Inventor · disambiguated record
Eric W. Strid
Also filed as: STRID ERIC · STRID ERIC W
39 granted patents·6 pending applications·1,966 citations·filing 1984–2015
98Inventor score
Files withCASCADE MICROTECH INC39STRID ERIC W3BOLT BRYAN1SMITH KENNETH R1TRIQUINT SEMICONDUCTOR INC1
Top patents by PatentIndex Score
45 records- 0198US4697143AWafer probeCASCADE MICROTECH INC·Filed 1984·Granted Sep 29, 1987·257 cites·28 claims
- 0297US6815963B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2003·Granted Nov 9, 2004·80 cites·51 claims
- 0397US5565788ACoaxial wafer probe with tip shieldingCASCADE MICROTECH INC·Filed 1995·Granted Oct 15, 1996·197 cites·4 claims
- 0497US4849689AMicrowave wafer probe having replaceable probe tipCASCADE MICROTECH INC·Filed 1988·Granted Jul 18, 1989·148 cites·12 claims
- 0596US7161363B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2004·Granted Jan 9, 2007·64 cites·59 claims
- 0696US6608496B1Reference transmission line junction for probing deviceCASCADE MICROTECH INC·Filed 2000·Granted Aug 19, 2003·63 cites·6 claims
- 0795US5869975ASystem for evaluating probing networks that have multiple probing endsCASCADE MICROTECH INC·Filed 1997·Granted Feb 9, 1999·90 cites·12 claims
- 0895US5561377ASystem for evaluating probing networksCASCADE MICROTECH INC·Filed 1995·Granted Oct 1, 1996·84 cites·12 claims
- 0995US4858160ASystem for setting reference reactance for vector corrected measurementsCASCADE MICROTECH INC·Filed 1988·Granted Aug 15, 1989·112 cites·19 claims
- 1095US4764723AWafer probeCASCADE MICROTECH INC·Filed 1986·Granted Aug 16, 1988·103 cites·17 claims
- 1194US7764072B2Differential signal probing systemCASCADE MICROTECH INC·Filed 2007·Granted Jul 27, 2010·26 cites·26 claims
- 1294US7304488B2Shielded probe for high-frequency testing of a device under testCASCADE MICROTECH INC·Filed 2006·Granted Dec 4, 2007·19 cites·1 claims
- 1394US4853627AWafer probesTRIQUINT SEMICONDUCTOR INC·Filed 1988·Granted Aug 1, 1989·125 cites·20 claims
- 1493US7759953B2Active wafer probeCASCADE MICROTECH INC·Filed 2008·Granted Jul 20, 2010·16 cites·5 claims
- 1593US7321233B2System for evaluating probing networksCASCADE MICROTECH INC·Filed 2007·Granted Jan 22, 2008·14 cites·17 claims
- 1693US5973505ASystem for evaluating probing networksCASCADE MICROTECH INC·Filed 1998·Granted Oct 26, 1999·61 cites·15 claims
- 1793US5659255AMethod of evaluating signal conditions in a probe measurement network having a plurality of separate measurement channelsCASCADE MICROTECH INC·Filed 1996·Granted Aug 19, 1997·64 cites·10 claims
- 1893US4827211AWafer probeCASCADE MICROTECH INC·Filed 1987·Granted May 2, 1989·144 cites·15 claims
- 1992US6130544ASystem for evaluating probing networksCASCADE MICROTECH INC·Filed 1999·Granted Oct 10, 2000·54 cites·13 claims
- 2091US7427868B2Active wafer probeCASCADE MICROTECH INC·Filed 2004·Granted Sep 23, 2008·41 cites·5 claims
- 2190US7482823B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Jan 27, 2009·11 cites·33 claims
- 2289US7443186B2On-wafer test structures for differential signalsCASCADE MICROTECH INC·Filed 2007·Granted Oct 28, 2008·15 cites·18 claims
- 2388US7436194B2Shielded probe with low contact resistance for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Oct 14, 2008·10 cites·20 claims
- 2488US5047725AVerification and correction method for an error model for a measurement networkCASCADE MICROTECH INC·Filed 1989·Granted Sep 10, 1991·53 cites·18 claims
- 2587US7518387B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Apr 14, 2009·9 cites·55 claims
- 2686US8823406B2Systems and methods for simultaneous optical testing of a plurality of devices under testBOLT BRYAN·Filed 2011·Granted Sep 2, 2014·10 cites·27 claims
- 2786US7489149B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Feb 10, 2009·8 cites·17 claims
- 2884US7723999B2Calibration structures for differential signal probingCASCADE MICROTECH INC·Filed 2007·Granted May 25, 2010·13 cites·2 claims
- 2984US7609077B2Differential signal probe with integral balunCASCADE MICROTECH INC·Filed 2007·Granted Oct 27, 2009·13 cites·22 claims
- 3082US9874585B2Resilient electrical interposers, systems that include the interposers, and methods for using and forming the sameCASCADE MICROTECH INC·Filed 2015·Granted Jan 23, 2018·2 cites·11 claims
- 3181US9099449B2Resilient electrical interposers, systems that include the interposers, and methods for using and forming the sameCASCADE MICROTECH INC·Filed 2015·Granted Aug 4, 2015·2 cites·23 claims
- 3280US7164279B2System for evaluating probing networksCASCADE MICROTECH INC·Filed 2005·Granted Jan 16, 2007·5 cites·13 claims
- 3371US9372214B2High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the sameSTRID ERIC W·Filed 2012·Granted Jun 21, 2016·4 cites·35 claims
- 3466US4998071ANoise parameter test method and apparatusCASCADE MICROTECH INC·Filed 1988·Granted Mar 5, 1991·22 cites·10 claims
- 3560US6987398B2System for evaluating probing networksCASCADE MICROTECH INC·Filed 2004·Granted Jan 17, 2006·4 cites·11 claims
- 3656US6803779B2Interconnect assembly for use in evaluating probing networksCASCADE MICROTECH INC·Filed 2003·Granted Oct 12, 2004·3 cites·9 claims
- 3753US4891612AOverlap interfaces between coplanar transmission lines which are tolerant to transverse and longitudinal misalignmentCASCADE MICROTECH INC·Filed 1988·Granted Jan 2, 1990·11 cites·10 claims
- 3849US2010253377A1Active wafer probeCASCADE MICROTECH INC·Filed 2010·Application pending·0 cites
- 3948US8970240B2Resilient electrical interposers, systems that include the interposers, and methods for using and forming the sameSMITH KENNETH R·Filed 2011·Granted Mar 3, 2015·0 cites·18 claims
- 4048US2010264948A1Differential signal probing systemCASCADE MICROTECH INC·Filed 2010·Application pending·0 cites
- 4146US2009021273A1On-wafer test structuresCASCADE MICROTECH INC·Filed 2008·Application pending·0 cites
- 4240US5068615ANoise parameter test apparatusCASCADE MICROTECH INC·Filed 1990·Granted Nov 26, 1991·9 cites·10 claims
- 4337US2013183898A1Systems and methods for non-contact power and data transfer in electronic devicesSTRID ERIC W·Filed 2011·Application pending·0 cites
- 4437US2013015871A1Systems, devices, and methods for two-sided testing of electronic devicesCASCADE MICROTECH INC·Filed 2012·Application pending·0 cites
- 4536US2010001742A1Calibration techniqueSTRID ERIC W·Filed 2009·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →