Inventor · disambiguated record
Tatsuya Osada
Also filed as: OSADA TATSUYA
2 granted patents·1 pending application·1 citations·filing 2016–2022
31Inventor score
Files withSUMCO CORP3
Top patents by PatentIndex Score
3 records- 0163US10338005B2Apparatus for inspecting back surface of epitaxial wafer and method of inspecting back surface of epitaxial wafer using the sameSUMCO CORP·Filed 2016·Granted Jul 2, 2019·1 cites·9 claims
- 0239US2024257336A1Wafer visual inspection apparatus and wafer visual inspection methodSUMCO CORP·Filed 2022·Application pending·0 cites
- 0334US10161883B2Wafer inspection method and wafer inspection apparatusSUMCO CORP·Filed 2016·Granted Dec 25, 2018·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →