Inventor · disambiguated record
James J. Demarest
Also filed as: DEMAREST JAMES · DEMAREST JAMES J · DEMAREST JAMES JOHN
45 granted patents·5 pending applications·613 citations·filing 2004–2023
97Inventor score
Top patents by PatentIndex Score
50 records- 0199US9666528B1BEOL vertical fuse formed over air gapIBM·Filed 2016·Granted May 30, 2017·430 cites·14 claims
- 0297US9449871B1Hybrid airgap structure with oxide linerIBM·Filed 2015·Granted Sep 20, 2016·21 cites·10 claims
- 0396US9780027B2Hybrid airgap structure with oxide linerIBM·Filed 2016·Granted Oct 3, 2017·13 cites·18 claims
- 0495US10043746B1Fabrication of vertical fuses from vertical finsIBM·Filed 2017·Granted Aug 7, 2018·11 cites·20 claims
- 0595US7402532B2Structure to improve adhesion between top CVD low-k dielectric and dielectric capping layerIBM·Filed 2006·Granted Jul 22, 2008·28 cites·1 claims
- 0693US9985097B2Integrated capacitors with nanosheet transistorsIBM·Filed 2016·Granted May 29, 2018·7 cites·8 claims
- 0792US9978560B2System and method for performing nano beam diffraction analysisIBM·Filed 2016·Granted May 22, 2018·6 cites·25 claims
- 0892US9978678B1Vertically integrated nanosheet fuseIBM·Filed 2017·Granted May 22, 2018·5 cites·4 claims
- 0990US8889564B2Suspended nanowire structureCHENG KANGGUO·Filed 2012·Granted Nov 18, 2014·8 cites·10 claims
- 1088US7122898B1Electrical programmable metal resistorIBM·Filed 2005·Granted Oct 17, 2006·15 cites·11 claims
- 1186US10170548B2Integrated capacitors with nanosheet transistorsIBM·Filed 2018·Granted Jan 1, 2019·3 cites·20 claims
- 1284US8796128B2Dual metal fill and dual threshold voltage for replacement gate metal devicesEDGE LISA F·Filed 2012·Granted Aug 5, 2014·9 cites·13 claims
- 1383US10475878B2BEOL capacitor through airgap metallizationIBM·Filed 2017·Granted Nov 12, 2019·3 cites·11 claims
- 1483US9057670B2Transmission electron microscope sample fabricationIBM·Filed 2013·Granted Jun 16, 2015·5 cites·20 claims
- 1582US9953915B2Electrically conductive interconnect including via having increased contact surface areaIBM·Filed 2016·Granted Apr 24, 2018·3 cites·18 claims
- 1682US7102232B2Structure to improve adhesion between top CVD low-k dielectric and dielectric capping layerIBM·Filed 2004·Granted Sep 5, 2006·19 cites·13 claims
- 1781US10319677B2Fabrication of vertical fuses from vertical finsIBM·Filed 2018·Granted Jun 11, 2019·2 cites·20 claims
- 1879US8629007B2Method of improving replacement metal gate fillHARAN BALASUBRAMANIAN S·Filed 2011·Granted Jan 14, 2014·5 cites·12 claims
- 1977US9793213B2Ion flow barrier structure for interconnect metallizationIBM·Filed 2016·Granted Oct 17, 2017·2 cites·7 claims
- 2077US7820559B2Structure to improve adhesion between top CVD low-K dielectric and dielectric capping layerIBM·Filed 2008·Granted Oct 26, 2010·4 cites·19 claims
- 2176US10043748B1Vertically integrated nanosheet fuseIBM·Filed 2017·Granted Aug 7, 2018·1 cites·16 claims
- 2275US9406790B2Suspended ring-shaped nanowire structureGLOBALFOUNDRIES INC·Filed 2014·Granted Aug 2, 2016·2 cites·11 claims
- 2372US10528817B2Smart display apparatus and control systemIBM·Filed 2017·Granted Jan 7, 2020·1 cites·20 claims
- 2472US7287325B2Method of forming interconnect structure or interconnect and via structures using post chemical mechanical polishingIBM·Filed 2005·Granted Oct 30, 2007·3 cites·7 claims
