Assignee
CYBEROPTICS CORP
US·73 granted patents·13 pending applications·1,994 citations·filing 1986–2024
Top patents by PatentIndex Score
86 records- 0197US4733969ALaser probe for determining distanceCYBEROPTICS CORP·Filed 1986·Granted Mar 29, 1988·275 cites·18 claims
- 0295US6549647B1Inspection system with vibration resistant video captureCYBEROPTICS CORP·Filed 2000·Granted Apr 15, 2003·82 cites·16 claims
- 0395US6538244B1Pick and place machine with improved vision system including a linescan sensorCYBEROPTICS CORP·Filed 2000·Granted Mar 25, 2003·78 cites·18 claims
- 0495US5278634AHigh precision component alignment sensor systemCYBEROPTICS CORP·Filed 1991·Granted Jan 11, 1994·122 cites·25 claims
- 0594US9816287B2Updating calibration of a three-dimensional measurement systemCYBEROPTICS CORP·Filed 2015·Granted Nov 14, 2017·8 cites·20 claims
- 0694US5005978AApparatus and method for the noncontact measurement of drill diameter, runout, and tip positionCYBEROPTICS CORP·Filed 1989·Granted Apr 9, 1991·57 cites·32 claims
- 0793US6590658B2Optical alignment systemCYBEROPTICS CORP·Filed 2001·Granted Jul 8, 2003·91 cites·45 claims
- 0893US6577405B2Phase profilometry system with telecentric projectorCYBEROPTICS CORP·Filed 2001·Granted Jun 10, 2003·70 cites·24 claims
- 0990US11604062B2Three-dimensional sensor with counterposed channelsCYBEROPTICS CORP·Filed 2020·Granted Mar 14, 2023·2 cites·15 claims
- 1090US7239399B2Pick and place machine with component placement inspectionCYBEROPTICS CORP·Filed 2002·Granted Jul 3, 2007·45 cites·11 claims
- 1189US7813559B2Image analysis for pick and place machines with in situ component placement inspectionCYBEROPTICS CORP·Filed 2005·Granted Oct 12, 2010·24 cites·20 claims
- 1289US7369334B2Optical device with alignment compensationCYBEROPTICS CORP·Filed 2005·Granted May 6, 2008·18 cites·8 claims
- 1388US10126252B2Enhanced illumination control for three-dimensional imagingCYBEROPTICS CORP·Filed 2014·Granted Nov 13, 2018·7 cites·6 claims
- 1488US6678062B2Automated system with improved height sensingCYBEROPTICS CORP·Filed 2001·Granted Jan 13, 2004·52 cites·32 claims
- 1587US5897611AHigh precision semiconductor component alignment systemsCYBEROPTICS CORP·Filed 1996·Granted Apr 27, 1999·72 cites·53 claims
- 1685US6762847B2Laser align sensor with sequencing light sourcesCYBEROPTICS CORP·Filed 2001·Granted Jul 13, 2004·43 cites·53 claims
- 1784US6750899B1Solder paste inspection systemCYBEROPTICS CORP·Filed 2000·Granted Jun 15, 2004·38 cites·20 claims
- 1884US6583884B2Tomographic reconstruction of electronic components from shadow image sensor dataCYBEROPTICS CORP·Filed 2002·Granted Jun 24, 2003·31 cites·23 claims
- 1984US4872747AUse of prisms to obtain anamorphic magnificationCYBEROPTICS CORP·Filed 1987·Granted Oct 10, 1989·54 cites·14 claims
- 2083US7746481B2Method for measuring center of rotation of a nozzle of a pick and place machine using a collimated laser beamCYBEROPTICS CORP·Filed 2008·Granted Jun 29, 2010·18 cites·12 claims
- 2183US6195165B1Enhanced sensorCYBEROPTICS CORP·Filed 1999·Granted Feb 27, 2001·73 cites·19 claims
- 2282US7545514B2Pick and place machine with improved component pick image processingCYBEROPTICS CORP·Filed 2006·Granted Jun 9, 2009·11 cites·31 claims
- 2382US7027639B2High speed optical image acquisition system with extended dynamic rangeCYBEROPTICS CORP·Filed 2002·Granted Apr 11, 2006·24 cites·25 claims
- 2481US6744499B2Calibration methods for placement machines incorporating on-head linescan sensingCYBEROPTICS CORP·Filed 2003·Granted Jun 1, 2004·23 cites·13 claims
- 2581US5309223ALaser-based semiconductor lead measurement systemCYBEROPTICS CORP·Filed 1991·Granted May 3, 1994·48 cites·49 claims
