Non-volatile resistance switching memories and methods of making same
Abstract
An integrated circuit memory cell including: a semiconductor having a first active area, a second active area, and a channel between the active areas; and a layer of a variable resistance material (VRM) directly above the channel. In one embodiment, there is a first conductive layer between the VRM and the channel and a second conductive layer directly above the VRM layer. The VRM preferably is a correlated electron material (CEM). The memory cell comprises a FET, such as a JFET or a MESFET. In another embodiment, there is a layer of an insulating material between the VRM and the channel. In this case, the memory cell may include a MOSFET structure.
Claims
exact text as granted — not AI-modified1 . An integrated circuit memory having a memory cell including:
a semiconductor having a first active area, a second active area, and a channel between said active areas; and a layer of a variable resistance material (VRM) directly above said channel.
2 . An integrated circuit memory as in claim 1 wherein said variable resistance material comprises a correlated electron material (CEM).
3 . An integrated circuit memory as in claim 1 wherein said memory cell further includes a first conductive layer between said VRM and said channel.
4 . An integrated circuit as in claim 3 wherein said memory cell includes a second conductive layer directly above said VRM layer.
5 . An integrated circuit as in claim 3 wherein said first conductive layer directly contacts said channel.
6 . An integrated circuit as in claim 3 wherein said first conductive layer comprises a plurality of conductive layers.
7 . An integrated circuit as in claim 1 wherein said memory cell further includes a layer of an insulating material between said VRM and said channel.
8 . An integrated circuit as in claim 1 wherein said memory cell comprises a field effect transistor (FET).
9 . An integrated circuit as in claim 8 wherein said memory cell comprises a JFET structure.
10 . An integrated circuit as in claim 8 wherein said memory cell comprises a MESFET structure.
11 . An integrated circuit as in claim 8 wherein said memory cell comprises a MOSFET structure.
12 - 20 . (canceled)
21 . A method of making a non-volatile integrated circuit memory, said method comprising:
depositing a variable resistance material (VRM) on a semiconductor directly above a channel in said semiconductor; and completing said memory to include said VRM in an active element in said memory.
22 . A method as in claim 21 wherein said depositing comprises forming a conductor/VRM/conductor stack.
23 . A method as in claim 22 wherein said forming comprises forming said stack over a JFET channel.
24 . A method as in claim 21 wherein said depositing comprises depositing a correlated electron material (CEM).Join the waitlist — get patent alerts
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