Inventor · disambiguated record
Katsuhiko Ichinose
Also filed as: ICHINOSE KATSUHIKO
17 granted patents·7 pending applications·402 citations·filing 2001–2020
94Inventor score
Files withRENESAS TECH CORP11RENESAS ELECTRONICS CORP4FUJIWARA TSUYOSHI2HAYAKAWA KOICHI1HITACHI LTD1
Top patents by PatentIndex Score
24 records- 0197US7115954B2Semiconductor device including stress inducing films formed over n-channel and p-channel field effect transistors and a method of manufacturing the sameRENESAS TECH CORP·Filed 2001·Granted Oct 3, 2006·118 cites·27 claims
- 0295US6982465B2Semiconductor device with CMOS-field-effect transistors having improved drain current characteristicsRENESAS TECH CORP·Filed 2001·Granted Jan 3, 2006·121 cites·16 claims
- 0392US6613634B2Method of manufacturing a semiconductor device using oblique ion injectionHITACHI LTD·Filed 2001·Granted Sep 2, 2003·68 cites·21 claims
- 0491US7411253B2CMOS transistors using gate electrodes to increase channel mobilities by inducing localized channel stressRENESAS TECH CORP·Filed 2006·Granted Aug 12, 2008·11 cites·21 claims
- 0588US8595666B2Semiconductor defect classifying method, semiconductor defect classifying apparatus, and semiconductor defect classifying programHAYAKAWA KOICHI·Filed 2010·Granted Nov 26, 2013·10 cites·24 claims
- 0685US7414293B2Structure and method of applying localized stresses to the channels of PFET and NFET transistors for improved performanceRENESAS TECH CORP·Filed 2006·Granted Aug 19, 2008·6 cites·6 claims
- 0781US8963250B2Semiconductor device including a film for applying stress to a channel formation region to increase current flowSHIMIZU AKIHIRO·Filed 2008·Granted Feb 24, 2015·4 cites·19 claims
- 0877US8995748B2Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying methodSAKAI TSUNEHIRO·Filed 2010·Granted Mar 31, 2015·7 cites·13 claims
- 0976US7163886B2Semiconductor integrated circuit device and process for manufacturing the sameRENESAS TECH CORP·Filed 2004·Granted Jan 16, 2007·15 cites·17 claims
- 1075US7705402B2Semiconductor device including a nitride containing film to generate stress for improving current driving capacity of a field effect transistorRENESAS TECH CORP·Filed 2008·Granted Apr 27, 2010·2 cites·12 claims
- 1173US2020185523A1Semiconductor device and a method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2020·Application pending·0 cites
- 1267US6847093B2Semiconductor integrated circuit deviceRENESAS TEHNOLOGY CORP·Filed 2003·Granted Jan 25, 2005·17 cites·14 claims
- 1366US6806128B2Semiconductor integrated circuit device and a method of manufacturing the sameRENESAS TECH CORP·Filed 2001·Granted Oct 19, 2004·12 cites·35 claims
- 1464US2018269323A1Semiconductor device and a method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2018·Application pending·0 cites
- 1562US9978869B2P-channel transistor having an increased channel mobility due to a compressive stress-inducing gate electrodeRENESAS ELECTRONICS CORP·Filed 2016·Granted May 22, 2018·0 cites·6 claims
- 1660US9412669B2Semiconductor device and a method of manufacturing the sameRENESAS ELECTRONICS CORP·Filed 2015·Granted Aug 9, 2016·0 cites·13 claims
- 1756US6905982B2Method of manufacturing a semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2002·Granted Jun 14, 2005·6 cites·20 claims
- 1854US2008157219A1Semiconductor integrated circuit device and process for manufacturing the sameFUJIWARA TSUYOSHI·Filed 2008·Application pending·0 cites
- 1951US2007018327A1Semiconductor integrated circuit device and process for manufacturing the sameFUJIWARA TSUYOSHI·Filed 2006·Application pending·0 cites
- 2050US6706582B2Semiconductor integrated circuit device and method of manufacturing the sameRENESAS TECH CORP·Filed 2002·Granted Mar 16, 2004·5 cites·11 claims
- 2143US2005218435A1Semiconductor integrated circuit device and production method thereofRENESAS TECH CORP·Filed 2005·Application pending·0 cites
- 2238US2005269640A1Semiconductor device and manufacturing method thereofSHIMAMOTO SATOSHI·Filed 2005·Application pending·0 cites
- 2336US2014146172A1Distributed image processing systemKAJITANI KOICHIRO·Filed 2012·Application pending·0 cites
- 2435US6933564B2Semiconductor integrated circuit device and method of manufacturing the sameRENESAS TECH CORP·Filed 2003·Granted Aug 23, 2005·0 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →