Inventor · disambiguated record
John T. Strom
Also filed as: STROM JOHN · STROM JOHN T · STROM JOHN TIMOTHY
18 granted patents·3 pending applications·189 citations·filing 1999–2013
94Inventor score
Files withRUDOLPH TECHNOLOGIES INC8APPLIED PRECISION LLC5STROM JOHN T3APPLIED PRECISION INC1DOE RODNEY BRYAN1
Top patents by PatentIndex Score
21 records- 0191US7634128B2Stereoscopic three-dimensional metrology system and methodRUDOLPH TECHNOLOGIES INC·Filed 2007·Granted Dec 15, 2009·27 cites·33 claims
- 0286US7385409B2System and method of mitigating effects of component deflection in a probe card analyzerRUDOLPH TECHNOLOGIES INC·Filed 2006·Granted Jun 10, 2008·7 cites·7 claims
- 0386US7231081B2Stereoscopic three-dimensional metrology system and methodAPPLIED PRECISION LLC·Filed 2002·Granted Jun 12, 2007·36 cites·35 claims
- 0485US7960981B2Apparatus for obtaining planarity measurements with respect to a probe card analysis systemRUDOLPH TECHNOLOGIES INC·Filed 2009·Granted Jun 14, 2011·8 cites·14 claims
- 0584US7579853B2Apparatus for obtaining planarity measurements with respect to a probe card analysis systemRUDOLPH TECHNOLOGIES INC·Filed 2008·Granted Aug 25, 2009·6 cites·5 claims
- 0680US7170307B2System and method of mitigating effects of component deflection in a probe card analyzerAPPLIED PRECISION LLC·Filed 2004·Granted Jan 30, 2007·18 cites·7 claims
- 0777US8198906B2Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufactureSTROM JOHN T·Filed 2010·Granted Jun 12, 2012·3 cites·24 claims
- 0874US7750622B2Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis and manufactureRUDOLPH TECHNOLOGIES INC·Filed 2006·Granted Jul 6, 2010·5 cites·28 claims
- 0972US7634129B2Dual-axis scanning system and methodRUDOLPH TECHNOLOGIES INC·Filed 2002·Granted Dec 15, 2009·18 cites·23 claims
- 1065US6621262B2Method for optimizing probe card analysis and scrub mark analysis dataAPPLIED PRECISION LLC·Filed 2002·Granted Sep 16, 2003·11 cites·14 claims
- 1165US6414477B1Method for optimizing probe card analysis and scrub mark analysis dataAPPLIED PRECISION INC·Filed 1999·Granted Jul 2, 2002·25 cites·6 claims
- 1261US8358831B2Probe mark inspectionRUDOLPH TECHNOLOGIES INC·Filed 2009·Granted Jan 22, 2013·3 cites·17 claims
- 1360US7102368B2Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufactureAPPLIED PRECISION LLC·Filed 2004·Granted Sep 5, 2006·6 cites·1 claims
- 1456US7062091B2Coordinate calibration for scanning systemsAPPLIED PRECISION LLC·Filed 2002·Granted Jun 13, 2006·14 cites·20 claims
- 1549US2012150475A1Apparatus for obtaining planarity measurements with respect to a probe card analysis systemSTROM JOHN T·Filed 2011·Application pending·0 cites
- 1646US9638782B2Probe card analysis system and methodRUDOLPH TECH INC·Filed 2013·Granted May 2, 2017·0 cites·12 claims
- 1743US8089292B2System and method of measuring probe floatSTROM JOHN T·Filed 2009·Granted Jan 3, 2012·0 cites·20 claims
- 1843US7633306B2System and method of measuring probe floatRUDOLPH TECHNOLOGIES INC·Filed 2004·Granted Dec 15, 2009·2 cites·24 claims
- 1937US2002097062A1Method and process of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing analysis, and manufactureFiled 2001·Application pending·0 cites
- 2035US8466703B2Probe card analysis system and methodENDRES ERIC·Filed 2010·Granted Jun 18, 2013·0 cites·11 claims
- 2129US2012189189A1Optical inspection optimizationDOE RODNEY BRYAN·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →