Inventor · disambiguated record
Russell S. Bjork
Also filed as: BJORK RUSSELL S
8 granted patents·1 pending application·95 citations·filing 2000–2006
88Inventor score
Top patents by PatentIndex Score
9 records- 0191US6476629B1In-tray burn-in board for testing integrated circuit devices in situ on processing traysMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 5, 2002·42 cites·5 claims
- 0282US7095242B2In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing traysMICRON TECHNOLOGY INC·Filed 2005·Granted Aug 22, 2006·8 cites·10 claims
- 0381US6474475B1Apparatus for handling stacked integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2000·Granted Nov 5, 2002·23 cites·10 claims
- 0475US7365558B2In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing traysMICRON TECHNOLOGY INC·Filed 2006·Granted Apr 29, 2008·5 cites·13 claims
- 0568US7458466B2Stack processing tray for integrated circuit devicesMICRON TECHNOLOGY INC·Filed 2005·Granted Dec 2, 2008·2 cites·12 claims
- 0666US6815967B2In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing traysMICRON TECHNOLOGY INC·Filed 2002·Granted Nov 9, 2004·8 cites·5 claims
- 0761US6927596B2In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing traysMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 9, 2005·6 cites·13 claims
- 0846US7104748B2Methods for use with tray-based integrated circuit device handling systemsMICRON TECHNOLOGY INC·Filed 2002·Granted Sep 12, 2006·1 cites·19 claims
- 0942US2006208755A1In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing traysBJORK RUSSELL S·Filed 2006·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Russell S. Bjork files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →