Inventor · disambiguated record
Karel Van Gils
Also filed as: VAN GILS KAREL
7 granted patents·57 citations·filing 2000–2020
83Inventor score
Top patents by PatentIndex Score
7 records- 0194US10634487B2Method and system for optical three dimensional topography measurementKLA TENCOR CORP·Filed 2016·Granted Apr 28, 2020·11 cites·10 claims
- 0279US6778282B1Measuring positions of coplanarity of contract elements of an electronic component with a flat illumination and two camerasICOS VISION SYSTEMS NV·Filed 2000·Granted Aug 17, 2004·29 cites·8 claims
- 0374US9886764B2Image acquisition system, image acquisition method, and inspection systemKLA TENCOR CORP·Filed 2015·Granted Feb 6, 2018·2 cites·35 claims
- 0464US11287248B2Method and system for optical three dimensional topography measurementKLA TENCOR CORP·Filed 2020·Granted Mar 29, 2022·0 cites·9 claims
- 0562US9140546B2Apparatus and method for three dimensional inspection of wafer saw marksMAISON BENOIT·Filed 2011·Granted Sep 22, 2015·2 cites·28 claims
- 0661US9776334B2Apparatus and method for automatic pitch conversion of pick and place heads, pick and place head and pick and place deviceKLA TENCOR CORP·Filed 2014·Granted Oct 3, 2017·4 cites·12 claims
- 0752US7423743B2Method and an apparatus for measuring positions of contact elements of an electronic componentICOS VISION SYSTEMS NV·Filed 2002·Granted Sep 9, 2008·9 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →