Wavemeter for gas discharge laser

Abstract

An optical configuration to illuminate an etalon in a laser wavemeter with a minimum level of light intensity. The system includes optical components to direct a portion of the laser output beam representing the entire cross section of the beam, through an etalon positioned in an etalon housing and onto a photodetector. A first lens condenses the size of the beam sample, and a second lens re-collimates the beam which then passes into the etalon housing, ensuring that all of the spatial components of the beam are adequately sampled. A diffractive diffusing element is incorporated into the optical path. In a preferred embodiment, the diffractive diffusing element is placed within the etalon housing between said plano-concave lens and the etalon. In another preferred embodiment, the diffusing element is located up stream but outside the housing in the optical path.

1. A wavemeter for measuring wave properties of a laser beam of a gas discharge laser, said wavemeter comprising:
 A) a first optical train, comprising at least two optical elements, for converting a portion of said laser beam into a substantially collimated sample beam spatially representative of the laser beam;  
 B) a diffractive diffusing element configured to diffuse said sample beam into a diffused beam which is expanding at angles of less than 10 degrees;  
 C) an etalon system positioned in said diffused beam, said etalon system comprising: 
 1) an etalon housing, and  
 2) two windows permitting light to enter said housing, and 
 32) an etalon positioned within said housing;  
 
 D) a detector array; and  
 E) a second optical train, comprising at least one focusing optical element, for focusing a beam exiting said etalon system onto said detector array;  
 
       wherein said etalon produces interference fringe patterns on said detector array, said fringe patterns being indicative of wavelength and bandwidth of said laser beam of said gas discharge laser. 
     
     
       2. A wavemeter as in  claim 1  wherein said diffractive diffusing element is a diffractive lens array. 
     
     
       3. A wavemeter as in  claim 2  wherein said diffractive lens array is configured to scatter light within an angle of about 5 degrees. 
     
     
       4. A wavemeter as in  claim 3  wherein said lens is configured to scatter light within an angle of about 2 degrees in a first dimension and about 4 degrees in a second dimension. 
     
     
       5. A wavemeter as in  claim 1  wherein said first optical train comprises condensing lens and a recollimating lens for cross section reduction of the sample beam. 
     
     
       6. A wavemeter as in  claim 1  wherein said etalon comprises an upper plate and a lower plate and three fused silica spacers separating said upper and plate. 
     
     
       7. A wavemeter as in  claim 6  wherein said spacers are about 934 micrometer±1 micrometers thick. 
     
     
       8. A wavemeter as in  claim 6  wherein said upper plate comprises a support flange for supporting said upper and lower plates. 
     
     
       9. A wavemeter as in  claim 8  wherein said upper and lower plates and said spaces are held together by optical contact. 
     
     
       10. A wavemeter as in  claim 1  wherein said diffractive diffusing element is configured to diffuse said sample beam into a beam substantially all of which is diverging at angles of less than 2 degrees in a first direction and diverging at angles of less than 4 degrees in a second direction perpendicular to said first direction. 
     
     
       11. A wavemeter as in  claim 1  wherein said at least two optical elements in said first beam train are two lenses.