Container with magnifying identification lens

Abstract

A wafer pod or container fitted with at least one magnifying lens for magnifying the size of a lot number or other identifying indicia typically inscribed on a wafer inside the pod or container. The magnifying lens enables quick and accurate visual identification of the wafers by lot number or other identifying indicia as the wafers are transported in a semiconductor wafer fabrication facility.

What is claimed is:  
     
         1 . A container for containing an article and identifying indicia for the article, said container comprising: 
 a cover for containing the article; and    at least one magnifying lens provided in said cover for viewing the indicating indicia from outside said cover.    
     
     
         2 . The container of  claim 1  wherein said at least one magnifying lens comprises a plurality of magnifying lenses.  
     
     
         3 . The container of  claim 1  wherein said cover comprises a plurality of cover sides and a cover top provided on said plurality of cover sides and said at least one magnifying lens is provided in said cover top.  
     
     
         4 . The container of  claim 3  wherein said at least one magnifying lens comprises a plurality of magnifying lenses.  
     
     
         5 . The container of  claim 1  wherein said container comprises a SMIF pod and further comprising a pod door for removably engaging and closing said cover.  
     
     
         6 . The container of  claim 5  wherein said at least one magnifying lens comprises a plurality of magnifying lenses.  
     
     
         7 . The container of  claim 5  wherein said cover comprises a plurality of cover sides and a cover top provided on said plurality of cover sides and said at least one magnifying lens is provided in said cover top.  
     
     
         8 . The container of  claim 7  wherein said at least one magnifying lens comprises a plurality of magnifying lenses.  
     
     
         9 . A container for containing an article and identifying indicia for the article, said container comprising: 
 a cover for containing the article;    a cover base provided on said cover;    a cover door for removably engaging said cover base; and    at least one magnifying lens provided in said cover for viewing the indicating indicia from outside said cover.    
     
     
         10 . The container of  claim 9  wherein said at least one magnifying lens comprises a plurality of magnifying lenses.  
     
     
         11 . The container of  claim 9  wherein said cover comprises a plurality of cover sides and a cover top provided on said plurality of cover sides and said at least one magnifying lens is provided in said cover top.  
     
     
         12 . The container of  claim 9  wherein said at least one magnifying lens has a power of from about 2× to about 50×.  
     
     
         13 . A method of enhancing speed and accuracy of identifying semiconductor wafers located inside a container from outside the container, said method comprising the steps of: 
 providing identifying indicia for said semiconductor wafers inside said container;    providing at least one magnifying lens on said container; and    magnifying said identifying indicia by visually observing said identifying indicia through said at least one magnifying lens.    
     
     
         14 . The method of  claim 13  wherein said providing identifying indicia for said semiconductor wafers inside said container comprises the step of providing said identifying indicia on at least one of said semiconductor wafers.  
     
     
         15 . The method of  claim 13  wherein said container comprises a cover having a plurality of cover sides and a cover top provided on said plurality of cover sides and wherein said providing at least one magnifying lens on said container comprises the step of providing at least one magnifying lens on said cover top.  
     
     
         16 . The method of  claim 15  wherein said providing identifying indicia for said semiconductor wafers inside said container comprises the step of providing said identifying indicia on at least one of said semiconductor wafers.  
     
     
         17 . The method of  claim 15  wherein said providing at least one magnifying lens on said container comprises the step of providing at least one magnifying lens on at least one of said plurality of cover sides, respectively.  
     
     
         18 . The method of  claim 13  further comprising the steps of providing a wafer cassette in said container and providing said semiconductor wafers on said wafer cassette, and wherein said providing identifying indicia for said semiconductor wafers inside said container comprises the step of providing said identifying indicia on said wafer cassette.  
     
     
         19 . The method of  claim 18  wherein said container comprises a cover having a plurality of cover sides and a cover top provided on said plurality of cover sides and wherein said providing at least one magnifying lens on said container comprises the step of providing at least one magnifying lens on said cover top.  
     
     
         20 . The method of  claim 19  wherein said providing at least one magnifying lens on said container further comprises the step of providing at least one magnifying lens on at least one of said plurality of cover sides, respectively.