Inventor · disambiguated record
Ryoichi Matsuoka
Also filed as: MATSUOKA RYOICHI
51 granted patents·15 pending applications·410 citations·filing 2000–2014
98Inventor score
Files withHITACHI HIGH TECH CORP23MATSUOKA RYOICHI7MIYAMOTO ATSUSHI6TOYODA YASUTAKA6SHINODA SHINICHI5
Top patents by PatentIndex Score
66 records- 0197US7559047B2Method and apparatus for creating imaging recipeHITACHI HIGH TECH CORP·Filed 2006·Granted Jul 7, 2009·36 cites·15 claims
- 0295US7365322B2Method and apparatus for arranging recipe of scanning electron microscope and apparatus for evaluating shape of semiconductor device patternHITACHI LTD·Filed 2006·Granted Apr 29, 2008·28 cites·29 claims
- 0394US7923703B2Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatusHITACHI HIGH TECH CORP·Filed 2007·Granted Apr 12, 2011·18 cites·13 claims
- 0494US7449689B2Dimension measuring SEM system, method of evaluating shape of circuit pattern and a system for carrying out the methodHITACHI HIGH TECH CORP·Filed 2005·Granted Nov 11, 2008·23 cites·20 claims
- 0592US7518110B2Pattern measuring method and pattern measuring deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 14, 2009·13 cites·9 claims
- 0691US8767038B2Method and device for synthesizing panorama image using scanning charged-particle microscopeMIYAMOTO ATSUSHI·Filed 2009·Granted Jul 1, 2014·18 cites·5 claims
- 0791US7732792B2Pattern measurement apparatusHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 8, 2010·23 cites·5 claims
- 0890US7615746B2Method and apparatus for evaluating pattern shape of a semiconductor deviceHITACHI HIGH TECH CORP·Filed 2006·Granted Nov 10, 2009·12 cites·18 claims
- 0990US7507961B2Method and apparatus of pattern inspection and semiconductor inspection system using the sameHITACHI HIGH TECH CORP·Filed 2006·Granted Mar 24, 2009·18 cites·23 claims
- 1089US8019161B2Method, device and computer program of length measurementHITACHI HIGH TECH CORP·Filed 2007·Granted Sep 13, 2011·14 cites·18 claims
- 1189US7679055B2Pattern displacement measuring method and pattern measuring deviceHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 16, 2010·16 cites·4 claims
- 1289US7681159B2System and method for detecting defects in a semiconductor during manufacturing thereofHITACHI HIGH TECH CORP·Filed 2007·Granted Mar 16, 2010·15 cites·10 claims
- 1388US8994815B2Method of extracting contour lines of image data obtained by means of charged particle beam device, and contour line extraction deviceMITO HIROAKI·Filed 2011·Granted Mar 31, 2015·12 cites·9 claims
- 1487US8853630B2Scanning electron microscope and a method for imaging a specimen using the sameHITACHI HIGH TECH CORP·Filed 2014·Granted Oct 7, 2014·5 cites·10 claims
- 1584US8515155B2Pattern generating apparatus and pattern shape evaluating apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Aug 20, 2013·5 cites·16 claims
- 1684US8445871B2Pattern measurement apparatusMATSUOKA RYOICHI·Filed 2010·Granted May 21, 2013·6 cites·16 claims
- 1784US8077962B2Pattern generating apparatus and pattern shape evaluating apparatusTOYODA YASUTAKA·Filed 2009·Granted Dec 13, 2011·9 cites·44 claims
- 1882US8577124B2Method and apparatus of pattern inspection and semiconductor inspection system using the sameTOYODA YASUTAKA·Filed 2012·Granted Nov 5, 2013·5 cites·10 claims
- 1982US8158938B2Scanning electron microscope and a method for imaging a specimen using the sameMIYAMOTO ATSUSHI·Filed 2007·Granted Apr 17, 2012·5 cites·18 claims
- 2081US9696150B2Overlay error measuring device and computer programHITACHI HIGH TECH CORP·Filed 2013·Granted Jul 4, 2017·3 cites·8 claims
- 2181US8338804B2Sample dimension inspecting/measuring method and sample dimension inspecting/measuring apparatusMOROKUMA HIDETOSHI·Filed 2011·Granted Dec 25, 2012·6 cites·15 claims
- 2281US8173962B2Pattern displacement measuring method and pattern measuring deviceSUTANI TAKUMICHI·Filed 2010·Granted May 8, 2012·6 cites·4 claims
- 2379US7978904B2Pattern inspection apparatus and semiconductor inspection systemHITACHI HIGH TECH CORP·Filed 2007·Granted Jul 12, 2011·9 cites·15 claims
- 2478US8115169B2Method and apparatus of pattern inspection and semiconductor inspection system using the sameTOYODA YASUTAKA·Filed 2009·Granted Feb 14, 2012·3 cites·7 claims
- 2578US6757875B2Method and apparatus of evaluating layer matching deviation based on CAD informationSEIKO INSTR INC·Filed 2002·Granted Jun 29, 2004·14 cites·10 claims
- 2678US6724929B1Wafer inspecting apparatusSEIKO INSTR INC·Filed 2000·Granted Apr 20, 2004·24 cites·20 claims
- 2775US8642957B2Scanning electron microscope and a method for imaging a specimen using the sameMIYAMOTO ATSUSHI·Filed 2012·Granted Feb 4, 2014·2 cites·7 claims
- 2875US8355562B2Pattern shape evaluation methodHITACHI HIGH TECH CORP·Filed 2008·Granted Jan 15, 2013·9 cites·19 claims
- 2975US8295584B2Pattern measurement methods and pattern measurement equipmentSATO HIDETOSHI·Filed 2009·Granted Oct 23, 2012·11 cites·2 claims
- 3074US8972911B2Image processing device and computer program for performing image processingMATSUOKA RYOICHI·Filed 2012·Granted Mar 3, 2015·3 cites·15 claims
- 3174US8507856B2Pattern measuring method and pattern measuring deviceSUTANI TAKUMICHI·Filed 2012·Granted Aug 13, 2013·2 cites·8 claims
- 3273US9343264B2Scanning electron microscope device and pattern dimension measuring method using sameKOTAKI GO·Filed 2010·Granted May 17, 2016·4 cites·9 claims
- 3373USRE45224EMethod and apparatus for creating imaging recipeMIYAMOTO ATSUSHI·Filed 2009·Granted Oct 28, 2014·2 cites·29 claims
- 3473US8363923B2Pattern generating apparatus and pattern shape evaluating apparatusHITACHI HIGH TECH CORP·Filed 2011·Granted Jan 29, 2013·2 cites·10 claims
- 3573US8311314B2Pattern measuring method and pattern measuring deviceMATSUOKA RYOICHI·Filed 2009·Granted Nov 13, 2012·6 cites·9 claims
- 3672US7991218B2Pattern matching apparatus and semiconductor inspection system using the sameHITACHI HIGH TECH CORP·Filed 2006·Granted Aug 2, 2011·6 cites·20 claims
- 3771US8788242B2Pattern measurement apparatusMATSUOKA RYOICHI·Filed 2010·Granted Jul 22, 2014·3 cites·4 claims
- 3868US8655050B2Pattern generating apparatus and pattern shape evaluating apparatusHITACHI HIGH TECH CORP·Filed 2013·Granted Feb 18, 2014·1 cites·13 claims
- 3966US7800060B2Pattern measurement method and pattern measurement systemHITACHI HIGH TECH CORP·Filed 2008·Granted Sep 21, 2010·1 cites·17 claims
- 4065US8581187B2Method for measuring sample and measurement deviceKIJIMA MIHOKO·Filed 2009·Granted Nov 12, 2013·3 cites·13 claims
- 4163US10643326B2Semiconductor measurement apparatus and computer programHITACHI HIGH TECH CORP·Filed 2013·Granted May 5, 2020·1 cites·10 claims
- 4263US8867818B2Method of creating template for matching, as well as device for creating templateMATSUOKA RYOICHI·Filed 2010·Granted Oct 21, 2014·1 cites·12 claims
- 4362US8577125B2Method and apparatus for image generationSHINODA SHINICHI·Filed 2008·Granted Nov 5, 2013·3 cites·13 claims
- 4460USRE45204EMethod and apparatus for creating imaging recipeMIYAMOTO ATSUSHI·Filed 2009·Granted Oct 21, 2014·0 cites·16 claims
- 4560US2009200465A1Pattern measuring method and pattern measuring deviceSUTANI TAKUMICHI·Filed 2009·Application pending·0 cites
- 4658US8073242B2SEM system and a method for producing a recipeMIYAMOTO ATSUSHI·Filed 2007·Granted Dec 6, 2011·2 cites·22 claims
- 4750US7257785B2Method and apparatus of evaluating layer matching deviation based on CAD informationSII NANOTECHNOLOGY INC·Filed 2004·Granted Aug 14, 2007·2 cites·9 claims
- 4848US2013117723A1Pattern shape evaluation method, pattern shape evaluation device, pattern shape evaluating data generation device and semiconductor shape evaluation system using the sameHITACHI HIGH TECH CORP·Filed 2012·Application pending·0 cites
- 4948US2010138801A1System and Method for Detecting a DefectHITACHI HIGH TECH CORP·Filed 2010·Application pending·0 cites
- 5047US8705841B2Pattern inspection method, pattern inspection apparatus and pattern processing apparatusSHINODA SHINICHI·Filed 2009·Granted Apr 22, 2014·0 cites·18 claims
Showing the top 50 of 66 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →