Inventor · disambiguated record
Pawan Kumar Nimmakayala
Also filed as: NIMMAKAYALA PAWAN K · NIMMAKAYALA PAWAN KUMAR
17 granted patents·4 pending applications·347 citations·filing 2003–2019
95Inventor score
Files withMOLECULAR IMPRINTS INC12CHOI BYUNG JIN2KHUSNATDINOV NIYAZ2NIMMAKAYALA PAWAN KUMAR2UNIV TEXAS2
Top patents by PatentIndex Score
21 records- 0198US7170589B2Apparatus to vary dimensions of a substrate during nano-scale manufacturingMOLECULAR IMPRINTS INC·Filed 2005·Granted Jan 30, 2007·45 cites·27 claims
- 0296US7298456B2System for varying dimensions of a substrate during nanoscale manufacturingMOLECULAR IMPRINTS INC·Filed 2005·Granted Nov 20, 2007·45 cites·18 claims
- 0395US7420654B2Method of varying dimensions of a substrate during nano-scale manufacturingMOLECULAR IMPRINTS INC·Filed 2005·Granted Sep 2, 2008·34 cites·17 claims
- 0494US7245358B2Substrate support systemUNIV TEXAS·Filed 2005·Granted Jul 17, 2007·24 cites·24 claims
- 0592US7323130B2Magnification correction employing out-of-plane distortion of a substrateMOLECULAR IMPRINTS INC·Filed 2003·Granted Jan 29, 2008·45 cites·16 claims
- 0691US8652393B2Strain and kinetics control during separation phase of imprint processKHUSNATDINOV NIYAZ·Filed 2009·Granted Feb 18, 2014·17 cites·6 claims
- 0791US8432548B2Alignment for edge field nano-imprintingCHOI BYUNG-JIN·Filed 2009·Granted Apr 30, 2013·13 cites·17 claims
- 0891US7837907B2Alignment system and method for a substrate in a nano-imprint processMOLECULAR IMPRINTS INC·Filed 2008·Granted Nov 23, 2010·18 cites·13 claims
- 0991US7292326B2Interferometric analysis for the manufacture of nano-scale devicesMOLECULAR IMPRINTS INC·Filed 2004·Granted Nov 6, 2007·47 cites·23 claims
- 1091US7259833B2Substrate support methodREGENTS THE UNIVERSTIY OF TEXA·Filed 2005·Granted Aug 21, 2007·21 cites·14 claims
- 1188US8147731B2Alignment system and method for a substrate in a nano-imprint processNIMMAKAYALA PAWAN KUMAR·Filed 2010·Granted Apr 3, 2012·6 cites·20 claims
- 1282US7630067B2Interferometric analysis method for the manufacture of nano-scale devicesMOLECULAR IMPRINTS INC·Filed 2004·Granted Dec 8, 2009·18 cites·12 claims
- 1379US11161280B2Strain and kinetics control during separation phase of imprint processMOLECULAR IMPRINTS INC·Filed 2019·Granted Nov 2, 2021·1 cites·10 claims
- 1478US7880872B2Interferometric analysis method for the manufacture of nano-scale devicesMOLECULAR IMPRINTS INC·Filed 2009·Granted Feb 1, 2011·8 cites·20 claims
- 1575US7785096B2Enhanced multi channel alignmentMOLECULAR IMPRINTS INC·Filed 2009·Granted Aug 31, 2010·3 cites·19 claims
- 1669US8231821B2Substrate alignmentCHOI BYUNG-JIN·Filed 2009·Granted Jul 31, 2012·2 cites·17 claims
- 1759US2014117574A1Strain and Kinetics Control During Separation Phase of Imprint ProcessKHUSNATDINOV NIYAZ·Filed 2014·Application pending·0 cites
- 1854US2008204693A1Substrate Support MethodUNIV TEXAS·Filed 2007·Application pending·0 cites
- 1953US8334967B2Substrate support system having a plurality of contact landsNIMMAKAYALA PAWAN KUMAR·Filed 2009·Granted Dec 18, 2012·0 cites·20 claims
- 2051US2007231421A1Enhanced Multi Channel AlignmentMOLECULAR IMPRINTS INC·Filed 2007·Application pending·0 cites
- 2145US2005270516A1System for magnification and distortion correction during nano-scale manufacturingMOLECULAR IMPRINTS INC·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →