Inventor · disambiguated record
Dan Gealy
Also filed as: GEALY DAN
45 granted patents·10 pending applications·695 citations·filing 1998–2020
98Inventor score
Top patents by PatentIndex Score
55 records- 0196US6566147B2Method for controlling deposition of dielectric filmsMICRON TECHNOLOGY INC·Filed 2001·Granted May 20, 2003·98 cites·50 claims
- 0296US6518610B2Rhodium-rich oxygen barriersMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 11, 2003·104 cites·23 claims
- 0395US6797337B2Method for delivering precursorsMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 28, 2004·60 cites·29 claims
- 0493US6492241B1Integrated capacitors fabricated with conductive metal oxidesMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 10, 2002·64 cites·32 claims
- 0591US9484196B2Semiconductor structures including liners comprising alucone and related methodsMICRON TECHNOLOGY INC·Filed 2014·Granted Nov 1, 2016·10 cites·24 claims
- 0686US8110469B2Graded dielectric layersGEALY DAN·Filed 2005·Granted Feb 7, 2012·12 cites·31 claims
- 0785US6677640B1Memory cell with tight couplingMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 13, 2004·28 cites·39 claims
- 0883US6962824B2Method for controlling deposition of dielectric filmsMICRON TECHNOLOGY INC·Filed 2004·Granted Nov 8, 2005·21 cites·36 claims
- 0983US6864527B2Capacitor having tantalum oxynitride film and method for making sameMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 8, 2005·18 cites·63 claims
- 1083US6838293B2Method for controlling deposition of dielectric filmsMICRON TECHNOLOGY INC·Filed 2003·Granted Jan 4, 2005·22 cites·60 claims
- 1183US6525365B1Dielectric films and capacitor structures including sameMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 25, 2003·24 cites·25 claims
- 1282US6458645B2Capacitor having tantalum oxynitride film and method for making sameMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 1, 2002·41 cites·23 claims
- 1381US7311947B2Laser assisted material depositionMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 25, 2007·19 cites·13 claims
- 1480US7560392B2Electrical components for microelectronic devices and methods of forming the sameMICRON TECHNOLOGY INC·Filed 2006·Granted Jul 14, 2009·6 cites·36 claims
- 1580US7390712B2Methods of enhancing capacitors in integrated circuitsMICRON TECHNOLOGY INC·Filed 2007·Granted Jun 24, 2008·4 cites·26 claims
- 1680US7038265B2Capacitor having tantalum oxynitride film and method for making sameMICRON TECHNOLOGY INC·Filed 2005·Granted May 2, 2006·4 cites·55 claims
- 1779US6316800B1Boride electrodes and barriers for cell dielectricsMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 13, 2001·17 cites·15 claims
- 1877US6869877B2Integrated capacitors fabricated with conductive metal oxidesMICRON TECHNOLOGY INC·Filed 2002·Granted Mar 22, 2005·17 cites·21 claims
- 1974US7009240B1Structures and methods for enhancing capacitors in integrated circuitsMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 7, 2006·12 cites·37 claims
- 2073US11223014B2Semiconductor structures including liners comprising alucone and related methodsMICRON TECHNOLOGY INC·Filed 2019·Granted Jan 11, 2022·1 cites·18 claims
- 2173US7118783B2Methods and apparatus for vapor processing of micro-device workpiecesMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 10, 2006·10 cites·21 claims
- 2272US7206215B2Antifuse having tantalum oxynitride film and method for making sameMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 17, 2007·9 cites·29 claims
- 2369US6518121B2Boride electrodes and barriers for cell dielectricsMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 11, 2003·9 cites·8 claims
- 2468US6444478B1Dielectric films and methods of forming sameMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 3, 2002·27 cites·35 claims
- 2566US9023436B2Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpiecesDANDO ROSS S·Filed 2012·Granted May 5, 2015·0 cites·9 claims
- 2666US8124528B2Method for forming a ruthenium filmBHAT VISHWANATH·Filed 2008·Granted Feb 28, 2012·2 cites·37 claims
- 2766US8012532B2Methods of making crystalline tantalum pentoxideMICRON TECHNOLOGY INC·Filed 2007·Granted Sep 6, 2011·2 cites·24 claims
- 2866US7968969B2Electrical components for microelectronic devicesMICRON TECHNOLOGY INC·Filed 2009·Granted Jun 28, 2011·2 cites·23 claims
- 2966US6940112B2Integrated capacitors fabricated with conductive metal oxidesMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 6, 2005·9 cites·5 claims
- 3065US8513807B2Semiconductor devices including a ruthenium filmBHAT VISHWANATH·Filed 2012·Granted Aug 20, 2013·1 cites·25 claims
- 3165US6781175B2Rhodium-rich integrated circuit capacitor electrodeMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 24, 2004·6 cites·10 claims
- 3264US8951903B2Graded dielectric structuresGEALY DAN·Filed 2012·Granted Feb 10, 2015·1 cites·29 claims
- 3363US6740554B2Methods to form rhodium-rich oxygen barriersMICRON TECHNOLOGY INC·Filed 2002·Granted May 25, 2004·5 cites·30 claims
- 3460US2007020394A1Methods and apparatus for vapor processing of micro-device workpiecesMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 3559US7038263B2Integrated circuits with rhodium-rich structuresMICRON TECHNOLOGY INC·Filed 2004·Granted May 2, 2006·4 cites·32 claims
- 3659US6111285ABoride electrodes and barriers for cell dielectricsMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 29, 2000·17 cites·47 claims
- 3758US8133554B2Methods for depositing material onto microfeature workpieces in reaction chambers and systems for depositing materials onto microfeature workpiecesDANDO ROSS S·Filed 2004·Granted Mar 13, 2012·2 cites·17 claims
- 3855US8900992B2Methods of forming a ruthenium material, methods of forming a capacitor, and related electronic systemsMICRON TECHNOLOGY INC·Filed 2013·Granted Dec 2, 2014·0 cites·19 claims
- 3954US7584942B2Ampoules for producing a reaction gas and systems for depositing materials onto microfeature workpieces in reaction chambersMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 8, 2009·1 cites·17 claims
- 4054US2006199311A1Antifuse having tantalum oxynitride film and method for making sameMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 4153US7232721B2Structures and methods for enhancing capacitors in integrated circuitsMICRON TECHNOLOGY INC·Filed 2004·Granted Jun 19, 2007·2 cites·25 claims
- 4253US2006131615A1Structures and methods for enhancing capacitors in integrated circuitsMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 4352US7176079B2Method of fabricating a semiconductor device with a wet oxidation with steam processMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 13, 2007·2 cites·5 claims
- 4452US2006289969A1Laser assisted material depositionMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 4552US2006288937A1Laser assisted material depositionMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 4650US8378430B2Transistors having argon gate implants and methods of forming the sameMICRON TECHNOLOGY INC·Filed 2010·Granted Feb 19, 2013·0 cites·19 claims
- 4750US2004255859A1Method and apparatus for delivering precursorsFiled 2004·Application pending·0 cites
- 4848US2006246655A1Memory of forming a coupling dielectric ta2o5 in a memory deviceMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 4944US6949477B2Method of fabricating a capacitive element for a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 27, 2005·0 cites·14 claims
- 5043US7064052B2Method of processing a transistor gate dielectric film with stemMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 20, 2006·0 cites·6 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Dan Gealy files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →