US2008013104A1PendingUtilityA1
Pick and place machine with improved component placement inspection
Est. expiryNov 4, 2023(expired)· nominal 20-yr term from priority
Inventors:John D. Gaida
H05K 13/04Y10T29/53087Y10T29/4913Y10T29/53178H05K 13/0815Y10T29/53091
50
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Claims
Abstract
Embodiments of the present invention improve upon component level inspection performed by pick and place machines. Such improvements include using a position sensitive device that measures the position of the placement head relative to the workpiece as the placement head travels towards and away from the workpiece during a placement cycle. The output of this sensor is used to selectably trigger the acquisition of the images used to measure a placement characteristic of the component placement machine.
Claims
exact text as granted — not AI-modified1 . An image acquisition system for use in a pick and place machine, the system comprising:
an imaging device for acquiring an image of an intended placement location of a component on a workpiece; a position sensitive device disposed to provide an output indicative of a position of a placement head in the pick and place machine; and wherein image device acquisition timing is determined by the output of the position sensitive device.
2 . The system of claim 1 , wherein the position sensing device is a linear encoder.
3 . The system of claim 1 , wherein the position sensing device is a rotary encoder.
4 . The system of claim 3 , wherein the rotary encoder is a semi-circle shape.Join the waitlist — get patent alerts
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