Inventor · disambiguated record
Mihoko Akiyama
Also filed as: AKIYAMA MIHOKO
30 granted patents·3 pending applications·394 citations·filing 1992–2016
97Inventor score
Files withMITSUBISHI ELECTRIC CORP9RENESAS ELECTRONICS CORP8RENESAS TECH CORP7RICOH KK3WATANABE NAOYA3
Top patents by PatentIndex Score
33 records- 0194US8164934B2Content addressable memoryWATANABE NAOYA·Filed 2010·Granted Apr 24, 2012·18 cites·4 claims
- 0289US6768354B2Multi-power semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2001·Granted Jul 27, 2004·38 cites·24 claims
- 0389US6700434B2Substrate bias voltage generating circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Mar 2, 2004·39 cites·15 claims
- 0487US9159376B2Content addressable memory deviceRENESAS ELECTRONICS CORP·Filed 2014·Granted Oct 13, 2015·8 cites·10 claims
- 0587US6414881B1Semiconductor device capable of generating internal voltage effectivelyMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 2, 2002·45 cites·20 claims
- 0684US6472926B2Internal voltage generation circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Oct 29, 2002·49 cites·18 claims
- 0782US8310852B2Content addressable memoryWATANABE NAOYA·Filed 2012·Granted Nov 13, 2012·5 cites·1 claims
- 0879US6515461B2Voltage downconverter circuit capable of reducing current consumption while keeping response rateMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Feb 4, 2003·27 cites·34 claims
- 0978US9620214B2Content addressable memory with reduced power consumption and increased search operation speedRENESAS ELECTRONICS CORP·Filed 2015·Granted Apr 11, 2017·3 cites·2 claims
- 1078US8599639B2Semiconductor device including internal voltage generation circuitRENESAS ELECTRONICS CORP·Filed 2013·Granted Dec 3, 2013·4 cites·5 claims
- 1175US8004923B2Semiconductor device including internal voltage generation circuitRENESAS ELECTRONICS CORP·Filed 2010·Granted Aug 23, 2011·3 cites·2 claims
- 1274US8638599B2Semiconductor storage deviceRENESAS ELECTRONICS CORP·Filed 2012·Granted Jan 28, 2014·5 cites·12 claims
- 1374US5428372AMultiple-use thermal image transfer recording methodRICOH KK·Filed 1992·Granted Jun 27, 1995·20 cites·9 claims
- 1472US7408818B2Semiconductor device undergoing defect detection testRENESAS TECH CORP·Filed 2007·Granted Aug 5, 2008·7 cites·10 claims
- 1572US6429729B2Semiconductor integrated circuit device having circuit generating reference voltageMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Aug 6, 2002·20 cites·4 claims
- 1671US6781431B2Clock generating circuitRENESAS TECH CORP·Filed 2003·Granted Aug 24, 2004·21 cites·8 claims
- 1769US6614270B2Potential detecting circuit having wide operating margin and semiconductor device including the sameMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Sep 2, 2003·18 cites·18 claims
- 1868US6424134B2Semiconductor integrated circuit device capable of stably generating internal voltage independent of an external power supply voltageMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 23, 2002·17 cites·20 claims
- 1964US10121541B2Semiconductor device and information processing systemRENESAS ELECTRONICS CORP·Filed 2016·Granted Nov 6, 2018·2 cites·16 claims
- 2062US7656736B2Semiconductor device including internal voltage generation circuitRENESAS TECH CORP·Filed 2007·Granted Feb 2, 2010·3 cites·3 claims
- 2160US8638583B2Content addressable memoryWATANABE NAOYA·Filed 2012·Granted Jan 28, 2014·1 cites·1 claims
- 2260US7023754B2Semiconductor device having standby mode and active modeMITSUBISHI ELECTRIC ENG·Filed 2002·Granted Apr 4, 2006·9 cites·10 claims
- 2355US8451678B2Semiconductor device including internal voltage generation circuitAKIYAMA MIHOKO·Filed 2011·Granted May 28, 2013·1 cites·2 claims
- 2453US8400803B2Content addressable memory deviceAKIYAMA MIHOKO·Filed 2011·Granted Mar 19, 2013·1 cites·35 claims
- 2550US9042148B2Content addressable memoryRENESAS ELECTRONICS CORP·Filed 2014·Granted May 26, 2015·0 cites·1 claims
- 2647US8780599B2Content addressable memory deviceRENESAS ELECTRONICS CORP·Filed 2013·Granted Jul 15, 2014·0 cites·4 claims
- 2747US5336548AMultiple-use thermal image transfer recording mediumRICOH KK·Filed 1992·Granted Aug 9, 1994·12 cites·13 claims
- 2846US6777707B2Semiconductor integrated circuit with voltage down converter adaptable for burn-in testingRENESAS TECH CORP·Filed 2002·Granted Aug 17, 2004·5 cites·10 claims
- 2946US5324585AImage receiving sheet for use in thermal image transfer recording systemRICOH KK·Filed 1992·Granted Jun 28, 1994·10 cites·13 claims
- 3043US2007247885A1Content addressable memoryRENESAS TECH CORP·Filed 2007·Application pending·0 cites
- 3141US6424579B1Semiconductor memory device with internal power supply potential generation circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Jul 23, 2002·3 cites·11 claims
- 3240US2008298156A1Semiconductor device undergoing defect detection testRENESAS TECH CORP·Filed 2008·Application pending·0 cites
- 3335US2002033725A1Clock generating circuitMITSUBISHI ELECTRIC CORP·Filed 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →