Inventor · disambiguated record
Keisuke Mizuuchi
Also filed as: MIZUUCHI KEISUKE
3 granted patents·1 pending application·16 citations·filing 2007–2013
68Inventor score
Technology areasH10P
Top patents by PatentIndex Score
4 records- 0182US8280664B2XY-coordinate compensation apparatus and method in sample pattern inspection apparatusKIMBA TOSHIFUMI·Filed 2007·Granted Oct 2, 2012·8 cites·17 claims
- 0281US9136091B2Electron beam apparatus for inspecting a pattern on a sample using multiple electron beamsEBARA CORP·Filed 2013·Granted Sep 15, 2015·4 cites·52 claims
- 0380US8639463B2Electron beam apparatus for inspecting a pattern on a sample using multiple electron beamsKIMBA TOSHIFUMI·Filed 2012·Granted Jan 28, 2014·4 cites·16 claims
- 0446US2009317628A1Methods and appartus to prevent contamination of a photoresist layer on a substrateAPPLIED MATERIALS INC·Filed 2008·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Keisuke Mizuuchi files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →