US2019324374A1PendingUtilityA1
Lithographic apparatus and device manufacturing method
Est. expiryNov 14, 2023(expired)· nominal 20-yr term from priority
Inventors:Bob StreefkerkJohannes Jacobus Matheus BaselmansRichard Joseph BrulsMarcel Mathijs Theodore Marie DierichsSjoerd Nicolaas Lambertus DondersChristiaan Alexander HoogendamHans JansenErik Roelof LoopstraJeroen Johannes Sophia Maria MertensJohannes Catharinus Hubertus MulkensRonald Walther Jeanne SeverijnsSergei ShulepovHerman BoomTimotheus Franciscus Sengers
G03F 7/70958G03F 7/2041G03F 7/70341G03F 7/70908
71
PatentIndex Score
0
Cited by
0
References
0
Claims
Abstract
An immersion lithographic projection apparatus is disclosed in which liquid is provided between a projection system of the apparatus and a substrate. The use of both liquidphobic and liquidphilic layers on various elements of the apparatus is provided to help prevent formation of bubbles in the liquid and to help reduce residue on the elements after being in contact with the liquid.
Claims
exact text as granted — not AI-modified1 . A lithographic apparatus, comprising:
a substrate table constructed to hold a substrate; a projection system configured to project a patterned radiation beam onto a target portion of the substrate; and a liquid supply system configured to at least partly fill a space between the projection system and the substrate with a liquid, wherein the liquid has a contact angle of (a) less than 60° with the projection system, or the liquid supply system, or both, or (b) less than 80° with a surface of the substrate, or (c) both (a) and (b).
2 . The apparatus according to claim 1 , wherein the liquid includes an additive configured to reduce surface tension of the liquid.
3 . The apparatus according to claim 2 , wherein the additive is a surfactant, or a soap, or a salt, or any combination of the foregoing.
4 . The apparatus according to claim 1 , wherein surface tension between the liquid and (i) the substrate, or (ii) the projection system, or (iii) the liquid supply system, or (iv) any combination of (i)-(iii), is greater than between the liquid and air.
5 . The apparatus according to claim 1 , wherein the liquid has a contact angle of less than 60° with a surface of the projection system and the liquid supply system and a contact angle of greater than 90° with a (i) surface of the substrate, or (ii) the substrate table, or (iii) a substrate table mounted sensor, or (iv) any combination of (i)-(iii).
6 . The apparatus according to claim 1 , wherein the surface with which the liquid has a contact angle of less than 60° comprises a glass, a glass ceramic, a metal oxide or a metal.
7 . The apparatus according to claim 6 , wherein the surface has been surface treated.
8 . The apparatus according to claim 6 , wherein the surface has a coating or a polymer.
9 . The apparatus according to claim 1 , wherein an inlet and outlet of the liquid supply system, or a part of the projection system not being a final element of the projection system, or both, have a surface with which the liquid has a contact angle of greater than 90°.
10 . The apparatus according to claim 9 , wherein the surface with which the liquid has a contact angle of greater than 90° is a surface with which the liquid has a contact angle of greater than 100°, 110° or 120°.
11 . A lithographic apparatus, comprising:
a substrate table constructed to hold a substrate; a projection system configured to project a patterned radiation beam onto a target portion of the substrate; and a liquid supply system configured to at least partly fill a space between the projection system and (a) the substrate, or (b) a sensor, or (c) a shutter member, or (d) any combination of (a)-(c), with a liquid, wherein the liquid has a contact angle of greater than 90° with a surface of (e) the substrate, or (f) the sensor, or (g) the shutter member, or (h) the projection system, or (i) any combination of (e)-(h), which surface is (j) alignable with an optical axis of the apparatus, or (k) a surface of the projection system, or (l) substantially all of a top surface of the substrate table, or (m) any combination of (j)-(l).
12 . The apparatus according to claim 11 , wherein the liquid has a contact angle of greater than 90° with surfaces of both the substrate and the projection system.
13 . The apparatus according to claim 12 , wherein the liquid supply system comprises a plurality of gas inlets configured to confine the liquid to a localized area of the substrate and the plurality of gas inlets are positioned around the optical axis of the apparatus and are configured to direct gas in a direction with at least a component towards the optical axis.
14 . The apparatus according to claim 12 , wherein the liquid supply system comprises a plurality of gas inlets configured to confine the liquid to a localized area of the substrate and the plurality of gas inlets are not oriented directly towards the optical axis of the apparatus so as to create a flow of gas in a circular pattern around the optical axis.
15 . The apparatus according to claim 11 , wherein the liquid has a contact angle of greater than 90° with the surface of (i) the substrate, or (ii) the substrate table, or (iii) the sensor, or (iv) the shutter member, or (v) any combination of (i)-(iv), and the liquid has a contact angle of less than 60° with a surface of the projection system, or the liquid supply system, or both.
16 . The apparatus according to claim 11 , wherein the surface with which the liquid has a contact angle of greater than 90° comprises elevations and depressions, wherein the distance between elevations ranges from 5 to 200 μm and the height of the elevations from 5 to 100 μm and wherein at least the elevations are made of a liquidphobic polymer or a material made durably liquidphobic.
17 . The apparatus according to claim 11 , wherein the surface with which the liquid has a contact angle of greater than 90° is a polymer.
18 . The apparatus according to claim 11 , wherein an inlet and outlet of the liquid supply system, a part of the projection system not being a final element of the projection system, or both, has a surface with which the liquid has a contact angle of greater than 90°.
19 . The apparatus according to claim 11 , wherein the surface with which the liquid has a contact angle of greater than 90° is a surface with which the liquid has a contact angle of greater than 100°, 110° or 120°.
20 . A device manufacturing method, comprising projecting a patterned beam of radiation through a liquid onto a target portion of a substrate, a surface of the substrate comprising a topcoat insoluble in the liquid and having a contact angle with the liquid of less than 80°.Join the waitlist — get patent alerts
Track US2019324374A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.