US2006242967A1PendingUtilityA1
Termoelectric heating and cooling apparatus for semiconductor processing
Est. expiryApr 28, 2025(expired)· nominal 20-yr term from priority
H10P 72/0434H10N 10/17H10N 19/101
37
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Claims
Abstract
A thermoelectric wafer chuck is disclosed. The thermoelectric wafer chuck includes a wafer support surface for supporting a wafer; and a thermoelectric module provided in thermal contact with the wafer support surface for heating and/or cooling the wafer support surface and wafer.
Claims
exact text as granted — not AI-modified1 . A thermoelectric wafer chuck comprising:
a wafer support surface for supporting a wafer; and a thermoelectric module provided in thermal contact with said wafer support surface.
2 . The thermoelectric wafer chuck of claim 1 wherein said thermoelectric module comprises a single-layer thermoelectric module.
3 . The thermoelectric wafer chuck of claim 2 wherein said thermoelectric module defines a plurality of heating zones on said wafer support surface.
4 . The thermoelectric wafer chuck of claim 1 wherein said thermoelectric module comprises a stacked thermoelectric module.
5 . The thermoelectric wafer chuck of claim 4 wherein said thermoelectric module defines a plurality of heating zones on said wafer support surface.
6 . The thermoelectric wafer chuck of claim 1 further comprising a chuck base and wherein said wafer support surface is carried by said chuck base.
7 . The thermoelectric wafer chuck of claim 6 further comprising at least one fluid channel extending through said chuck base.
8 . The thermoelectric wafer chuck of claim 7 wherein said at least one fluid channel extends through said chuck base in a single-loop configuration.
9 . The thermoelectric wafer chuck of claim 7 wherein said at least one fluid channel extends through said chuck base in a multi-loop configuration.
10 . A thermoelectric wafer chuck comprising:
a chuck base; at least one coil-free fluid channel extending through said chuck base; and a wafer support surface carried by said chuck base.
11 . The thermoelectric wafer chuck of claim 10 wherein said at least one coil-free fluid channel extends through said chuck base in a single-loop configuration.
12 . The coil-free thermoelectric wafer chuck of claim 10 wherein said at least one coil-free fluid channel extends through said chuck base in a multi-loop configuration.
13 . The coil-free thermoelectric wafer chuck of claim 10 further comprising a thermoelectric module provided in said chuck base in thermal contact with said wafer support surface.
14 . The coil-free thermoelectric wafer chuck of claim 13 wherein said thermoelectric module comprises a single-layer thermoelectric module.
15 . The thermoelectric wafer chuck of claim 14 wherein said thermoelectric module defines a plurality of heating zones on said wafer support surface.
16 . The thermoelectric wafer chuck of claim 13 wherein said thermoelectric module comprises a stacked thermoelectric module.
17 . The thermoelectric wafer chuck of claim 16 wherein said thermoelectric module defines a plurality of heating zones on said wafer support surface.
18 . A thermoelectric wafer chuck comprising:
a chuck base;
a wafer support plate having a wafer support surface for supporting a wafer carried by said chuck base;
a chuck interior defined between said chuck base and said wafer support plate; and
a thermoelectric module provided in said chuck interior in thermal contact with said wafer support surface.
19 . The thermoelectric wafer chuck of claim 18 further comprising at least one fluid channel provided in said chuck base.
20 . The thermoelectric wafer chuck of claim 19 wherein said at least one coolant channel extends through said chuck base in a single-loop configuration.
21 . The thermoelectric wafer chuck of claim 19 wherein said at least one coolant channel extends through said chuck base in a multi-loop configuration.
22 . The thermoelectric wafer chuck of claim 18 wherein said thermoelectric module comprises a single-layer thermoelectric module.
23 . The thermoelectric wafer chuck of claim 22 wherein said thermoelectric module defines a plurality of heating zones on said wafer support surface.
24 . The thermoelectric wafer chuck of claim 18 wherein said thermoelectric module comprises a stacked thermoelectric module.
25 . The thermoelectric wafer chuck of claim 24 wherein said thermoelectric module defines a plurality of heating zones on said wafer support surface.Join the waitlist — get patent alerts
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