Inventor · disambiguated record
Michael Slaughter
Also filed as: SLAUGHTER MICHAEL · SLAUGHTER MICHAEL R
11 granted patents·8 pending applications·599 citations·filing 1997–2020
91Inventor score
Files withMICRON TECHNOLOGY INC13FARNWORTH WARREN M2FORSYTH VALORIS L1ILLINOIS TOOL WORKS1SLAUGHTER MICHAEL1
Top patents by PatentIndex Score
19 records- 0197US6246108B1Integrated circuit package including lead frame with electrically isolated alignment featureMICRON TECHNOLOGY INC·Filed 1999·Granted Jun 12, 2001·273 cites·20 claims
- 0297US6048744AIntegrated circuit package alignment featureMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 11, 2000·275 cites·6 claims
- 0376US6836003B2Integrated circuit package alignment featureMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 28, 2004·17 cites·8 claims
- 0475US9048272B2Devices and method for handling microelectronics assembliesFORSYTH VALORIS L·Filed 2009·Granted Jun 2, 2015·9 cites·13 claims
- 0564US7652495B2Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assembliesMICRON TECHNOLOGY INC·Filed 2006·Granted Jan 26, 2010·4 cites·31 claims
- 0658US7086562B2Methods and apparatus for retaining a tray stack having a plurality of trays for carrying microelectronic devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Aug 8, 2006·5 cites·24 claims
- 0753US6866470B2Methods and apparatus for retaining a tray stack having a plurality of trays for carrying microelectronic devicesMICRON TECHNOLOGY INC·Filed 2001·Granted Mar 15, 2005·3 cites·16 claims
- 0849US6858453B1Integrated circuit package alignment featureMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 22, 2005·11 cites·12 claims
- 0949US2021323385A1System and method for cooling an open air vehicleSLAUGHTER MICHAEL·Filed 2020·Application pending·0 cites
- 1045US7863924B2Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assembliesMICRON TECHNOLOGY INC·Filed 2009·Granted Jan 4, 2011·0 cites·11 claims
- 1145US2007018336A1Stress and force management techniques for a semiconductor dieFARNWORTH WARREN M·Filed 2006·Application pending·0 cites
- 1242US2006197544A1Test sockets, test systems, and methods for testing microfeature devicesMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 1342US2006197545A1Test sockets, test systems, and methods for testing microfeature devicesMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 1441US7256595B2Test sockets, test systems, and methods for testing microfeature devicesMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 14, 2007·1 cites·21 claims
- 1541US2004179931A1Methods and apparatus for retaining a tray stack having a plurality of trays for carrying microelectronic devicesFiled 2004·Application pending·0 cites
- 1640US2010089851A1Devices and methods for handling microelectronic assembliesMICRON TECHNOLOGY INC·Filed 2008·Application pending·0 cites
- 1739US2015235882A1Devices and methods for handling microelectronics assembliesILLINOIS TOOL WORKS·Filed 2015·Application pending·0 cites
- 1838US2005206012A1Stress and force management techniques for a semiconductor dieFARNWORTH WARREN M·Filed 2004·Application pending·0 cites
- 1929US7066708B1Methods and apparatus for retaining a tray stack having a plurality of trays for carrying microelectric devicesMICRON TECHNOLOGY INC·Filed 1999·Granted Jun 27, 2006·1 cites·28 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →