Inventor · disambiguated record
Prashanth Kumar
Also filed as: KUMAR PRASHANTH · KUMAR PRASHANTH JAY
11 granted patents·7 pending applications·44 citations·filing 2014–2025
86Inventor score
Top patents by PatentIndex Score
18 records- 0195US12283503B2Substrate measurement subsystemAPPLIED MATERIALS INC·Filed 2021·Granted Apr 22, 2025·3 cites·20 claims
- 0294US10262910B2Method of feature exaction from time-series of spectra to control endpoint of processLAM RES CORP·Filed 2016·Granted Apr 16, 2019·12 cites·16 claims
- 0387US12061458B2Systems and methods for adaptive troubleshooting of semiconductor manufacturing equipmentAPPLIED MATERIALS INC·Filed 2021·Granted Aug 13, 2024·2 cites·20 claims
- 0484US9183337B1Circuit design with predefined configuration of parameterized coresXILINX INC·Filed 2014·Granted Nov 10, 2015·14 cites·20 claims
- 0583USD977504SPortion of a display panel with a graphical user interfaceAPPLIED MATERIALS INC·Filed 2020·Granted Feb 7, 2023·10 cites·1 claims
- 0676US12429846B2Systems and methods for adaptive troubleshooting of semiconductor manufacturing equipmentAPPLIED MATERIALS INC·Filed 2024·Granted Sep 30, 2025·0 cites·20 claims
- 0772US12191176B2Integrated substrate measurement system to improve manufacturing process performanceAPPLIED MATERIALS INC·Filed 2023·Granted Jan 7, 2025·0 cites·16 claims
- 0872US10067642B1Dynamic discovery and presentation of core parametersXILINX INC·Filed 2015·Granted Sep 4, 2018·2 cites·16 claims
- 0970US2025218829A1Substrate measurement subsystemAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1064US10686665B2Discovery and configuration of an open networking adapter in a fabric networkAVAYA INC·Filed 2017·Granted Jun 16, 2020·1 cites·20 claims
- 1163US11688616B2Integrated substrate measurement system to improve manufacturing process performanceAPPLIED MATERIALS INC·Filed 2021·Granted Jun 27, 2023·0 cites·10 claims
- 1259US2023062206A1Determining substrate profile properties using machine learningAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 1358US10847430B2Method of feature exaction from time-series of spectra to control endpoint of processLAM RES CORP·Filed 2019·Granted Nov 24, 2020·0 cites·15 claims
- 1454US2024190453A1Vehicular communication and alert systemMAGNA ELECTRONICS INC·Filed 2023·Application pending·0 cites
- 1553US2022026817A1Determining substrate profile properties using machine learningAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
- 1650US2024124023A1Vehicular communication system for automatic communication with emergency vehicles and hospitalsMAGNA ELECTRONICS INC·Filed 2023·Application pending·0 cites
- 1749US2022066411A1Detecting and correcting substrate process drift using machine learningAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
- 1832US2017047202A1Magnetized edge ring for extreme edge controlLAM RES CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →