Inventor · disambiguated record
Mike Adel
Also filed as: ADEL MIKE
13 granted patents·8 pending applications·382 citations·filing 1999–2017
93Inventor score
Files withKLA TENCOR CORP8ABDULHALIM IBRAHIM6IZIKSON PAVEL2APPLIED SPECTRAL IMAGING LTD1KLA TENCOR TECH CORP1
Top patents by PatentIndex Score
21 records- 0197US9476698B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2015·Granted Oct 25, 2016·22 cites·13 claims
- 0297US7656528B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2007·Granted Feb 2, 2010·60 cites·21 claims
- 0394US8175831B2Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafersIZIKSON PAVEL·Filed 2008·Granted May 8, 2012·42 cites·30 claims
- 0493US8525994B2Periodic patterns and technique to control misaligment between two layersABDULHALIM IBRAHIM·Filed 2009·Granted Sep 3, 2013·12 cites·8 claims
- 0587US8570515B2Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2009·Granted Oct 29, 2013·5 cites·61 claims
- 0686US7925486B2Computer-implemented methods, carrier media, and systems for creating a metrology target structure design for a reticle layoutKLA TENCOR TECH CORP·Filed 2007·Granted Apr 12, 2011·16 cites·18 claims
- 0780US10649447B2Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafersKLA TENCOR CORP·Filed 2017·Granted May 12, 2020·2 cites·19 claims
- 0876US6276798B1Spectral bio-imaging of the eyeAPPLIED SPECTRAL IMAGING LTD·Filed 1999·Granted Aug 21, 2001·222 cites·56 claims
- 0969US10151584B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2017·Granted Dec 11, 2018·0 cites·9 claims
- 1065US9835447B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2016·Granted Dec 5, 2017·0 cites·10 claims
- 1165US9651943B2Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafersIZIKSON PAVEL·Filed 2012·Granted May 16, 2017·1 cites·16 claims
- 1263US9234745B2Periodic patterns and techniques to control misalignment between two layersKLA TENCOR CORP·Filed 2015·Granted Jan 12, 2016·0 cites·12 claims
- 1363US9103662B2Periodic patterns and technique to control misalignment between two layersKLA TENCOR CORP·Filed 2013·Granted Aug 11, 2015·0 cites·3 claims
- 1456US2006262326A1Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2006·Application pending·0 cites
- 1555US2006065625A1Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2005·Application pending·0 cites
- 1655US2006132807A1Periodic patterns and technique to control misalignment between two layersABDULHALIM IBRAHIM·Filed 2006·Application pending·0 cites
- 1754US2005208685A1Periodic patterns and technique to control misalignmentABDULHALIM IBRAHIM·Filed 2005·Application pending·0 cites
- 1854US2005157297A1Periodic patterns and technique to control misalignment between two layersFiled 2005·Application pending·0 cites
- 1945US2004061857A1Periodic patterns and technique to control misalignment between two layersFiled 2003·Application pending·0 cites
- 2045US2004229471A1Periodic patterns and technique to control misalignment between two layersFiled 2003·Application pending·0 cites
- 2142US2003002043A1Periodic patterns and technique to control misalignmentKLA TENCOR CORP·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →