Inventor · disambiguated record
Robert J. Baseman
Also filed as: BASEMAN ROBERT · BASEMAN ROBERT J · BASEMAN ROBERT JEFFREY
33 granted patents·8 pending applications·734 citations·filing 1989–2022
97Inventor score
Top patents by PatentIndex Score
41 records- 0197US6671673B1Method for integrated supply chain and financial managementIBM·Filed 2000·Granted Dec 30, 2003·347 cites·4 claims
- 0292US10365640B2Controlling multi-stage manufacturing process based on internet of things (IoT) sensors and cognitive rule inductionIBM·Filed 2017·Granted Jul 30, 2019·6 cites·14 claims
- 0388US11410891B2Anomaly detection and remedial recommendationIBM·Filed 2019·Granted Aug 9, 2022·5 cites·15 claims
- 0488US8285414B2Method and system for evaluating a machine tool operating characteristicsAHARONI EHUD·Filed 2009·Granted Oct 9, 2012·22 cites·27 claims
- 0588US5346518AVapor drain systemIBM·Filed 1993·Granted Sep 13, 1994·114 cites·24 claims
- 0685US5093279ALaser ablation damascene processIBM·Filed 1991·Granted Mar 3, 1992·101 cites·13 claims
- 0784US9176183B2Method and system for wafer quality predictive modeling based on multi-source information with heterogeneous relatednessIBM·Filed 2012·Granted Nov 3, 2015·6 cites·13 claims
- 0883US7539585B2System and method for rule-based data mining and problem detection for semiconductor fabricationIBM·Filed 2007·Granted May 26, 2009·7 cites·11 claims
- 0981US8732627B2Method and apparatus for hierarchical wafer quality predictive modelingBASEMAN ROBERT J·Filed 2012·Granted May 20, 2014·3 cites·15 claims
- 1080US11022965B2Controlling multi-stage manufacturing process based on internet of things (IOT) sensors and cognitive rule inductionIBM·Filed 2019·Granted Jun 1, 2021·1 cites·20 claims
- 1178US9240360B2Run-to-run control utilizing virtual metrology in semiconductor manufacturingBASEMAN ROBERT JEFFREY·Filed 2012·Granted Jan 19, 2016·5 cites·17 claims
- 1278US7363259B2Value-based framework for inventory managementIBM·Filed 2000·Granted Apr 22, 2008·14 cites·12 claims
- 1377US9299623B2Run-to-run control utilizing virtual metrology in semiconductor manufacturingIBM·Filed 2012·Granted Mar 29, 2016·3 cites·15 claims
- 1477US8328950B2Foreign material contamination detectionBASEMAN ROBERT J·Filed 2010·Granted Dec 11, 2012·4 cites·25 claims
- 1575US8594826B2Method and system for evaluating a machine tool operating characteristicsAHARONI EHUD·Filed 2012·Granted Nov 26, 2013·3 cites·25 claims
- 1673US8793106B2Continuous prediction of expected chip performance throughout the production lifecycleBASEMAN ROBERT J·Filed 2011·Granted Jul 29, 2014·3 cites·25 claims
- 1773US7650251B2System and method for rule-based data mining and problem detection for semiconductor fabricationIBM·Filed 2008·Granted Jan 19, 2010·6 cites·11 claims
- 1873US4845542AInterconnect for layered integrated circuit assemblyUNISYS CORP·Filed 1989·Granted Jul 4, 1989·41 cites·11 claims
- 1972US5134038AThin film magnetic recording medium with controlled grain morphology and topologyIBM·Filed 1991·Granted Jul 28, 1992·21 cites·15 claims
- 2071US7962302B2Predicting wafer failure using learned probabilityIBM·Filed 2008·Granted Jun 14, 2011·5 cites·20 claims
- 2166US8594821B2Detecting combined tool incompatibilities and defects in semiconductor manufacturingBASEMAN ROBERT J·Filed 2011·Granted Nov 26, 2013·2 cites·21 claims
- 2263US10585425B2Controlling multi-stage manufacturing process based on internet of things (IOT) sensors and cognitive rule inductionIBM·Filed 2017·Granted Mar 10, 2020·0 cites·9 claims
- 2363US2004059627A1Method for integrated supply chain and financial managementFiled 2003·Application pending·0 cites
- 2462US9915942B2System and method for identifying significant and consumable-insensitive trace featuresIBM·Filed 2015·Granted Mar 13, 2018·1 cites·18 claims
- 2562US8315729B2Enhancing investigation of variability by inclusion of similar objects with known differences to the original onesBASEMAN ROBERT J·Filed 2010·Granted Nov 20, 2012·1 cites·19 claims
- 2660US5053250AThin film magnetic medium with controlled grain morphology and topology for improved performanceIBM·Filed 1991·Granted Oct 1, 1991·12 cites·23 claims
- 2758US8533635B2Rule-based root cause and alias analysis for semiconductor manufacturingBASEMAN ROBERT J·Filed 2010·Granted Sep 10, 2013·1 cites·19 claims
- 2857US2005080696A1Method and system for generating a business case for a server infrastructureIBM·Filed 2003·Application pending·0 cites
- 2956US2013338808A1Method and Apparatus for Hierarchical Wafer Quality Predictive ModelingBASEMAN ROBERT J·Filed 2012·Application pending·0 cites
- 3051US11954615B2Model management for non-stationary systemsIBM·Filed 2019·Granted Apr 9, 2024·0 cites·20 claims
- 3151US2024047279A1Using sequence mining to predict quality and yieldIBM·Filed 2022·Application pending·0 cites
- 3250US8639375B2Enhancing investigation of variability by inclusion of similar objects with known differences to the original onesIBM·Filed 2012·Granted Jan 28, 2014·0 cites·19 claims
- 3350US2012316818A1System for monitoring multi-orderable measurement dataBASEMAN ROBERT J·Filed 2012·Application pending·0 cites
- 3449US12197133B2Tool control using multistage LSTM for predicting on-wafer measurementsIBM·Filed 2019·Granted Jan 14, 2025·0 cites·11 claims
- 3549US9395408B2System for wafer quality predictive modeling based on multi-source information with heterogeneous relatednessGLOBALFOUNDRIES INC·Filed 2012·Granted Jul 19, 2016·0 cites·13 claims
- 3648US2010017009A1System for monitoring multi-orderable measurement dataIBM·Filed 2008·Application pending·0 cites
- 3747US12073152B2Vehicle asset modeling using language processing methodsIBM·Filed 2020·Granted Aug 27, 2024·0 cites·20 claims
- 3847US11599690B2Wafer asset modeling using language processing methodsIBM·Filed 2020·Granted Mar 7, 2023·0 cites·19 claims
- 3946US2023281363A1Optimal materials and devices design using artificial intelligenceIBM·Filed 2022·Application pending·0 cites
- 4044US8718809B2Comprehensive analysis of queue times in microelectronic manufacturingBASEMAN ROBERT J·Filed 2010·Granted May 6, 2014·0 cites·25 claims
- 4139US2019198405A1Statistical framework for tool chamber matching in semiconductor manufacturing processesIBM·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →