Inventor · disambiguated record
Eugene T. Bullock
Also filed as: BULLOCK EUGENE T · BULLOCK EUGENE THOMAS
5 granted patents·103 citations·filing 2004–2019
80Inventor score
Top patents by PatentIndex Score
5 records- 0194US7902849B2Apparatus and method for test structure inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Mar 8, 2011·80 cites·10 claims
- 0288US11022565B2Process monitoringAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jun 1, 2021·4 cites·13 claims
- 0382US7994476B2Apparatus and method for enhancing voltage contrast of a waferAPPLIED MATERIALS ISRAEL LTD·Filed 2007·Granted Aug 9, 2011·9 cites·15 claims
- 0456US7528614B2Apparatus and method for voltage contrast analysis of a wafer using a tilted pre-charging beamAPPLIED MATERIALS INC·Filed 2004·Granted May 5, 2009·7 cites·21 claims
- 0549US7183546B2System and method for voltage contrast analysis of a waferAPPLIED MATERIALS ISRAEL LTD·Filed 2004·Granted Feb 27, 2007·3 cites·29 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →