Inventor · disambiguated record
Michael R. Scheinfein
Also filed as: SCHEINFEIN MICHAEL R · SCHEINFEIN MICHAEL ROSS
7 granted patents·175 citations·filing 2001–2010
87Inventor score
Technology areasH01J
Top patents by PatentIndex Score
7 records- 0195US6900447B2Focused ion beam system with coaxial scanning electron microscopeFEI CO·Filed 2003·Granted May 31, 2005·77 cites·36 claims
- 0291US8357894B2Microcalorimetry for X-ray spectroscopyFEI CO·Filed 2010·Granted Jan 22, 2013·18 cites·21 claims
- 0391US7504623B2Device and method for milling of material using ionsE A FISCHIONE INSTR INC·Filed 2006·Granted Mar 17, 2009·17 cites·61 claims
- 0488US6946654B2Collection of secondary electrons through the objective lens of a scanning electron microscopeFEI CO·Filed 2001·Granted Sep 20, 2005·30 cites·31 claims
- 0586US7132673B2Device and method for milling of material using ionsE A FISCHIONE INSTR INC·Filed 2004·Granted Nov 7, 2006·23 cites·121 claims
- 0685US7372195B2Electron beam source having an extraction electrode provided with a magnetic disk elementAPPLIED MATERIALS INC·Filed 2005·Granted May 13, 2008·9 cites·22 claims
- 0763US8884245B2Corrector for the correction of chromatic aberrations in a particle-optical apparatusHENSTRA ALEXANDER·Filed 2006·Granted Nov 11, 2014·1 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →