Inventor · disambiguated record
Yunsheng Song
Also filed as: SONG YUNSHENG
30 granted patents·4 pending applications·183 citations·filing 2006–2023
96Inventor score
Top patents by PatentIndex Score
34 records- 0196US9519210B2Voltage contrast characterization structures and methods for within chip process variation characterizationIBM·Filed 2014·Granted Dec 13, 2016·57 cites·25 claims
- 0295US8237278B2Configurable interposerGLUSCHENKOV OLEG·Filed 2009·Granted Aug 7, 2012·29 cites·11 claims
- 0385US8095230B2Method for optimizing the routing of wafers/lots based on yieldOUYANG XU·Filed 2008·Granted Jan 10, 2012·10 cites·23 claims
- 0483US9524930B2Configurable interposerIBM·Filed 2014·Granted Dec 20, 2016·4 cites·11 claims
- 0583US8803328B1Random coded integrated circuit structures and methods of making random coded integrated circuit structuresIBM·Filed 2013·Granted Aug 12, 2014·6 cites·20 claims
- 0683US7856332B2Real time system for monitoring the commonality, sensitivity, and repeatability of test probesIBM·Filed 2007·Granted Dec 21, 2010·13 cites·22 claims
- 0780US9559051B1Method for manufacturing in a semiconductor device a low resistance via without a bottom linerGLOBALFOUNDRIES INC·Filed 2015·Granted Jan 31, 2017·3 cites·20 claims
- 0880US9029234B2Physical design symmetry and integrated circuits enabling three dimentional (3D) yield optimization for wafer to wafer stackingSAFRAN JOHN MATTHEW·Filed 2012·Granted May 12, 2015·8 cites·26 claims
- 0979US10109046B2Methods of detecting faults in real-time for semiconductor wafersGLOBALFOUNDRIES INC·Filed 2016·Granted Oct 23, 2018·3 cites·20 claims
- 1078US8294485B2Detecting asymmetrical transistor leakage defectsOUYANG XU·Filed 2010·Granted Oct 23, 2012·4 cites·5 claims
- 1176US8159247B2Yield enhancement for stacked chips through rotationally-connecting-interposerGLUSCHENKOV OLEG·Filed 2009·Granted Apr 17, 2012·4 cites·15 claims
- 1275US7962234B2Multidimensional process window optimization in semiconductor manufacturingIBM·Filed 2008·Granted Jun 14, 2011·5 cites·11 claims
- 1374US8005560B2Method of optimizing queue times in a production cycleIBM·Filed 2007·Granted Aug 23, 2011·5 cites·19 claims
- 1473US8369976B2Method for compensating for tool processing variation in the routing of wafers/lotsIBM·Filed 2008·Granted Feb 5, 2013·4 cites·16 claims
- 1566US7682842B2Method of adaptively selecting chips for reducing in-line testing in a semiconductor manufacturing lineIBM·Filed 2008·Granted Mar 23, 2010·5 cites·13 claims
- 1666US7337033B1Data mining to detect performance quality of tools used repetitively in manufacturingIBM·Filed 2006·Granted Feb 26, 2008·5 cites·19 claims
- 1764USD1055988SLawn mowerLinyi jinli machinery co ltd·Filed 2023·Granted Dec 31, 2024·3 cites·1 claims
- 1862US8108803B2Geometry based electrical hotspot detection in integrated circuit layoutsHENG FOOK-LUEN·Filed 2009·Granted Jan 31, 2012·2 cites·10 claims
- 1961US8489225B2Wafer alignment system with optical coherence tomographyXIN YONGCHUN·Filed 2011·Granted Jul 16, 2013·2 cites·20 claims
- 2060US7908023B2Method of establishing a lot grade system for product lots in a semiconductor manufacturing processIBM·Filed 2008·Granted Mar 15, 2011·2 cites·19 claims
- 2158USD1055987SLawn mowerLinyi jinli machinery co ltd·Filed 2023·Granted Dec 31, 2024·2 cites·1 claims
- 2257US8340800B2Monitoring a process sector in a production facilityCOTE WILLIAM·Filed 2008·Granted Dec 25, 2012·4 cites·19 claims
- 2357US8015040B2Methods, systems, and computer program products for product randomization and analysis in a manufacturing environmentIBM·Filed 2007·Granted Sep 6, 2011·1 cites·20 claims
- 2457US7953680B2Computer program product for excluding variations attributable to equipment used in semiconductor wafer manufacturing from split analysis proceduresIBM·Filed 2007·Granted May 31, 2011·0 cites·9 claims
- 2555US8234001B2Tool commonality and stratification analysis to enhance a production processRICE JAMES·Filed 2009·Granted Jul 31, 2012·2 cites·20 claims
- 2654US8759152B2Configurable interposerGLUSCHENKOV OLEG·Filed 2012·Granted Jun 24, 2014·0 cites·10 claims
- 2751US9151781B2Yield enhancement for stacked chips through rotationally-connecting-interposerGLUSCHENKOV OLEG·Filed 2012·Granted Oct 6, 2015·0 cites·20 claims
- 2847US2009119357A1Advanced correlation and process window evaluation applicationIBM·Filed 2007·Application pending·0 cites
- 2947US2010204940A1Method and system of commonality analysis for lots with scrapped waferIBM·Filed 2009·Application pending·0 cites
- 3045US9337334B2Semiconductor memory device employing a ferromagnetic gateGLOBALFOUNDRIES INC·Filed 2014·Granted May 10, 2016·0 cites·19 claims
- 3143US9780007B2LCR test circuit structure for detecting metal gate defect conditionsOUYANG XU·Filed 2012·Granted Oct 3, 2017·0 cites·15 claims
- 3241US2009125829A1Automated yield split lot (ewr) and process change notification (pcn) analysis systemIBM·Filed 2007·Application pending·0 cites
- 3340US8429193B2Security control of analysis resultsSONG YUNSHENG·Filed 2009·Granted Apr 23, 2013·0 cites·20 claims
- 3439US2013016895A1Method and system for defect-bitmap-fail patterns matching analysis including peripheral defectsIBM·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →