentIndex Score
7 records- 0197US7676077B2Methods and systems for utilizing design data in combination with inspection dataKLA TENCOR TECH CORP·Filed 2006·Granted Mar 9, 2010·277 cites·58 claims
- 0296US8041103B2Methods and systems for determining a position of inspection data in design data spaceKLA TENCOR TECH CORP·Filed 2007·Granted Oct 18, 2011·85 cites·18 claims
- 0395US8139843B2Methods and systems for utilizing design data in combination with inspection dataKULKARNI ASHOK·Filed 2011·Granted Mar 20, 2012·55 cites·31 claims
- 0494US8204296B2Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a waferBHASKAR KRIS·Filed 2010·Granted Jun 19, 2012·15 cites·16 claims
- 0593US7796804B2Methods for generating a standard reference die for use in a die to standard reference die inspection and methods for inspecting a waferKLA TENCOR CORP·Filed 2008·Granted Sep 14, 2010·25 cites·28 claims
- 0689US7065239B2Automated repetitive array microstructure defect inspectionAPPLIED MATERIALS INC·Filed 2001·Granted Jun 20, 2006·69 cites·26 claims
- 0746US2010119144A1Methods and systems for utilizing design data in combination with inspection dataKLA TENCOR TECH CORP·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →