Inventor · disambiguated record
Joo Weon Park
Also filed as: PARK JOO W · PARK JOO WEON
14 granted patents·2 pending applications·528 citations·filing 1990–2009
94Inventor score
Top patents by PatentIndex Score
16 records- 0197US7558900B2Serial flash semiconductor memoryWINBOND ELECTRONICS CORP·Filed 2005·Granted Jul 7, 2009·79 cites·29 claims
- 0293US6873004B1Virtual ground single transistor memory cell, memory array incorporating same, and method of operation thereofNEXFLASH TECHNOLOGIES INC·Filed 2003·Granted Mar 29, 2005·97 cites·14 claims
- 0393US6826080B2Virtual ground nonvolatile semiconductor memory array architecture and integrated circuit structure thereforNEXFLASH TECHNOLOGIES INC·Filed 2002·Granted Nov 30, 2004·94 cites·19 claims
- 0484US6909639B2Nonvolatile memory having bit line discharge, and method of operation thereofNEXFLASH TECHNOLOGIES INC·Filed 2003·Granted Jun 21, 2005·34 cites·19 claims
- 0584US6775184B1Nonvolatile memory integrated circuit having volatile utility and buffer memories, and method of operation thereofNEXFLASH TECHNOLOGIES INC·Filed 2003·Granted Aug 10, 2004·41 cites·23 claims
- 0684US5057711ANoise reducing output buffer circuit for an integrated circuitHYUNDAI ELECTRONICS IND·Filed 1990·Granted Oct 15, 1991·45 cites·4 claims
- 0772US5694359AFlash memory deviceHYUNDAI ELECTRONICS IND·Filed 1996·Granted Dec 2, 1997·32 cites·6 claims
- 0870US5777922AFlash memory deviceHYUNDAI ELECTRONICS IND·Filed 1996·Granted Jul 7, 1998·32 cites·2 claims
- 0967US6768671B1Nonvolatile memory and method of operation thereof to control erase disturbNEXFLASH TECHNOLOGIES INC·Filed 2003·Granted Jul 27, 2004·16 cites·17 claims
- 1058US5920225ANegative voltage drive circuitHYUNDAI ELECTRONICS IND·Filed 1996·Granted Jul 6, 1999·27 cites·6 claims
- 1152US5963479AMethod of erasing a flash memory cell and device for erasing the sameHYUNDAI ELECTRONICS IND·Filed 1997·Granted Oct 5, 1999·14 cites·5 claims
- 1242US2010049948A1Serial flash semiconductor memoryWINBOND ELECTRONICS CORP·Filed 2009·Application pending·0 cites
- 1341US5956283AMethod of reading a flash memory cell and a read voltage generating circuitHYUNDAI ELECTRONICS IND·Filed 1997·Granted Sep 21, 1999·8 cites·1 claims
- 1440US5563548AOutput voltage controlling circuit in a negative charge pumpHYUNDAI ELECTRONICS IND·Filed 1995·Granted Oct 8, 1996·7 cites·11 claims
- 1539US6728140B2Threshold voltage convergenceNEXFLASH TECHNOLOGIES INC·Filed 2001·Granted Apr 27, 2004·2 cites·51 claims
- 1631US2004153902A1Serial flash integrated circuit having error detection and correctionNEXFLASH TECHNOLOGIES INC·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →