Inventor · disambiguated record
John Caldwell
Also filed as: CALDWELL JOHN · CALDWELL JOHN L · CALDWELL JOHN LARRY
15 granted patents·9 pending applications·278 citations·filing 2000–2018
93Inventor score
Files withMICRON TECHNOLOGY INC12CALDWELL JOHN2DAVALOS RAFAEL V2FARNWORTH WARREN M2CALDWELL JOHN LARRY1
Top patents by PatentIndex Score
24 records- 0198US8968542B2Devices and methods for contactless dielectrophoresis for cell or particle manipulationDAVALOS RAFAEL V·Filed 2010·Granted Mar 3, 2015·53 cites·3 claims
- 0297US8926606B2Integration of very short electric pulses for minimally to noninvasive electroporationDAVALOS RAFAEL·Filed 2010·Granted Jan 6, 2015·134 cites·27 claims
- 0392US10078066B2Devices and methods for contactless dielectrophoresis for cell or particle manipulationDAVALOS RAFAEL V·Filed 2015·Granted Sep 18, 2018·5 cites·17 claims
- 0480US7459923B2Probe interposers and methods of fabricating probe interposersMICRON TECHNOLOGY INC·Filed 2006·Granted Dec 2, 2008·11 cites·24 claims
- 0579US11519877B2Devices and methods for contactless dielectrophoresis for cell or particle manipulationVIRGINIA TECH INTELLECTUAL PROPERTIES INC·Filed 2018·Granted Dec 6, 2022·1 cites·30 claims
- 0677US7358517B2Method and apparatus for imager quality testingMICRON TECHNOLOGY INC·Filed 2006·Granted Apr 15, 2008·4 cites·22 claims
- 0776US6974330B2Electronic devices incorporating electrical interconnections with improved reliability and methods of fabricating sameMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 13, 2005·21 cites·56 claims
- 0875US6441606B1Dual zone wafer test apparatusMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 27, 2002·20 cites·38 claims
- 0973US7213330B2Method of fabricating an electronic deviceMICRON TECHNOLOGY INC·Filed 2004·Granted May 8, 2007·17 cites·16 claims
- 1068US7573276B2Probe card layoutMICRON TECHNOLOGY INC·Filed 2006·Granted Aug 11, 2009·4 cites·7 claims
- 1167US7868630B2Integrated light conditioning devices on a probe card for testing imaging devices, and methods of fabricating sameMICRON TECHNOLOGY INC·Filed 2007·Granted Jan 11, 2011·7 cites·20 claims
- 1252US7122819B2Method and apparatus for imager die package quality testingMICRON TECHNOLOGY INC·Filed 2004·Granted Oct 17, 2006·0 cites·50 claims
- 1349US2017145384A1Carbon-nanotube modulation of myocyte cellsUNIV COLORADO REGENTS·Filed 2016·Application pending·0 cites
- 1449US2014087461A1Carbon-nanotube modulation of myocyte cellsMESTRONI LUISA·Filed 2012·Application pending·0 cites
- 1547US7884629B2Probe card layoutMICRON TECHNOLOGY INC·Filed 2009·Granted Feb 8, 2011·0 cites·11 claims
- 1645US2007018336A1Stress and force management techniques for a semiconductor dieFARNWORTH WARREN M·Filed 2006·Application pending·0 cites
- 1742US8701686B2Flossing devices and methods of using sameCALDWELL JOHN LARRY·Filed 2012·Granted Apr 22, 2014·0 cites·21 claims
- 1842US2006197544A1Test sockets, test systems, and methods for testing microfeature devicesMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 1942US2006197545A1Test sockets, test systems, and methods for testing microfeature devicesMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 2041US7256595B2Test sockets, test systems, and methods for testing microfeature devicesMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 14, 2007·1 cites·21 claims
- 2140US2012085649A1Dielectrophoresis devices and methods thereforSANO MICHAEL B·Filed 2011·Application pending·0 cites
- 2238US2007245552A1Probe interposers and methods of fabricating probe interposersCALDWELL JOHN·Filed 2006·Application pending·0 cites
- 2338US2005206012A1Stress and force management techniques for a semiconductor dieFARNWORTH WARREN M·Filed 2004·Application pending·0 cites
- 2435US2008044623A1Probe card for testing imaging devices, and methods of fabricating sameCALDWELL JOHN·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →