Inventor · disambiguated record
Norman K. James
Also filed as: JAMES NORMAN K · JAMES NORMAN KARL
21 granted patents·6 pending applications·258 citations·filing 1998–2016
95Inventor score
Top patents by PatentIndex Score
27 records- 0194US9584597B2Hardware level generated interrupts indicating load balancing status for a node in a virtualized computing environmentIBM·Filed 2016·Granted Feb 28, 2017·14 cites·12 claims
- 0292US7576569B2Circuit for dynamic circuit timing synthesis and monitoring of critical paths and environmental conditions of an integrated circuitIBM·Filed 2006·Granted Aug 18, 2009·34 cites·26 claims
- 0385US7400555B2Built in self test circuit for measuring total timing uncertainty in a digital data pathIBM·Filed 2003·Granted Jul 15, 2008·24 cites·29 claims
- 0484US8122312B2Internally controlling and enhancing logic built-in self test in a multiple core microprocessorFLOYD MICHAEL S·Filed 2009·Granted Feb 21, 2012·13 cites·20 claims
- 0584US7962887B2Self-learning of the optimal power or performance operating point of a computer chip based on instantaneous feedback of present operating environmentIBM·Filed 2008·Granted Jun 14, 2011·7 cites·18 claims
- 0683US6662133B2JTAG-based software to perform cumulative array repairIBM·Filed 2001·Granted Dec 9, 2003·43 cites·25 claims
- 0780US7116142B2Apparatus and method for accurately tuning the speed of an integrated circuitIBM·Filed 2004·Granted Oct 3, 2006·22 cites·20 claims
- 0879US9627012B1Shift register with opposite shift data and shift clock directionsIBM·Filed 2016·Granted Apr 18, 2017·5 cites·14 claims
- 0979US6642811B2Built-in power supply filter for an integrated circuitIBM·Filed 2002·Granted Nov 4, 2003·24 cites·17 claims
- 1078US8635478B2Establishing an operating range for dynamic frequency and voltage scalingCHASE HAROLD W·Filed 2011·Granted Jan 21, 2014·7 cites·20 claims
- 1174US6222402B1Differential charge-pump with improved linearityIBM·Filed 1998·Granted Apr 24, 2001·38 cites·15 claims
- 1270US8812879B2Processor voltage regulationWEN HUAJUN·Filed 2009·Granted Aug 19, 2014·9 cites·11 claims
- 1369US9294557B2Hardware level generated interrupts indicating load balancing status for a node in a virtualized computing environmentIBM·Filed 2013·Granted Mar 22, 2016·2 cites·6 claims
- 1462US8140902B2Internally controlling and enhancing advanced test and characterization in a multiple core microprocessorFLOYD MICHAEL S·Filed 2008·Granted Mar 20, 2012·2 cites·20 claims
- 1561US8055477B2Identifying deterministic performance boost capability of a computer systemIBM·Filed 2008·Granted Nov 8, 2011·2 cites·21 claims
- 1651US6978408B1Generating array bit-fail maps without a tester using on-chip trace arraysIBM·Filed 2004·Granted Dec 20, 2005·6 cites·21 claims
- 1748US7996703B2Method and apparatus to avoid power transients during a microprocessor testIBM·Filed 2008·Granted Aug 9, 2011·0 cites·14 claims
- 1846US7385437B2Digitally tunable high-current current reference with high PSRRIBM·Filed 2005·Granted Jun 10, 2008·1 cites·10 claims
- 1946US2008198699A1Method for built in self test for measuring total timing uncertainty in a digital data pathIBM·Filed 2008·Application pending·0 cites
- 2046US2008198700A1Duty cycle measurment circuit for measuring and maintaining balanced clock duty cycleIBM·Filed 2008·Application pending·0 cites
- 2144US2010094572A1Dynamic Frequency And Voltage Scaling For A Computer ProcessorIBM·Filed 2008·Application pending·0 cites
- 2238US2008092005A1Scan Testing InterfaceHUOTT WILLIAM V·Filed 2006·Application pending·0 cites
- 2337US7235994B2Defect monitor for semiconductor manufacturing capable of performing analog resistance measurementsIBM·Filed 2004·Granted Jun 26, 2007·1 cites·5 claims
- 2437US2006195737A1System and method for characterization of certain operating characteristics of devicesIBM·Filed 2005·Application pending·0 cites
- 2536US7514947B2Method of and system for functionally testing multiple devices in parallel in a burn-in-environmentIBM·Filed 2007·Granted Apr 7, 2009·0 cites·19 claims
- 2633US2006181325A1System and method for providing on-chip clock generation verification using an external clockIBM·Filed 2005·Application pending·0 cites
- 2732US6134284ACircuit and method for receiving system clock signalsIBM·Filed 1998·Granted Oct 17, 2000·4 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →