Inventor · disambiguated record
Chun-Liang Hou
Also filed as: HOU CHUN-LIANG
35 granted patents·12 pending applications·100 citations·filing 2008–2025
96Inventor score
Top patents by PatentIndex Score
47 records- 0197US11735644B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2021·Granted Aug 22, 2023·3 cites·10 claims
- 0297US11264492B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Mar 1, 2022·21 cites·2 claims
- 0396US11894441B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2022·Granted Feb 6, 2024·2 cites·7 claims
- 0496US11804544B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2022·Granted Oct 31, 2023·2 cites·9 claims
- 0596US11695049B2High electron mobility transistor and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2020·Granted Jul 4, 2023·4 cites·14 claims
- 0695US12027604B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Jul 2, 2024·1 cites·10 claims
- 0790US10971610B2High electron mobility transistorUNITED MICROELECTRONICS CORP·Filed 2019·Granted Apr 6, 2021·4 cites·21 claims
- 0889US12328889B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Granted Jun 10, 2025·0 cites·9 claims
- 0989US7715260B1Operating voltage tuning method for static random access memoryUNITED MICROELECTRONICS CORP·Filed 2008·Granted May 11, 2010·41 cites·12 claims
- 1087US9230871B1Test key structure and test key groupUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jan 5, 2016·7 cites·11 claims
- 1186US12125903B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Oct 22, 2024·0 cites·8 claims
- 1286US2025275164A1High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 1385US11367779B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jun 21, 2022·2 cites·6 claims
- 1484US2025015173A1High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2024·Application pending·0 cites
- 1582US12206000B2High electron mobility transistor and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2024·Granted Jan 21, 2025·0 cites·6 claims
- 1682US2024128353A1High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 1782US2024234539A9High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 1879US12266701B2High electron mobility transistor and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2023·Granted Apr 1, 2025·0 cites·14 claims
- 1978US2025204005A1High electron mobility transistor and method for forming the sameUNITED MICROELECTRONICS CORP·Filed 2025·Application pending·0 cites
- 2076US9063193B2Layout structure of electronic element and testing method of the same thereofUNITED MICROELECTRONICS CORP·Filed 2013·Granted Jun 23, 2015·3 cites·18 claims
- 2174US11502177B2High electron mobility transistor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2021·Granted Nov 15, 2022·0 cites·11 claims
- 2274US11489048B2High electron mobility transistor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2021·Granted Nov 1, 2022·0 cites·9 claims
- 2374US10861970B1Semiconductor epitaxial structure with reduced defectsUNITED MICROELECTRONICS CORP·Filed 2019·Granted Dec 8, 2020·1 cites·20 claims
- 2474US8516400B2Method for predicting tolerable spacing between conductors in semiconductor processKUO CHIEN-LI·Filed 2010·Granted Aug 20, 2013·4 cites·20 claims
- 2572US2023369448A1High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 2672US2023378314A1High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2023·Application pending·0 cites
- 2770US11610989B2High electron mobility transistorUNITED MICROELECTRONICS CORP·Filed 2021·Granted Mar 21, 2023·0 cites·30 claims
- 2870US10776402B2Manufacture parameters grouping and analyzing method, and manufacture parameters grouping and analyzing systemUNITED MICROELECTRONICS CORP·Filed 2017·Granted Sep 15, 2020·1 cites·14 claims
- 2969US9235677B1Thermal uniformity compensating method and apparatusUNITED MICROELECTRONICS CORP·Filed 2014·Granted Jan 12, 2016·2 cites·16 claims
- 3067US11239338B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Feb 1, 2022·0 cites·8 claims
- 3165US11063124B2High electron mobility transistor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted Jul 13, 2021·0 cites·9 claims
- 3264US11749740B2High electron mobility transistor and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Sep 5, 2023·0 cites·2 claims
- 3359US10762618B1Mask weak pattern recognition apparatus and mask weak pattern recognition methodUNITED MICROELECTRONICS CORP·Filed 2019·Granted Sep 1, 2020·1 cites·22 claims
- 3456US11791407B2Semiconductor transistor structure with reduced contact resistance and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2021·Granted Oct 17, 2023·0 cites·17 claims
- 3555US11177377B2Semiconductive device with mesa structure and method of fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2019·Granted Nov 16, 2021·0 cites·10 claims
- 3653US11004952B1High-electron mobility transistor and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2019·Granted May 11, 2021·0 cites·14 claims
- 3753US2024038847A1Gallium nitride device and method for manufacturing high electron mobility transistorUNITED MICROELECTRONICS CORP·Filed 2022·Application pending·0 cites
- 3852US8546890B2Inverter structure and method for fabricating the sameKUO CHIEN-LI·Filed 2008·Granted Oct 1, 2013·1 cites·8 claims
- 3951US9171127B1Layout generating methodUNITED MICROELECTRONICS CORP·Filed 2014·Granted Oct 27, 2015·0 cites·20 claims
- 4047US11935947B2Enhancement mode high electron mobility transistorUNITED MICROELECTRONICS CORP·Filed 2019·Granted Mar 19, 2024·0 cites·15 claims
- 4145US10482153B2Analyzing method and analyzing system for manufacturing dataUNITED MICROELECTRONICS CORP·Filed 2018·Granted Nov 19, 2019·0 cites·18 claims
- 4244US9964587B2Semiconductor structure and testing method using the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted May 8, 2018·0 cites·18 claims
- 4343US2015112623A1Structure for measuring doping region resistance and method of measuring critical dimension of spacerUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 4442US2014354325A1Semiconductor layout structure and testing method thereofUNITED MICROELECTRONICS CORP·Filed 2013·Application pending·0 cites
- 4538US11074376B2Method for analyzing process output and method for creating equipment parameter modelUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jul 27, 2021·0 cites·20 claims
- 4637US2012256273A1Method of unifying device performance within dieCHIANG YU-HO·Filed 2011·Application pending·0 cites
- 4727US2016334456A1Method of generating a curve to determine an optimal operation of a waferUNITED MICROELECTRONICS CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →