US2010283028A1PendingUtilityA1

Non-volatile resistance switching memories and methods of making same

Assignee: SYMETRIX CORPPriority: Nov 8, 2006Filed: Jul 21, 2010Published: Nov 11, 2010
Est. expiryNov 8, 2026(~0.3 yrs left)· nominal 20-yr term from priority
H10D 48/366G11C 13/003G11C 2213/75G11C 2213/53G11C 2213/32G11C 11/24G11C 2213/72B82Y 10/00G11C 2213/79G11C 13/0007H10N 70/20H10N 70/823H10B 63/20H10N 70/826H10B 63/30H10N 70/8833
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Claims

Abstract

An integrated circuit memory cell including: a semiconductor having a first active area, a second active area, and a channel between the active areas; and a layer of a variable resistance material (VRM) directly above the channel. In one embodiment, there is a first conductive layer between the VRM and the channel and a second conductive layer directly above the VRM layer. The VRM preferably is a correlated electron material (CEM). The memory cell comprises a FET, such as a JFET or a MESFET. In another embodiment, there is a layer of an insulating material between the VRM and the channel. In this case, the memory cell may include a MOSFET structure.

Claims

exact text as granted — not AI-modified
1 . An integrated circuit memory having a memory cell including:
 a semiconductor having a first active area, a second active area, and a channel between said active areas; and   a layer of a variable resistance material (VRM) directly above said channel.   
     
     
         2 . An integrated circuit memory as in  claim 1  wherein said variable resistance material comprises a correlated electron material (CEM). 
     
     
         3 . An integrated circuit memory as in  claim 1  wherein said memory cell further includes a first conductive layer between said VRM and said channel. 
     
     
         4 . An integrated circuit as in  claim 3  wherein said memory cell includes a second conductive layer directly above said VRM layer. 
     
     
         5 . An integrated circuit as in  claim 3  wherein said first conductive layer directly contacts said channel. 
     
     
         6 . An integrated circuit as in  claim 3  wherein said first conductive layer comprises a plurality of conductive layers. 
     
     
         7 . An integrated circuit as in  claim 1  wherein said memory cell further includes a layer of an insulating material between said VRM and said channel. 
     
     
         8 . An integrated circuit as in  claim 1  wherein said memory cell comprises a field effect transistor (FET). 
     
     
         9 . An integrated circuit as in  claim 8  wherein said memory cell comprises a JFET structure. 
     
     
         10 . An integrated circuit as in  claim 8  wherein said memory cell comprises a MESFET structure. 
     
     
         11 . An integrated circuit as in  claim 8  wherein said memory cell comprises a MOSFET structure. 
     
     
         12 - 20 . (canceled) 
     
     
         21 . A method of making a non-volatile integrated circuit memory, said method comprising:
 depositing a variable resistance material (VRM) on a semiconductor directly above a channel in said semiconductor; and   completing said memory to include said VRM in an active element in said memory.   
     
     
         22 . A method as in  claim 21  wherein said depositing comprises forming a conductor/VRM/conductor stack. 
     
     
         23 . A method as in  claim 22  wherein said forming comprises forming said stack over a JFET channel. 
     
     
         24 . A method as in  claim 21  wherein said depositing comprises depositing a correlated electron material (CEM).

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