Inventor · disambiguated record
David Aitan Soltz
Also filed as: SOLTZ DAVID · SOLTZ DAVID A · SOLTZ DAVID AITAN
17 granted patents·5 pending applications·156 citations·filing 2003–2025
92Inventor score
Top patents by PatentIndex Score
22 records- 0195US7304302B1Systems configured to reduce distortion of a resist during a metrology process and systems and methods for reducing alteration of a specimen during analysisKLA TENCOR TECH CORP·Filed 2005·Granted Dec 4, 2007·55 cites·46 claims
- 0292US7148073B1Methods and systems for preparing a copper containing substrate for analysisKLA TENCOR TECH CORP·Filed 2005·Granted Dec 12, 2006·24 cites·29 claims
- 0391US7394067B1Systems and methods for reducing alteration of a specimen during analysis for charged particle based and other measurement systemsKLA TENCOR TECH CORP·Filed 2005·Granted Jul 1, 2008·34 cites·31 claims
- 0486US7649365B1Inline inspection of photovoltaics for electrical defectsKLA TENCOR CORP·Filed 2007·Granted Jan 19, 2010·11 cites·1 claims
- 0583US8318240B2Method and apparatus to remove a segment of a thin film solar cell structure for efficiency improvementZAPALAC GEORDIE·Filed 2010·Granted Nov 27, 2012·6 cites·33 claims
- 0680US10230329B2Photonic degradation monitoring for semiconductor devicesSUNPOWER CORP·Filed 2017·Granted Mar 12, 2019·1 cites·20 claims
- 0776US7560703B1Integrated segmented scintillation detectorKLA TENCOR CORP·Filed 2007·Granted Jul 14, 2009·5 cites·23 claims
- 0875US6759654B1High contrast inspection and review of magnetic media and headsKLA TENCOR TECH CORP·Filed 2003·Granted Jul 6, 2004·10 cites·22 claims
- 0969US7115866B1Site stepping for electron beam micro analysisKLA TENCOR TECHNOLOGIES INC·Filed 2005·Granted Oct 3, 2006·4 cites·20 claims
- 1067US10804843B2Photonic degradation monitoring for semiconductor devicesSUNPOWER CORP·Filed 2019·Granted Oct 13, 2020·0 cites·20 claims
- 1167US7906972B2Inline inspection of photovoltaics for electrical defectsKLA TENCOR CORP·Filed 2009·Granted Mar 15, 2011·2 cites·12 claims
- 1262US6936816B2High contrast inspection and review of magnetic media and headsKLA TENCOR TECH CORP·Filed 2004·Granted Aug 30, 2005·4 cites·17 claims
- 1362US2024240304A1Metal oxy-fluoride coating for chamber components and method of coating thereofAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1456US2025357073A1Electrically conductive ceramic electric field blocking plateAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1555US9564854B2Photonic degradation monitoring for semiconductor devicesTU XIUWEN·Filed 2015·Granted Feb 7, 2017·0 cites·20 claims
- 1654US8318239B2Method and apparatus for detecting and passivating defects in thin film solar cellsBASOL BULENT M·Filed 2008·Granted Nov 27, 2012·0 cites·23 claims
- 1754US2025379067A1Sealing structures for processing chambersAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1853US2015318822A1Reducing unequal biasing in solar cell testingTU XIUWEN·Filed 2014·Application pending·0 cites
- 1950US10476432B2High throughput system for photovoltaic UV degradation testingSUNPOWER CORP·Filed 2016·Granted Nov 12, 2019·0 cites·20 claims
- 2050US8427185B2Inline inspection of photovoltaics for electrical defectsZAPALAC JR GEORGE H·Filed 2011·Granted Apr 23, 2013·0 cites·1 claims
- 2149US7049590B1Capping layer to impede atom ejectionKLA TENCOR TECH CORP·Filed 2004·Granted May 23, 2006·0 cites·20 claims
- 2235US2017278990A1Approaches for solar cell marking and trackingSOLTZ DAVID AITAN·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →