Inventor · disambiguated record
Benjamin John Cook
Also filed as: COOK BENJAMIN · COOK BENJAMIN JOHN
18 granted patents·5 pending applications·189 citations·filing 2011–2025
93Inventor score
Technology areasH01J
Files withICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH11ICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH6APPLIED MATERIALS INC2APPLIED MATERIALS ISRAEL LTD1FROSIEN JüRGEN1
Top patents by PatentIndex Score
23 records- 0198US9035249B1Multi-beam system for high throughput EBIINTEGRATED CIRCUIT TESTING·Filed 2014·Granted May 19, 2015·83 cites·20 claims
- 0297US10483080B1Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2018·Granted Nov 19, 2019·22 cites·21 claims
- 0395US9666406B1Charged particle beam device, system for a charged particle beam device, and method for operating a charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2016·Granted May 30, 2017·19 cites·15 claims
- 0495US9620329B1Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of manufacturing an electrostatic multipole deviceICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2015·Granted Apr 11, 2017·14 cites·20 claims
- 0594US9666405B1System for imaging a signal charged particle beam, method for imaging a signal charged particle beam, and charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2016·Granted May 30, 2017·13 cites·16 claims
- 0693US9620328B1Electrostatic multipole device, electrostatic multipole arrangement, charged particle beam device, and method of operating an electrostatic multipole deviceICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2015·Granted Apr 11, 2017·13 cites·19 claims
- 0790US11495433B1Charged particle beam apparatus, multi-beamlet assembly, and method of inspecting a specimenICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Nov 8, 2022·3 cites·18 claims
- 0885US2025308835A1Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 0985US2025308836A1Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1082US9754759B2Electrostatic multipole device, electrostatic multipole arrangement, and method of manufacturing an electrostatic multipole deviceICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2015·Granted Sep 5, 2017·3 cites·19 claims
- 1181US9305740B2Charged particle beam system and method of operating thereofFROSIEN JüRGEN·Filed 2013·Granted Apr 5, 2016·5 cites·16 claims
- 1281US8569712B2Beam blanker for interrupting a beam of charged particlesKNIPPELS GUIDO MARTINUS HENRICUS·Filed 2011·Granted Oct 29, 2013·10 cites·23 claims
- 1380US10923313B1Charged particle beam device and method of operating a charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2019·Granted Feb 16, 2021·2 cites·22 claims
- 1476US10784070B2Charged particle beam device, field curvature corrector, and methods of operating a charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2018·Granted Sep 22, 2020·2 cites·16 claims
- 1566US12362131B2Method for inspecting a specimen and charged particle beam deviceAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 15, 2025·0 cites·26 claims
- 1659US11705301B2Charged particle beam manipulation device and method for manipulating charged particle beamletsICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Jul 18, 2023·0 cites·15 claims
- 1757US2024212968A1Lens for a charged particle beam apparatus, charged particle beam apparatus, and method of focusing a charged particle beamICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2022·Application pending·0 cites
- 1854US10593509B2Charged particle beam device, multi-beam blanker for a charged particle beam device, and method for operating a charged particle beam deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2018·Granted Mar 17, 2020·0 cites·22 claims
- 1954US2024087837A1Magnetic multipole device, charged particle beam apparatus, and method of influencing a charged particle beam propagating along an optical axisICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2022·Application pending·0 cites
- 2050US11501946B2Method of influencing a charged particle beam, multipole device, and charged particle beam apparatusICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2021·Granted Nov 15, 2022·0 cites·21 claims
- 2148US10748743B1Device and method for operating a charged particle device with multiple beamletsICT INTEGRATED CIRCUIT TESTING GES FÜR HALBLEITERPRÜFTECHNIK MBH·Filed 2019·Granted Aug 18, 2020·0 cites·21 claims
- 2244US2020303156A1Beam splitter for a charged particle deviceICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2019·Application pending·0 cites
- 2336US11120965B2Beam blanking device for a multi-beamlet charged particle beam apparatusICT INTEGRATED CIRCUIT TESTING GES FUER HALBLEITERPRUEFTECHNIK MBH·Filed 2019·Granted Sep 14, 2021·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →