Inventor · disambiguated record
Michael T. Fragano
Also filed as: FRAGANO MICHAEL T · FRAGANO MICHAEL THOMAS
18 granted patents·1 pending application·164 citations·filing 2000–2016
94Inventor score
Technology areasG11C
Top patents by PatentIndex Score
19 records- 0194US7986571B2Low power, single-ended sensing in a multi-port SRAM using pre-discharged bit linesIBM·Filed 2010·Granted Jul 26, 2011·19 cites·10 claims
- 0293US7830727B2Apparatus and method for low power, single-ended sensing in a multi-port SRAM using pre-discharged bit linesIBM·Filed 2008·Granted Nov 9, 2010·29 cites·10 claims
- 0391US8233302B2Content addressable memory with concurrent read and search/compare operations at the same memory cellARSOVSKI IGOR·Filed 2011·Granted Jul 31, 2012·14 cites·9 claims
- 0491US7924588B2Content addressable memory with concurrent two-dimensional search capability in both row and column directionsIBM·Filed 2007·Granted Apr 12, 2011·23 cites·21 claims
- 0585US7940581B2Method for low power sensing in a multi-port SRAM using pre-discharged bit linesIBM·Filed 2010·Granted May 10, 2011·8 cites·10 claims
- 0676US6944075B1Variable column redundancy region boundaries in SRAMIBM·Filed 2005·Granted Sep 13, 2005·10 cites·20 claims
- 0775US9916896B1Ternary content addressable memory (TCAM) for multi bit miss detect circuitGLOBALFOUNDRIES INC·Filed 2016·Granted Mar 13, 2018·4 cites·20 claims
- 0873US9583192B1Matchline precharge architecture for self-reference matchline sensingGLOBALFOUNDRIES INC·Filed 2016·Granted Feb 28, 2017·3 cites·20 claims
- 0969US6961276B2Random access memory having an adaptable latencyIBM·Filed 2003·Granted Nov 1, 2005·18 cites·22 claims
- 1066US9601200B2TCAM structures with reduced power supply noiseIBM·Filed 2015·Granted Mar 21, 2017·2 cites·20 claims
- 1166US8929116B2Two phase search content addressable memory with power-gated main-searchIBM·Filed 2013·Granted Jan 6, 2015·3 cites·21 claims
- 1265US9704575B1Content-addressable memory having multiple reference matchlines to reduce latencyGLOBALFOUNDRIES INC·Filed 2016·Granted Jul 11, 2017·2 cites·16 claims
- 1365US6442085B1Self-Test pattern to detect stuck open faultsIBM·Filed 2000·Granted Aug 27, 2002·15 cites·15 claims
- 1464US7859921B2Apparatus and method for low power sensing in a multi-port SRAM using pre-discharged bit linesIBM·Filed 2008·Granted Dec 28, 2010·4 cites·10 claims
- 1564US7609569B2System and method for implementing row redundancy with reduced access time and reduced device areaIBM·Filed 2007·Granted Oct 27, 2009·5 cites·16 claims
- 1653US8917566B2Bypass structure for a memory device and method to reduce unknown test valuesCUMMINGS AARON J·Filed 2012·Granted Dec 23, 2014·2 cites·20 claims
- 1740US9859006B1Algorithmic N search/M write ternary content addressable memory (TCAM)GLOBALFOUNDRIES INC·Filed 2016·Granted Jan 2, 2018·0 cites·20 claims
- 1839US7210085B2Method and apparatus for test and repair of marginally functional SRAM cellsIBM·Filed 2003·Granted Apr 24, 2007·3 cites·22 claims
- 1937US2009141530A1Structure for implementing enhanced content addressable memory performance capabilityIBM·Filed 2008·Application pending·0 cites
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