Gas discharge laser light source beam delivery unit
Abstract
A beam delivery unit and method of delivering a laser beam from a laser light source for excimer or molecular fluorine gas discharge laser systems in the DUV and smaller wavelengths is disclosed, which may comprise: a beam delivery enclosure defining an output laser light pulse beam delivery path from an output of a gas discharge laser to an input of a working apparatus employing the light contained in the output laser light pulse beam; a purge mechanism operatively connected to the beam delivery enclosure; an in-situ beam parameter monitor and adjustment mechanism within the enclosure, comprising a retractable beam redirecting optic; a beam analysis mechanism external to the enclosure; and, a retraction mechanism within the enclosure and operable from outside the enclosure and operative to move the retractable beam redirecting optic from a retracted position out of the beam path to an operative position in the beam path. The BDU may also include a beam attenuator unit contained within the enclosure adjustably mounted within the enclosure for positioning within the beam delivery path. The BDU may have at least two enclosure isolation mechanisms comprising a first enclosure isolation mechanism on a first side of the enclosure from the at least one optic module and a second enclosure isolation mechanism on a second side of the enclosure from the at least one optic module, each respective enclosure isolation mechanism comprising a flapper valve having a metal to metal seating mechanism and a locking pin assembly. A precision offset ratchet driver operative to manipulate actuator mechanisms in difficult to reach locations may be provided. An external kinematic alignment tool may be provided. A method of contamination control for a BDU is disclosed comprising selection of allowable materials and fabrication processes.
Claims
exact text as granted — not AI-modified1 . A method of contamination control for a beam delivery unit for a manufacturing process UV laser light source, comprising:
providing a beam delivery enclosure defining an output laser light pulse beam delivery path from an output of a gas discharge laser to an input of a working apparatus employing the light contained in the laser light output pulse beam; selecting metal materials for elements within the enclosure exclusively from a group consisting of: bare metals:
aluminum, copper, tin, inconel, nickle and alloys of brass, stainless steel and invar;
metals for fabrication:
for enclosures:
6061-T651 aluminum per ASME SB-209 or SB-11, with certification of conformance;
for other fabrication uses:
aluminum 6061-T651 aluminum per ASME SB-209 or SB-11, with certification of conformance, and stainless steel type UNS 302,
UNS 340 and UNS 316L; and
Other metals:
Titanium or Ti-6al-4V.
2 . A method of contamination control for a beam delivery unit for a manufacturing process UV laser light source, comprising:
providing a beam delivery enclosure defining an output laser light pulse beam delivery path from an output of a gas discharge laser to an input of a working apparatus employing the light contained in the laser light output pulse beam; selecting metal materials for elements within the enclosure exclusively that have finishing selected from a group consisting of: Surface finishes:
at least Ra 32 before plating for all purged surfaces whether or not exposed to UV light;
electro-less nickel plating; and
thin dense chrome plating.
3 . The method of claim 1 further comprising:
excluding from the enclosure any elements comprising any of the following materials except those included in the groups consisting of: glasses:
pyrex, fuesd silica, schott filter glasses, ULE and zerodur;
crystals:
calcium fluoride, magnesium fluoride, quartz and sapphire;
ceramics:
high density, non porous, alumina, lucalux, silcon nitride and lead zirconate titanate; and
VUV foil.
4 . The method of claim 2 further comprising:
excluding from the enclosure any elements comprising any of the following materials except those included in the groups consisting of: glasses:
pyrex, fuesd silica, schott filter glasses, ULE and zerodur;
crystals:
calcium fluoride, magnesium fluoride, quartz and sapphire;
ceramics:
high density, non porous, alumina, lucalux, silcon nitride and lead zirconate titanate; and
VUV foil.
5 . The method of claim 2 further comprising:
utilizing for uniting elements within the enclosure exclusively soldering or welding selected from the group consisting of, respectively: fillerless, fusion ob base metals only; and flux-less, tin and lead only.
6 . The method of claim 3 further comprising:
utilizing for uniting elements within the enclosure exclusively soldering or welding selected from the group consisting of, respectively: fillerless, fusion ob base metals only; and flux-less, tin and lead only.
7 . The method of claim 4 further comprising:
utilizing for uniting elements within the enclosure exclusively soldering or welding selected from the group consisting of, respectively: fillerless, fusion ob base metals only; and flux-less, tin and lead only.
8 . The method of claim 5 further comprising:
utilizing for uniting elements within the enclosure exclusively soldering or welding selected from the group consisting of, respectively: fillerless, fusion ob base metals only; and flux-less, tin and lead only.Join the waitlist — get patent alerts
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