- 2571US9553044B2Electrically conductive interconnect including via having increased contact surface areaIBM·Filed 2014·Granted Jan 24, 2017·2 cites·10 claims
- 2671US9184042B1Wafer backside particle mitigationIBM·Filed 2014·Granted Nov 10, 2015·2 cites·17 claims
- 2769US11263059B2Load levelerIBM·Filed 2018·Granted Mar 1, 2022·1 cites·18 claims
- 2864US10658154B2System and method for performing nano beam diffraction analysisIBM·Filed 2018·Granted May 19, 2020·0 cites·18 claims
- 2963US10109455B2System and method for performing nano beam diffraction analysisIBM·Filed 2018·Granted Oct 23, 2018·0 cites·20 claims
- 3062US11113533B2Smart display apparatus and control systemIBM·Filed 2019·Granted Sep 7, 2021·0 cites·20 claims
- 3161US10546813B2BEOL vertical fuse formed over air gapIBM·Filed 2018·Granted Jan 28, 2020·0 cites·20 claims
- 3261US10453793B2BEOL vertical fuse formed over air gapIBM·Filed 2018·Granted Oct 22, 2019·0 cites·20 claims
- 3361US10319676B2Vertically integrated nanosheet fuseIBM·Filed 2018·Granted Jun 11, 2019·0 cites·20 claims
- 3458US10083908B2BEOL vertical fuse formed over air gapIBM·Filed 2017·Granted Sep 25, 2018·0 cites·11 claims
- 3558US9997454B2BEOL vertical fuse formed over air gapIBM·Filed 2016·Granted Jun 12, 2018·0 cites·7 claims
- 3658US2025054874A1Three-dimensional self-reference marking featuresIBM·Filed 2023·Application pending·0 cites
- 3757US7835564B2Non-destructive, below-surface defect rendering using image intensity analysisIBM·Filed 2007·Granted Nov 16, 2010·2 cites·20 claims
- 3856US11876023B2Conformal film thickness determination using angled geometric features and vertices trackingIBM·Filed 2021·Granted Jan 16, 2024·0 cites·9 claims
- 3955US9331073B2Epitaxially grown quantum well finFETs for enhanced pFET performanceIBM·Filed 2014·Granted May 3, 2016·0 cites·10 claims
- 4053US9966305B2Ion flow barrier structure for interconnect metallizationIBM·Filed 2016·Granted May 8, 2018·0 cites·9 claims
- 4151US11005646B2Blockchain stochastic timer transaction synchronizationIBM·Filed 2018·Granted May 11, 2021·0 cites·19 claims
- 4251US10566414B2BEOL capacitor through airgap metallizationIBM·Filed 2016·Granted Feb 18, 2020·0 cites·9 claims
- 4350US7651892B2Electrical programmable metal resistorIBM·Filed 2006·Granted Jan 26, 2010·0 cites·9 claims
- 4449US9318347B2Wafer backside particle mitigationIBM·Filed 2014·Granted Apr 19, 2016·0 cites·19 claims
- 4549US8465657B2Post chemical mechanical polishing etch for improved time dependent dielectric breakdown reliabilityCHANDA KAUSHIK·Filed 2007·Granted Jun 18, 2013·0 cites·21 claims
- 4649US2014084382A1Dual metal fill and dual threshold voltage for replacement gate metal devicesIBM·Filed 2013·Application pending·0 cites
- 4749US2006098862A1Nanoscale defect image detection for semiconductorsIBM·Filed 2004·Application pending·0 cites
- 4849US2019167226A1Infant gastrointestinal monitorIBM·Filed 2017·Application pending·0 cites
- 4946US2016093697A1Epitaxially grown quantum well finfets for enhanced pfet performanceIBM·Filed 2015·Application pending·0 cites
- 5043US7473636B2Method to improve time dependent dielectric breakdownIBM·Filed 2006·Granted Jan 6, 2009·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →