Individual holder
BASEMAN ROBERT J
US·8 granted patents·2 pending applications·14 citations·filing 2010–2012
Individually held — no corporate assignee on record.
Top patents by PatentIndex Score
10 records- 0181US8732627B2Method and apparatus for hierarchical wafer quality predictive modelingBASEMAN ROBERT J·Filed 2012·Granted May 20, 2014·3 cites·15 claims
- 0277US8328950B2Foreign material contamination detectionBASEMAN ROBERT J·Filed 2010·Granted Dec 11, 2012·4 cites·25 claims
- 0373US8793106B2Continuous prediction of expected chip performance throughout the production lifecycleBASEMAN ROBERT J·Filed 2011·Granted Jul 29, 2014·3 cites·25 claims
- 0466US8594821B2Detecting combined tool incompatibilities and defects in semiconductor manufacturingBASEMAN ROBERT J·Filed 2011·Granted Nov 26, 2013·2 cites·21 claims
- 0562US8315729B2Enhancing investigation of variability by inclusion of similar objects with known differences to the original onesBASEMAN ROBERT J·Filed 2010·Granted Nov 20, 2012·1 cites·19 claims
- 0658US8533635B2Rule-based root cause and alias analysis for semiconductor manufacturingBASEMAN ROBERT J·Filed 2010·Granted Sep 10, 2013·1 cites·19 claims
- 0756US2013338808A1Method and Apparatus for Hierarchical Wafer Quality Predictive ModelingBASEMAN ROBERT J·Filed 2012·Application pending·0 cites
- 0851US8874252B2Comprehensive analysis of queue times in microelectronic manufacturingBASEMAN ROBERT J·Filed 2012·Granted Oct 28, 2014·0 cites·13 claims
- 0950US2012316818A1System for monitoring multi-orderable measurement dataBASEMAN ROBERT J·Filed 2012·Application pending·0 cites
- 1044US8718809B2Comprehensive analysis of queue times in microelectronic manufacturingBASEMAN ROBERT J·Filed 2010·Granted May 6, 2014·0 cites·25 claims
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