- 2681US5293048ALaser sensor for detecting the presence of an object in continuous motionCYBEROPTICS CORP·Filed 1992·Granted Mar 8, 1994·41 cites·36 claims
- 2780US11468590B2Wireless substrate-like teaching sensor for semiconductor processingCYBEROPTICS CORP·Filed 2019·Granted Oct 11, 2022·5 cites·36 claims
- 2880US10801945B2Inline particle sensorCYBEROPTICS CORP·Filed 2019·Granted Oct 13, 2020·2 cites·16 claims
- 2979US10346963B2Point cloud merging from multiple cameras and sources in three-dimensional profilometryCYBEROPTICS CORP·Filed 2015·Granted Jul 9, 2019·3 cites·26 claims
- 3079US4891772APoint and line range sensorsCYBEROPTICS CORP·Filed 1987·Granted Jan 2, 1990·45 cites·33 claims
- 3176US10883823B2Three-dimensional sensor with counterposed channelsCYBEROPTICS CORP·Filed 2019·Granted Jan 5, 2021·1 cites·20 claims
- 3276US6118538AMethod and apparatus for electronic component lead measurement using light based sensors on a component placement machineCYBEROPTICS CORP·Filed 1997·Granted Sep 12, 2000·40 cites·19 claims
- 3375US7559134B2Pick and place machine with improved component placement inspectionCYBEROPTICS CORP·Filed 2004·Granted Jul 14, 2009·19 cites·4 claims
- 3475US5519204AMethod and apparatus for exposure control in light-based measurement instrumentsCYBEROPTICS CORP·Filed 1994·Granted May 21, 1996·30 cites·12 claims
- 3574US6049384AMethod and apparatus for three dimensional imaging using multi-phased structured lightCYBEROPTICS CORP·Filed 1997·Granted Apr 11, 2000·38 cites·33 claims
- 3674US5331406AMulti-beam laser sensor for semiconductor lead measurementsCYBEROPTICS CORP·Filed 1992·Granted Jul 19, 1994·36 cites·50 claims
- 3772US7706595B2Pick and place machine with workpiece motion inspectionCYBEROPTICS CORP·Filed 2004·Granted Apr 27, 2010·19 cites·7 claims
- 3872US6608320B1Electronics assembly apparatus with height sensing sensorCYBEROPTICS CORP·Filed 1999·Granted Aug 19, 2003·35 cites·33 claims
- 3971US7555831B2Method of validating component feeder exchangesCYBEROPTICS CORP·Filed 2005·Granted Jul 7, 2009·3 cites·7 claims
- 4071US6538750B1Rotary sensor system with a single detectorCYBEROPTICS CORP·Filed 1999·Granted Mar 25, 2003·33 cites·118 claims
- 4170US6535291B1Calibration methods for placement machines incorporating on-head linescan sensingCYBEROPTICS CORP·Filed 2000·Granted Mar 18, 2003·13 cites·13 claims
- 4267US6288786B1Digital range sensor systemCYBEROPTICS CORP·Filed 2000·Granted Sep 11, 2001·19 cites·21 claims
- 4366USRE38025EHigh precision component alignment sensor systemCYBEROPTICS CORP·Filed 1995·Granted Mar 11, 2003·25 cites·54 claims
- 4466US6292261B1Rotary sensor system with at least two detectorsCYBEROPTICS CORP·Filed 1999·Granted Sep 18, 2001·27 cites·77 claims
- 4565US2025022732A1Wafer-like sensorCYBEROPTICS CORP·Filed 2024·Application pending·0 cites
- 4663US9743527B2Stencil programming and inspection using solder paste inspection systemCYBEROPTICS CORP·Filed 2014·Granted Aug 22, 2017·3 cites·12 claims
- 4763US7346420B2Component feeder exchange diagnostic toolCYBEROPTICS CORP·Filed 2007·Granted Mar 18, 2008·1 cites·7 claims
- 4863US7190393B2Camera with improved illuminatorCYBEROPTICS CORP·Filed 2004·Granted Mar 13, 2007·5 cites·18 claims
- 4962US6825486B1System for mapping wafers using predictive dynamic lightingCYBEROPTICS CORP·Filed 2002·Granted Nov 30, 2004·14 cites·16 claims
- 5062US6385335B1Apparatus and method for estimating background tilt and offsetCYBEROPTICS CORP·Filed 2000·Granted May 7, 2002·8 cites·16 claims
Showing the top 50 of 86 patent records by PatentIndex Score.
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